NeXus NXDL vocabulary

Anchors for all NeXus fields, groups, attributes, and links

NXDL Vocabulary

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@auxiliary_signals
/NXdata@auxiliary_signals-attribute
@axes
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@axes-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA@axes-attribute
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient@axes-attribute
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude@axes-attribute
/NXcxi_ptycho/DATA@axes-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@axes-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1@axes-attribute
/NXdata/DATA@axes-attribute
/NXdata@axes-attribute
/NXdetector/efficiency@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary@axes-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model@axes-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map@axes-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi@axes-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model@axes-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map@axes-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi@axes-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack@axes-attribute
/NXguide/reflectivity@axes-attribute
/NXopt/ENTRY/data_collection/DATA@axes-attribute
/NXopt/ENTRY/plot@axes-attribute
/NXtransmission/ENTRY/data@axes-attribute
@axis
/NXdata/AXISNAME@axis-attribute
/NXdetector/time_of_flight@axis-attribute
/NXdetector/x_pixel_offset@axis-attribute
/NXdetector/y_pixel_offset@axis-attribute
/NXdetector/z_pixel_offset@axis-attribute
@axisname_indices
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@AXISNAME_indices-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA@AXISNAME_indices-attribute
/NXdata@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack@AXISNAME_indices-attribute
@baseline_reference
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@baseline_reference-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute
/NXxpcs/entry/twotime/two_time_corr_func@baseline_reference-attribute
@cansas_class
/NXcanSAS/ENTRY/COLLECTION@canSAS_class-attribute
/NXcanSAS/ENTRY/DATA@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT@canSAS_class-attribute
/NXcanSAS/ENTRY/PROCESS/COLLECTION@canSAS_class-attribute
/NXcanSAS/ENTRY/PROCESS@canSAS_class-attribute
/NXcanSAS/ENTRY/SAMPLE@canSAS_class-attribute
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@canSAS_class-attribute
/NXcanSAS/ENTRY@canSAS_class-attribute
@check_sum
/NXdetector/data@check_sum-attribute
@comment
/NXentry/revision@comment-attribute
/NXsubentry/revision@comment-attribute
@configuration
/NXentry/program_name@configuration-attribute
/NXsubentry/program_name@configuration-attribute
@creator
/NXroot@creator-attribute
@creator_version
/NXroot@creator_version-attribute
@default
/NXaperture@default-attribute
/NXattenuator@default-attribute
/NXbeam@default-attribute
/NXbeam_stop@default-attribute
/NXbending_magnet@default-attribute
/NXcanSAS/ENTRY@default-attribute
/NXcapillary@default-attribute
/NXcite@default-attribute
/NXcollimator@default-attribute
/NXcrystal@default-attribute
/NXcylindrical_geometry@default-attribute
/NXdetector@default-attribute
/NXdetector_group@default-attribute
/NXdetector_module@default-attribute
/NXdisk_chopper@default-attribute
/NXentry@default-attribute
/NXevent_data@default-attribute
/NXfermi_chopper@default-attribute
/NXfilter@default-attribute
/NXflipper@default-attribute
/NXfresnel_zone_plate@default-attribute
/NXgeometry@default-attribute
/NXgrating@default-attribute
/NXguide@default-attribute
/NXinsertion_device@default-attribute
/NXinstrument@default-attribute
/NXlog@default-attribute
/NXmirror@default-attribute
/NXmoderator@default-attribute
/NXmonitor@default-attribute
/NXmonochromator@default-attribute
/NXnote@default-attribute
/NXoff_geometry@default-attribute
/NXorientation@default-attribute
/NXparameters@default-attribute
/NXpinhole@default-attribute
/NXpolarizer@default-attribute
/NXpositioner@default-attribute
/NXprocess@default-attribute
/NXreflections@default-attribute
/NXroot@default-attribute
/NXsample@default-attribute
/NXsample_component@default-attribute
/NXsensor@default-attribute
/NXshape@default-attribute
/NXslit@default-attribute
/NXsource@default-attribute
/NXsubentry@default-attribute
/NXtransformations@default-attribute
/NXtranslation@default-attribute
/NXuser@default-attribute
/NXvelocity_selector@default-attribute
/NXxraylens@default-attribute
@default_slice
/NXdata@default_slice-attribute
@depends_on
/NXbeam/TRANSFORMATIONS/DIRECTION@depends_on-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@depends_on-attribute
/NXbeam_path/TRANSFORMATIONS/AXISNAME@depends_on-attribute
/NXdetector_module/fast_pixel_direction@depends_on-attribute
/NXdetector_module/module_offset@depends_on-attribute
/NXdetector_module/slow_pixel_direction@depends_on-attribute
/NXms_feature_set@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@depends_on-attribute
/NXtransformations/AXISNAME@depends_on-attribute
@description
/NXelectrostatic_kicker/timing@description-attribute
/NXmagnetic_kicker/timing@description-attribute
/NXreflections/background_mean@description-attribute
/NXreflections/bounding_box@description-attribute
/NXreflections/d@description-attribute
/NXreflections/det_module@description-attribute
/NXreflections/entering@description-attribute
/NXreflections/flags@description-attribute
/NXreflections/h@description-attribute
/NXreflections/id@description-attribute
/NXreflections/int_prf@description-attribute
/NXreflections/int_prf_errors@description-attribute
/NXreflections/int_prf_var@description-attribute
/NXreflections/int_sum@description-attribute
/NXreflections/int_sum_errors@description-attribute
/NXreflections/int_sum_var@description-attribute
/NXreflections/k@description-attribute
/NXreflections/l@description-attribute
/NXreflections/lp@description-attribute
/NXreflections/observed_frame@description-attribute
/NXreflections/observed_frame_errors@description-attribute
/NXreflections/observed_frame_var@description-attribute
/NXreflections/observed_phi@description-attribute
/NXreflections/observed_phi_errors@description-attribute
/NXreflections/observed_phi_var@description-attribute
/NXreflections/observed_px_x@description-attribute
/NXreflections/observed_px_x_errors@description-attribute
/NXreflections/observed_px_x_var@description-attribute
/NXreflections/observed_px_y@description-attribute
/NXreflections/observed_px_y_errors@description-attribute
/NXreflections/observed_px_y_var@description-attribute
/NXreflections/observed_x@description-attribute
/NXreflections/observed_x_errors@description-attribute
/NXreflections/observed_x_var@description-attribute
/NXreflections/observed_y@description-attribute
/NXreflections/observed_y_errors@description-attribute
/NXreflections/observed_y_var@description-attribute
/NXreflections/overlaps@description-attribute
/NXreflections/partiality@description-attribute
/NXreflections/polar_angle@description-attribute
/NXreflections/predicted_frame@description-attribute
/NXreflections/predicted_phi@description-attribute
/NXreflections/predicted_px_x@description-attribute
/NXreflections/predicted_px_y@description-attribute
/NXreflections/predicted_x@description-attribute
/NXreflections/predicted_y@description-attribute
/NXreflections/prf_cc@description-attribute
/NXreflections/reflection_id@description-attribute
/NXreflections@description-attribute
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control@description-attribute
@direction
/NXsample/electric_field@direction-attribute
/NXsample/magnetic_field@direction-attribute
/NXsample/stress_field@direction-attribute
@distribution
/NXdata/AXISNAME@distribution-attribute
@entry
/NXarpes/ENTRY@entry-attribute
/NXiqproc/ENTRY@entry-attribute
/NXsastof/ENTRY@entry-attribute
/NXsqom/ENTRY@entry-attribute
/NXxas/ENTRY@entry-attribute
/NXxasproc/ENTRY@entry-attribute
@equipment_component
/NXtransformations/AXISNAME@equipment_component-attribute
@file_name
/NXroot@file_name-attribute
@file_time
/NXroot@file_time-attribute
@file_update_time
/NXroot@file_update_time-attribute
@first_good
/NXdata/AXISNAME@first_good-attribute
@first_point_for_fit
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
@flux
/NXmx/ENTRY/INSTRUMENT/BEAM@flux-attribute
@frequency
/NXdetector/raw_time_of_flight@frequency-attribute
@h5py_version
/NXroot@h5py_version-attribute
@hdf5_version
/NXroot@HDF5_Version-attribute
@hdf_version
/NXroot@HDF_version-attribute
@i_axes
/NXcanSAS/ENTRY/DATA@I_axes-attribute
@idf_version
/NXentry@IDF_Version-attribute
/NXsubentry@IDF_Version-attribute
@index
/NXarchive/entry@index-attribute
@interpretation
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@interpretation-attribute
@last_good
/NXdata/AXISNAME@last_good-attribute
@local_name
/NXdetector/crate@local_name-attribute
/NXdetector/input@local_name-attribute
/NXdetector/slot@local_name-attribute
@long_name
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge@long_name-attribute
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/data_counts@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_x@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_y@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_z@long_name-attribute
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient@long_name-attribute
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude@long_name-attribute
/NXdata/AXISNAME@long_name-attribute
/NXdata/DATA@long_name-attribute
/NXdetector/data@long_name-attribute
/NXdetector/time_of_flight@long_name-attribute
/NXdetector/x_pixel_offset@long_name-attribute
/NXdetector/y_pixel_offset@long_name-attribute
/NXdetector/z_pixel_offset@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_image_identifier@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_energy@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/summary/axis_energy@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/summary/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_image_identifier@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_energy_loss@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary/axis_energy_loss@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/pattern_identifier@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_photon_energy@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary/axis_photon_energy@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary/data_counts@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/data@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_z@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/data@long_name-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_z@long_name-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/data@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/data@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/data@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/data@long_name-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/data_counts@long_name-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/pattern_identifier@long_name-attribute
/NXimage_set/stack/axis_image_identifier@long_name-attribute
/NXimage_set/stack/axis_x@long_name-attribute
/NXimage_set/stack/axis_y@long_name-attribute
/NXimage_set_em_adf/stack/axis_image_identifier@long_name-attribute
/NXimage_set_em_adf/stack/axis_x@long_name-attribute
/NXimage_set_em_adf/stack/axis_y@long_name-attribute
/NXimage_set_em_kikuchi/stack/axis_x@long_name-attribute
/NXimage_set_em_kikuchi/stack/axis_y@long_name-attribute
/NXimage_set_em_kikuchi/stack/data_counts@long_name-attribute
/NXimage_set_em_kikuchi/stack/pattern_identifier@long_name-attribute
/NXspectrum_set/stack/axis_energy@long_name-attribute
/NXspectrum_set/stack/axis_x@long_name-attribute
/NXspectrum_set/stack/axis_y@long_name-attribute
/NXspectrum_set/stack/data_counts@long_name-attribute
/NXspectrum_set/summary/axis_energy@long_name-attribute
/NXspectrum_set/summary/data_counts@long_name-attribute
/NXspectrum_set_em_eels/stack/axis_energy_loss@long_name-attribute
/NXspectrum_set_em_eels/stack/axis_x@long_name-attribute
/NXspectrum_set_em_eels/stack/axis_y@long_name-attribute
/NXspectrum_set_em_eels/stack/data_counts@long_name-attribute
/NXspectrum_set_em_eels/summary/axis_energy_loss@long_name-attribute
/NXspectrum_set_em_eels/summary/data_counts@long_name-attribute
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/axis_x@long_name-attribute
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/axis_y@long_name-attribute
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/data_counts@long_name-attribute
/NXspectrum_set_em_xray/stack/axis_photon_energy@long_name-attribute
/NXspectrum_set_em_xray/stack/axis_x@long_name-attribute
/NXspectrum_set_em_xray/stack/axis_y@long_name-attribute
/NXspectrum_set_em_xray/stack/data_counts@long_name-attribute
/NXspectrum_set_em_xray/summary/axis_photon_energy@long_name-attribute
/NXspectrum_set_em_xray/summary/data_counts@long_name-attribute
@mask
/NXcanSAS/ENTRY/DATA@mask-attribute
@mask_indices
/NXcanSAS/ENTRY/DATA@Mask_indices-attribute
@mime_type
/NXsubentry/thumbnail@mime_type-attribute
@name
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@name-attribute
/NXcanSAS/ENTRY/run@name-attribute
@nexus_version
/NXroot@NeXus_version-attribute
@nx_class
/NXroot@NX_class-attribute
@offset
/NXbeam/TRANSFORMATIONS/DIRECTION@offset-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@offset-attribute
/NXdetector_module/fast_pixel_direction@offset-attribute
/NXdetector_module/module_offset@offset-attribute
/NXdetector_module/slow_pixel_direction@offset-attribute
/NXevent_data/event_time_zero@offset-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@offset-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@offset-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@offset-attribute
/NXtomoproc/entry/data/data@offset-attribute
/NXtransformations/AXISNAME@offset-attribute
@offset_units
/NXdetector_module/fast_pixel_direction@offset_units-attribute
/NXdetector_module/module_offset@offset_units-attribute
/NXdetector_module/slow_pixel_direction@offset_units-attribute
/NXtransformations/AXISNAME@offset_units-attribute
@populated_elements
/NXxpcs/entry/twotime/two_time_corr_func@populated_elements-attribute
@primary
/NXdetector/time_of_flight@primary-attribute
/NXdetector/x_pixel_offset@primary-attribute
/NXdetector/y_pixel_offset@primary-attribute
/NXdetector/z_pixel_offset@primary-attribute
@program_url
/NXsensor_scan/ENTRY/PROCESS/program@program_url-attribute
@q_indices
/NXcanSAS/ENTRY/DATA@Q_indices-attribute
@region_type
/NXregion@region_type-attribute
@resolutions
/NXcanSAS/ENTRY/DATA/Q@resolutions-attribute
@resolutions_description
/NXcanSAS/ENTRY/DATA/Q@resolutions_description-attribute
@scaling
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/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1-group
a_2
/NXaberration_model_ceos/a_2-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2-group
a_3
/NXaberration_model_ceos/a_3-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3-group
a_4
/NXaberration_model_ceos/a_4-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4-group
a_6
/NXaberration_model_ceos/a_6-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6-group
abbe_number
/NXlens_opt/Abbe_number-field
aberration
/NXaberration_model/ABERRATION-group
aberration_correction
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction-group
abrasive_medium
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium-field
abrasive_medium_carrier
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium_carrier-field
absorbed_beam
/NXxas/ENTRY/DATA/absorbed_beam-link
/NXxas/ENTRY/INSTRUMENT/absorbed_beam-group
absorbing_material
/NXcollimator/absorbing_material-field
/NXfermi_chopper/absorbing_material-field
absorption_cross_section
/NXattenuator/absorption_cross_section-field
ac_line_sync
/NXscanbox_em/ac_line_sync-field
acceleration_time
/NXpositioner/acceleration_time-field
acceptance_angle
/NXfiber/acceptance_angle-field
/NXpolarizer_opt/acceptance_angle-field
accepted_photon_beam_divergence
/NXbending_magnet/accepted_photon_beam_divergence-field
accepting_aperture
/NXcapillary/accepting_aperture-field
acquisition
/NXem_ebsd/ENTRY/experiment/acquisition-group
acquisition_mode
/NXarpes/ENTRY/INSTRUMENT/analyser/acquisition_mode-field
/NXdetector/acquisition_mode-field
acquisition_program
/NXtransmission/ENTRY/acquisition_program-group
adc
/NXcircuit_board/ADC-group
additional_phase_information
/NXdispersive_material/ENTRY/sample/additional_phase_information-field
address
/NXapm/ENTRY/USER/address-field
/NXapm_composition_space_results/ENTRY/USER/address-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/address-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/address-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/address-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/address-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/address-field
/NXapm_paraprobe_results_selector/ENTRY/USER/address-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/address-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/address-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/address-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/address-field
/NXem/ENTRY/USER/address-field
/NXem_ebsd/ENTRY/USER/address-field
/NXmpes/ENTRY/USER/address-field
/NXms/ENTRY/USER/address-field
/NXms_score_results/ENTRY/USER/address-field
/NXopt/ENTRY/USER/address-field
/NXsensor_scan/ENTRY/USER/address-field
/NXtransmission/ENTRY/operator/address-field
/NXuser/address-field
adf
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf-group
adf_inner_half_angle
/NXimage_set_em_adf/PROCESS/adf_inner_half_angle-field
adf_outer_half_angle
/NXimage_set_em_adf/PROCESS/adf_outer_half_angle-field
aequatorial_angle
/NXsas/ENTRY/INSTRUMENT/DETECTOR/aequatorial_angle-field
/NXsas/ENTRY/SAMPLE/aequatorial_angle-field
/NXsastof/ENTRY/instrument/detector/aequatorial_angle-field
/NXsastof/ENTRY/sample/aequatorial_angle-field
affiliation
/NXapm/ENTRY/USER/affiliation-field
/NXapm_composition_space_results/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_selector/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/affiliation-field
/NXem/ENTRY/USER/affiliation-field
/NXem_ebsd/ENTRY/USER/affiliation-field
/NXmpes/ENTRY/USER/affiliation-field
/NXms/ENTRY/USER/affiliation-field
/NXms_score_results/ENTRY/USER/affiliation-field
/NXopt/ENTRY/USER/affiliation-field
/NXsensor_scan/ENTRY/USER/affiliation-field
/NXtransmission/ENTRY/operator/affiliation-field
/NXuser/affiliation-field
alias
/NXaberration/alias-field
/NXapm/ENTRY/specimen/alias-field
alpha
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hdbscan/alpha-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/alpha-field
/NXcg_alpha_complex/alpha-field
/NXxkappa/entry/sample/alpha-field
alpha_complex
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex-group
alpha_value_choice
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/alpha_value_choice-field
alpha_values
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/alpha_values-field
alternative
/NXopt/ENTRY/INSTRUMENT/sample_stage/alternative-field
amplifier_type
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field
analyser
/NXarpes/ENTRY/INSTRUMENT/analyser-group
/NXindirecttof/entry/INSTRUMENT/analyser-group
/NXtas/entry/INSTRUMENT/analyser-group
analysis_chamber
/NXapm/ENTRY/atom_probe/analysis_chamber-group
/NXapm/ENTRY/atom_probe/control_software/analysis_chamber-group
analysis_description
/NXapm_paraprobe_config_clusterer/ENTRY/analysis_description-field
/NXapm_paraprobe_config_distancer/ENTRY/analysis_description-field
/NXapm_paraprobe_config_intersector/ENTRY/analysis_description-field
/NXapm_paraprobe_config_nanochem/ENTRY/analysis_description-field
/NXapm_paraprobe_config_ranger/ENTRY/analysis_description-field
/NXapm_paraprobe_config_selector/ENTRY/analysis_description-field
/NXapm_paraprobe_config_spatstat/ENTRY/analysis_description-field
/NXapm_paraprobe_config_surfacer/ENTRY/analysis_description-field
/NXapm_paraprobe_config_tessellator/ENTRY/analysis_description-field
/NXapm_paraprobe_config_transcoder/ENTRY/analysis_description-field
/NXapm_paraprobe_results_clusterer/ENTRY/analysis_description-field
/NXapm_paraprobe_results_distancer/ENTRY/analysis_description-field
/NXapm_paraprobe_results_intersector/ENTRY/analysis_description-field
/NXapm_paraprobe_results_nanochem/ENTRY/analysis_description-field
/NXapm_paraprobe_results_ranger/ENTRY/analysis_description-field
/NXapm_paraprobe_results_selector/ENTRY/analysis_description-field
/NXapm_paraprobe_results_spatstat/ENTRY/analysis_description-field
/NXapm_paraprobe_results_surfacer/ENTRY/analysis_description-field
/NXapm_paraprobe_results_tessellator/ENTRY/analysis_description-field
/NXapm_paraprobe_results_transcoder/ENTRY/analysis_description-field
/NXms_score_config/ENTRY/analysis_description-field
/NXms_score_results/ENTRY/analysis_description-field
analysis_identifier
/NXapm_paraprobe_config_clusterer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_distancer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_nanochem/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_ranger/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_selector/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_spatstat/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_surfacer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_tessellator/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_transcoder/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_clusterer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_distancer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_intersector/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_ranger/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_selector/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_spatstat/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_surfacer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_tessellator/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_transcoder/ENTRY/analysis_identifier-field
/NXms_score_config/ENTRY/analysis_identifier-field
/NXms_score_results/ENTRY/analysis_identifier-field
analysis_program
/NXopt/ENTRY/derived_parameters/ANALYSIS_program-group
analyze_coprecipitation
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/analyze_coprecipitation-field
analyze_intersection
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/analyze_intersection-field
analyze_proximity
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/analyze_proximity-field
angle
/NXaberration/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/angle-field
angle_of_incidence
/NXopt/ENTRY/INSTRUMENT/angle_of_incidence-field
angles
/NXarpes/ENTRY/INSTRUMENT/analyser/angles-field
/NXgrating/angles-field
angular_calibration
/NXdetector/angular_calibration-field
/NXmpes/ENTRY/PROCESS/angular_calibration-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration-field
angular_calibration_applied
/NXdetector/angular_calibration_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration_applied-field
angular_dispersion
/NXbeam_path/GRATING/angular_dispersion-field
/NXbeam_path/MONOCHROMATOR/GRATING/angular_dispersion-field
/NXtransmission/ENTRY/instrument/spectrometer/GRATING/angular_dispersion-field
angular_resolution
/NXelectronanalyser/angular_resolution-field
angular_spread
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/focussing_probes/angular_spread-field
aoi_range
/NXbeam_splitter/AOI_range-field
aperture
/NXbeam_path/ATTENUATOR/APERTURE-group
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE-group
/NXcollectioncolumn/APERTURE-group
/NXenergydispersion/APERTURE-group
/NXinstrument/APERTURE-group
/NXsnsevent/ENTRY/instrument/APERTURE-group
/NXsnshisto/ENTRY/instrument/APERTURE-group
/NXxraylens/aperture-field
aperture_em
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM-group
/NXebeam_column/APERTURE_EM-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/APERTURE_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/APERTURE_EM-group
/NXibeam_column/APERTURE_EM-group
aperture_number
/NXbeam_path/aperture_NUMBER-group
applied
/NXapm/ENTRY/atom_probe/REFLECTRON/applied-field
/NXcalibration/applied-field
/NXcorrector_cs/applied-field
/NXdistortion/applied-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/applied-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/applied-field
/NXmpes/ENTRY/PROCESS/angular_calibration/applied-field
/NXmpes/ENTRY/PROCESS/energy_calibration/applied-field
/NXmpes/ENTRY/PROCESS/momentum_calibration/applied-field
/NXmpes/ENTRY/PROCESS/spatial_calibration/applied-field
/NXregistration/applied-field
apply
/NXms_score_config/ENTRY/solitary_unit_model/apply-field
apply_existent_ranging
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging-group
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging-group
area
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/area-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/area-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/area-field
/NXcg_polygon_set/area-field
/NXcg_triangle_set/area-field
arrival_time_pairs
/NXapm/ENTRY/atom_probe/ion_impact_positions/arrival_time_pairs-field
aspect
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/aspect-field
assumed_composition_isotopes
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/assumed_composition_isotopes-field
atom
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom-field
/NXem_ebsd_crystal_structure_model/atom-field
atom_identifier
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom_identifier-field
/NXem_ebsd_crystal_structure_model/atom_identifier-field
atom_occupancy
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom_occupancy-field
/NXem_ebsd_crystal_structure_model/atom_occupancy-field
atom_positions
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom_positions-field
/NXem_ebsd_crystal_structure_model/atom_positions-field
atom_probe
/NXapm/ENTRY/atom_probe-group
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe-group
atom_types
/NXapm/ENTRY/specimen/atom_types-field
/NXdispersive_material/ENTRY/sample/atom_types-field
/NXem/ENTRY/sample/atom_types-field
/NXmpes/ENTRY/SAMPLE/atom_types-field
/NXopt/ENTRY/SAMPLE/atom_types-field
atomic_decomposition_rule
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/atomic_decomposition_rule-group
attached_to
/NXsensor/attached_to-field
attenuation
/NXbeam_path/ATTENUATOR/attenuation-field
/NXfiber/attenuation-field
attenuator
/NXbeam_path/ATTENUATOR-group
/NXinstrument/ATTENUATOR-group
/NXmx/ENTRY/INSTRUMENT/ATTENUATOR-group
/NXsnsevent/ENTRY/instrument/ATTENUATOR-group
/NXsnshisto/ENTRY/instrument/ATTENUATOR-group
/NXxrot/entry/instrument/attenuator-group
attenuator_transmission
/NXattenuator/attenuator_transmission-field
/NXbeam_path/ATTENUATOR/attenuator_transmission-field
/NXmx/ENTRY/INSTRUMENT/ATTENUATOR/attenuator_transmission-field
/NXtransmission/ENTRY/instrument/ref_attenuator/attenuator_transmission-field
/NXtransmission/ENTRY/instrument/sample_attenuator/attenuator_transmission-field
/NXxrot/entry/instrument/attenuator/attenuator_transmission-field
author
/NXnote/author-field
/NXsnsevent/ENTRY/SNSHistoTool/author-field
/NXsnshisto/ENTRY/SNSHistoTool/author-field
average_value
/NXlog/average_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value-field
average_value_error
/NXlog/average_value_error-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value_error-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value_error-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_error-field
average_value_errors
/NXlog/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value_errors-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_errors-field
axis_angle_convention
/NXem_ebsd/ENTRY/conventions/rotation_conventions/axis_angle_convention-field
/NXem_ebsd_conventions/rotation_conventions/axis_angle_convention-field
/NXms/ENTRY/conventions/rotation_conventions/axis_angle_convention-field
/NXms_score_results/ENTRY/conventions/rotation_conventions/axis_angle_convention-field
axis_energy
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_energy-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/summary/axis_energy-field
/NXspectrum_set/stack/axis_energy-field
/NXspectrum_set/summary/axis_energy-field
axis_energy_loss
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_energy_loss-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary/axis_energy_loss-field
/NXspectrum_set_em_eels/stack/axis_energy_loss-field
/NXspectrum_set_em_eels/summary/axis_energy_loss-field
axis_image_identifier
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_image_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_image_identifier-field
/NXimage_set/stack/axis_image_identifier-field
/NXimage_set_em_adf/stack/axis_image_identifier-field
axis_mass_to_charge
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge-field
axis_photon_energy
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_photon_energy-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary/axis_photon_energy-field
/NXspectrum_set_em_xray/stack/axis_photon_energy-field
/NXspectrum_set_em_xray/summary/axis_photon_energy-field
axis_x
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/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_x-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/axis_x-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_x-field
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_x-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_x-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_x-field
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/axis_x-field
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/axis_x-field
/NXimage_set/stack/axis_x-field
/NXimage_set_em_adf/stack/axis_x-field
/NXimage_set_em_kikuchi/stack/axis_x-field
/NXspectrum_set/stack/axis_x-field
/NXspectrum_set_em_eels/stack/axis_x-field
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/axis_x-field
/NXspectrum_set_em_xray/stack/axis_x-field
axis_y
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_y-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/axis_y-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_y-field
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_y-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_y-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_y-field
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/axis_y-field
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/axis_y-field
/NXimage_set/stack/axis_y-field
/NXimage_set_em_adf/stack/axis_y-field
/NXimage_set_em_kikuchi/stack/axis_y-field
/NXspectrum_set/stack/axis_y-field
/NXspectrum_set_em_eels/stack/axis_y-field
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/axis_y-field
/NXspectrum_set_em_xray/stack/axis_y-field
axis_z
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_z-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_z-field
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_z-field
axisname
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/NXdata/AXISNAME-field
/NXtransformations/AXISNAME-field
axisname_end
/NXtransformations/AXISNAME_end-field
axisname_increment_set
/NXtransformations/AXISNAME_increment_set-field
azimuthal
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azimuthal_angle
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/NXdetector/azimuthal_angle-field
/NXlauetof/entry/instrument/detector/azimuthal_angle-field
/NXreflections/azimuthal_angle-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/azimuthal_angle-field
/NXsastof/ENTRY/instrument/detector/azimuthal_angle-field
/NXsnsevent/ENTRY/instrument/DETECTOR/azimuthal_angle-field
/NXsnshisto/ENTRY/instrument/DETECTOR/azimuthal_angle-field
/NXtofnpd/entry/INSTRUMENT/detector/azimuthal_angle-field
/NXtofraw/entry/instrument/detector/azimuthal_angle-field
/NXtofsingle/entry/INSTRUMENT/detector/azimuthal_angle-field
azimuthal_width
/NXspe/ENTRY/data/azimuthal_width-field
b
/NXcsg/b-group
b_2
/NXaberration_model_ceos/b_2-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2-group
b_4
/NXaberration_model_ceos/b_4-group
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4-group
background_correction
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background_mean
/NXreflections/background_mean-field
background_quantification
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backside_roughness
/NXellipsometry/ENTRY/SAMPLE/backside_roughness-field
bandwidth
/NXbeam_path/SOURCE/bandwidth-field
/NXinsertion_device/bandwidth-field
base_temperature
/NXapm/ENTRY/atom_probe/stage_lab/base_temperature-field
beam
/NXapm/ENTRY/atom_probe/pulser/SOURCE/BEAM-group
/NXcontainer/beam-group
/NXebeam_column/BEAM-group
/NXibeam_column/BEAM-group
/NXinstrument/BEAM-group
/NXmpes/ENTRY/INSTRUMENT/BEAM-group
/NXmx/ENTRY/INSTRUMENT/BEAM-group
/NXpulser_apm/SOURCE/BEAM-group
/NXsample/BEAM-group
beam_1
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beam_center_derived
/NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_derived-field
beam_center_x
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x-field
/NXdetector/beam_center_x-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
/NXsastof/ENTRY/instrument/detector/beam_center_x-field
/NXxpcs/entry/instrument/DETECTOR/beam_center_x-field
/NXxrot/entry/instrument/detector/beam_center_x-field
beam_center_y
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y-field
/NXdetector/beam_center_y-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
/NXsastof/ENTRY/instrument/detector/beam_center_y-field
/NXxpcs/entry/instrument/DETECTOR/beam_center_y-field
/NXxrot/entry/instrument/detector/beam_center_y-field
beam_current
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/beam_current-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/beam_current-field
/NXoptical_system_em/beam_current-field
beam_current_description
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/beam_current_description-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/beam_current_description-field
/NXoptical_system_em/beam_current_description-field
beam_path
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH-group
/NXopt/ENTRY/INSTRUMENT/BEAM_PATH-group
beam_position
/NXdisk_chopper/beam_position-field
beam_profile
/NXbeam_path/SOURCE/beam_profile-field
beam_shape
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_shape-field
beam_size_x
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_x-field
beam_size_y
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_y-field
beam_splitter
/NXbeam_path/BEAM_SPLITTER-group
beam_stop
/NXinstrument/BEAM_STOP-group
beamline
/NXsnsevent/ENTRY/instrument/beamline-field
/NXsnshisto/ENTRY/instrument/beamline-field
beamline_distance
/NXelectrostatic_kicker/beamline_distance-field
/NXmagnetic_kicker/beamline_distance-field
/NXquadrupole_magnet/beamline_distance-field
/NXseparator/beamline_distance-field
/NXsolenoid_magnet/beamline_distance-field
/NXspin_rotator/beamline_distance-field
bend_angle_x
/NXguide/bend_angle_x-field
/NXmirror/bend_angle_x-field
bend_angle_y
/NXguide/bend_angle_y-field
/NXmirror/bend_angle_y-field
bending_magnet
/NXinstrument/BENDING_MAGNET-group
bending_radius
/NXbending_magnet/bending_radius-field
bias_voltage
/NXstage_lab/bias_voltage-field
bibtex
/NXcite/bibtex-field
binning
/NXem_ebsd/ENTRY/experiment/indexing/binning-group
bit_depth_readout
/NXdetector/bit_depth_readout-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/bit_depth_readout-field
bitdepth
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/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/sign_valid/bitdepth-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window/bitdepth-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window_triangles/bitdepth-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/window/bitdepth-field
/NXapm_paraprobe_results_selector/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/window/bitdepth-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_bottom/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_front/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_global/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_left/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_rear/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_right/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_top/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/window/bitdepth-field
/NXcs_filter_boolean_mask/bitdepth-field
/NXem_ebsd/ENTRY/correlation/PROCESS/bitdepth-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/bitdepth-field
blade_geometry
/NXaperture/BLADE_GEOMETRY-group
blade_spacing
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blade_thickness
/NXcollimator/blade_thickness-field
blaze_wavelength
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/NXtransmission/ENTRY/instrument/spectrometer/GRATING/blaze_wavelength-field
block
/NXregion/block-field
boundaries
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/NXcg_grid/boundaries-field
/NXms/ENTRY/ROI_SET/boundary/boundaries-field
/NXms_score_results/ENTRY/ROI_SET/boundary/boundaries-field
boundary
/NXms/ENTRY/ROI_SET/boundary-group
/NXms_score_results/ENTRY/ROI_SET/boundary-group
boundary_conditions
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/boundary_conditions-field
/NXcg_grid/boundary_conditions-field
/NXms/ENTRY/ROI_SET/boundary/boundary_conditions-field
/NXms_score_results/ENTRY/ROI_SET/boundary/boundary_conditions-field
bounding_box
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/NXcg_grid/bounding_box-group
/NXcg_polygon_set/bounding_box-group
/NXcg_triangle_set/bounding_box-group
/NXreflections/bounding_box-field
bragg_angle
/NXcrystal/bragg_angle-field
bright_field
/NXtomophase/entry/instrument/bright_field-group
brightness
/NXibeam_column/ion_source/brightness-field
buffer_chamber
/NXapm/ENTRY/atom_probe/buffer_chamber-group
/NXapm/ENTRY/atom_probe/control_software/buffer_chamber-group
bunch_distance
/NXsource/bunch_distance-field
bunch_length
/NXsource/bunch_length-field
bunch_pattern
/NXsource/bunch_pattern-group
c_1
/NXaberration_model_ceos/c_1-group
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1-group
c_1_0
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/NXaberration_model_nion/c_1_0-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0-group
c_1_2_a
/NXaberration_model/c_1_2_a-field
/NXaberration_model_nion/c_1_2_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a-group
c_1_2_b
/NXaberration_model/c_1_2_b-field
/NXaberration_model_nion/c_1_2_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b-group
c_2_1_a
/NXaberration_model/c_2_1_a-field
/NXaberration_model_nion/c_2_1_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a-group
c_2_1_b
/NXaberration_model/c_2_1_b-field
/NXaberration_model_nion/c_2_1_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b-group
c_2_3_a
/NXaberration_model/c_2_3_a-field
/NXaberration_model_nion/c_2_3_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a-group
c_2_3_b
/NXaberration_model/c_2_3_b-field
/NXaberration_model_nion/c_2_3_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b-group
c_3
/NXaberration_model_ceos/c_3-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3-group
c_3_0
/NXaberration_model/c_3_0-field
/NXaberration_model_nion/c_3_0-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0-group
c_3_2_a
/NXaberration_model/c_3_2_a-field
/NXaberration_model_nion/c_3_2_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a-group
c_3_2_b
/NXaberration_model/c_3_2_b-field
/NXaberration_model_nion/c_3_2_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b-group
c_3_4_a
/NXaberration_model/c_3_4_a-field
/NXaberration_model_nion/c_3_4_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a-group
c_3_4_b
/NXaberration_model/c_3_4_b-field
/NXaberration_model_nion/c_3_4_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b-group
c_4_1_a
/NXaberration_model_nion/c_4_1_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a-group
c_4_1_b
/NXaberration_model_nion/c_4_1_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b-group
c_4_3_a
/NXaberration_model_nion/c_4_3_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a-group
c_4_3_b
/NXaberration_model_nion/c_4_3_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b-group
c_4_5_a
/NXaberration_model_nion/c_4_5_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a-group
c_4_5_b
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b-group
c_5
/NXaberration_model_ceos/c_5-group
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5-group
c_5_0
/NXaberration_model/c_5_0-field
/NXaberration_model_nion/c_5_0-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0-group
c_5_2_a
/NXaberration_model_nion/c_5_2_a-group
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a-group
c_5_2_b
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b-group
c_5_4_a
/NXaberration_model_nion/c_5_4_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a-group
c_5_4_b
/NXaberration_model_nion/c_5_4_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b-group
c_5_6_a
/NXaberration_model_nion/c_5_6_a-group
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a-group
c_5_6_b
/NXaberration_model_nion/c_5_6_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b-group
calibrated_axis
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/NXmpes/ENTRY/PROCESS/energy_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/momentum_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/spatial_calibration/calibrated_axis-field
calibrated_tof
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calibration
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/NXopt/ENTRY/INSTRUMENT/calibration-group
calibration_data_link
/NXopt/ENTRY/INSTRUMENT/calibration/calibration_data_link-field
calibration_date
/NXdetector/calibration_date-field
calibration_method
/NXdetector/calibration_method-group
calibration_status
/NXopt/ENTRY/INSTRUMENT/calibration_status-field
calibration_style
/NXscanbox_em/calibration_style-field
calibration_time
/NXopt/ENTRY/INSTRUMENT/calibration/calibration_time-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/calibration_time-field
cameca_to_nexus
/NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus-group
camera_length
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/camera_length-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/camera_length-field
/NXoptical_system_em/camera_length-field
candidates
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/decorating_iontypes_filter/candidates-field
cap_surface_area
/NXcg_cylinder_set/cap_surface_area-field
capabilities
/NXapm/ENTRY/atom_probe/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/getter_pump/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/pulser/SOURCE/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION/capabilities-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
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/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXem/ENTRY/em_lab/FABRICATION/capabilities-field
/NXem/ENTRY/em_lab/stage_lab/FABRICATION/capabilities-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
capability
/NXfabrication/capability-field
capillary
/NXinstrument/CAPILLARY-group
cardinality
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/cardinality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/face_normal/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/vertex_normal/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/face_normal/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/vertex_normal/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/cardinality-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/cardinality-field
/NXcg_cylinder_set/cardinality-field
/NXcg_ellipsoid_set/cardinality-field
/NXcg_grid/cardinality-field
/NXcg_hexahedron_set/cardinality-field
/NXcg_parallelogram_set/cardinality-field
/NXcg_point_set/cardinality-field
/NXcg_polygon_set/cardinality-field
/NXcg_polyhedron_set/cardinality-field
/NXcg_polyline_set/cardinality-field
/NXcg_sphere_set/cardinality-field
/NXcg_tetrahedron_set/cardinality-field
/NXcg_triangle_set/cardinality-field
/NXcg_unit_normal_set/cardinality-field
/NXgraph_node_set/cardinality-field
/NXms_feature_set/cardinality-field
/NXms_score_results/ENTRY/ROI_SET/grid/cardinality-field
/NXsimilarity_grouping/cardinality-field
categorical_label
/NXclustering/categorical_label-field
/NXsimilarity_grouping/categorical_label-field
cdeform_field
/NXdistortion/cdeform_field-field
cell_dimensions
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/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/cell_dimensions-field
/NXcg_grid/cell_dimensions-field
/NXms_score_results/ENTRY/ROI_SET/grid/cell_dimensions-field
cell_size
/NXms_score_config/ENTRY/initial_microstructure/cell_size-field
center
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/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/center-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/center-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/center-field
/NXcg_cylinder_set/center-field
/NXcg_ellipsoid_set/center-field
/NXcg_hexahedron_set/center-field
/NXcg_parallelogram_set/center-field
/NXcg_polygon_set/center-field
/NXcg_polyhedron_set/center-field
/NXcg_sphere_set/center-field
/NXcg_tetrahedron_set/center-field
/NXcg_triangle_set/center-field
/NXscanbox_em/center-field
center_energy
/NXenergydispersion/center_energy-field
central_stop_diameter
/NXfresnel_zone_plate/central_stop_diameter-field
central_stop_material
/NXfresnel_zone_plate/central_stop_material-field
central_stop_thickness
/NXfresnel_zone_plate/central_stop_thickness-field
ceos
/NXcorrector_cs/ZEMLIN_TABLEAU/PROCESS/ceos-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos-group
cg_cylinder_set
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/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
/NXcg_roi_set/CG_CYLINDER_SET-group
/NXspatial_filter/CG_CYLINDER_SET-group
cg_ellipsoid_set
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/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
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/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
/NXcg_roi_set/CG_ELLIPSOID_SET-group
/NXspatial_filter/CG_ELLIPSOID_SET-group
cg_geodesic_mesh
/NXem_ebsd/ENTRY/simulation/CG_GEODESIC_MESH-group
cg_grid
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID-group
cg_half_edge_data_structure
/NXcg_triangulated_surface_mesh/CG_HALF_EDGE_DATA_STRUCTURE-group
cg_hexahedron_set
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET-group
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cg_sphere_set
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cg_triangle_set
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chamber
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clad_material
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cladding
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cleaning_step
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clear_aperture
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cluster_statistics
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clustering_composition_space
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clustering_real_space
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coating
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coating_diameter
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coating_material
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collection
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comment
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company
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component
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composition
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composition_product
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composition_profiling
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computation_method
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concentration
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control
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convention
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conventions
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coordinate_system
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coprecipitation_analysis
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core
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core_index_of_refraction
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core_material
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core_sample_indices
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corrector_cs
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correlation
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crate
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critical_energy
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cryocoolant
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cryostat_temperature
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crystal
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cs_gpu
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csg
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cumulated
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cumulated_normalized
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/NXsource/current-field
current_sensor
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current_set
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current_set_feature_to_cluster
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current_to_next_link
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current_to_next_link_type
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current_working_directory
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curvature
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curvature_horizontal
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curvature_radius_face
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curvature_vertical
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cut_angle
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cw
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cw_power
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cylinder_orientation
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cylinders
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cylindrical
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cylindrical_geometry
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cylindrical_orientation_angle
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d
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d_4
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d_spacing
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dac
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dark_field
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daslogs
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data
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data_counts
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data_errors
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data_file
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data_identifier
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data_origin
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data_size
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data_software
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data_stride
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data_type
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data_x_time_of_flight
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data_x_y
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data_y_time_of_flight
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dataset
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/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset-group
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/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/dataset-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/dataset-group
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/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset-group
/NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/dataset-group
dataset_name
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/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances/dataset_name-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances/dataset_name-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/ion_to_edge_distances/dataset_name-field
dataset_name_distances
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_edge_distances/dataset_name_distances-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_feature_distances/dataset_name_distances-field
dataset_name_facet_indices
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/dataset_name_facet_indices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_facet_indices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_indices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/dataset_name_facet_indices-field
dataset_name_facet_normals
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/dataset_name_facet_normals-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_facet_normals-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_normals-field
dataset_name_facet_vertices
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_vertices-field
dataset_name_mass_to_charge
/NXapm_input_reconstruction/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
dataset_name_reconstruction
/NXapm_input_reconstruction/dataset_name_reconstruction-field
/NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
dataset_name_vertices
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/dataset_name_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/dataset_name_vertices-field
date
/NXcanSAS/ENTRY/PROCESS/date-field
/NXdispersive_material/ENTRY/date-field
/NXnote/date-field
/NXprocess/date-field
/NXsnsevent/ENTRY/SNSHistoTool/date-field
/NXsnshisto/ENTRY/SNSHistoTool/date-field
/NXtomoproc/entry/reconstruction/date-field
/NXxasproc/ENTRY/XAS_data_reduction/date-field
dbscan
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dbscan-group
dbscanid
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID-group
dead_time
/NXdetector/dead_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/dead_time-field
decorating_iontypes_filter
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/decorating_iontypes_filter-group
decorator_multiplicity
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/decorator_multiplicity-field
definition
/NXapm/ENTRY/definition-field
/NXapm_composition_space_results/ENTRY/definition-field
/NXapm_paraprobe_config_clusterer/ENTRY/definition-field
/NXapm_paraprobe_config_distancer/ENTRY/definition-field
/NXapm_paraprobe_config_intersector/ENTRY/definition-field
/NXapm_paraprobe_config_nanochem/ENTRY/definition-field
/NXapm_paraprobe_config_ranger/ENTRY/definition-field
/NXapm_paraprobe_config_selector/ENTRY/definition-field
/NXapm_paraprobe_config_spatstat/ENTRY/definition-field
/NXapm_paraprobe_config_surfacer/ENTRY/definition-field
/NXapm_paraprobe_config_tessellator/ENTRY/definition-field
/NXapm_paraprobe_config_transcoder/ENTRY/definition-field
/NXapm_paraprobe_results_clusterer/ENTRY/definition-field
/NXapm_paraprobe_results_distancer/ENTRY/definition-field
/NXapm_paraprobe_results_intersector/ENTRY/definition-field
/NXapm_paraprobe_results_nanochem/ENTRY/definition-field
/NXapm_paraprobe_results_ranger/ENTRY/definition-field
/NXapm_paraprobe_results_selector/ENTRY/definition-field
/NXapm_paraprobe_results_spatstat/ENTRY/definition-field
/NXapm_paraprobe_results_surfacer/ENTRY/definition-field
/NXapm_paraprobe_results_tessellator/ENTRY/definition-field
/NXapm_paraprobe_results_transcoder/ENTRY/definition-field
/NXarchive/entry/definition-field
/NXarpes/ENTRY/definition-field
/NXcanSAS/ENTRY/definition-field
/NXcxi_ptycho/entry_1/definition-field
/NXdirecttof/entry/definition-field
/NXdispersive_material/ENTRY/definition-field
/NXellipsometry/ENTRY/definition-field
/NXem/ENTRY/definition-field
/NXem_ebsd/ENTRY/definition-field
/NXentry/definition-field
/NXfluo/entry/definition-field
/NXindirecttof/entry/definition-field
/NXiqproc/ENTRY/definition-field
/NXiv_temp/ENTRY/definition-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/definition-field
/NXlab_sample_mounting/ENTRY/definition-field
/NXlauetof/entry/definition-field
/NXmonopd/entry/definition-field
/NXmpes/ENTRY/definition-field
/NXms/ENTRY/definition-field
/NXms_score_config/ENTRY/definition-field
/NXms_score_results/ENTRY/definition-field
/NXmx/ENTRY/definition-field
/NXopt/ENTRY/definition-field
/NXrefscan/entry/definition-field
/NXreftof/entry/definition-field
/NXsas/ENTRY/definition-field
/NXsastof/ENTRY/definition-field
/NXscan/ENTRY/definition-field
/NXsensor_scan/ENTRY/definition-field
/NXsnsevent/ENTRY/definition-field
/NXsnshisto/ENTRY/definition-field
/NXspe/ENTRY/definition-field
/NXsqom/ENTRY/definition-field
/NXstxm/ENTRY/definition-field
/NXsubentry/definition-field
/NXtas/entry/definition-field
/NXtofnpd/entry/definition-field
/NXtofraw/entry/definition-field
/NXtofsingle/entry/definition-field
/NXtomo/entry/definition-field
/NXtomophase/entry/definition-field
/NXtomoproc/entry/definition-field
/NXtransmission/ENTRY/definition-field
/NXxas/ENTRY/definition-field
/NXxasproc/ENTRY/definition-field
/NXxbase/entry/definition-field
/NXxeuler/entry/definition-field
/NXxkappa/entry/definition-field
/NXxlaue/entry/definition-field
/NXxlaueplate/entry/definition-field
/NXxnb/entry/definition-field
/NXxpcs/entry/definition-field
/NXxrot/entry/definition-field
definition_local
/NXentry/definition_local-field
/NXsubentry/definition_local-field
deflection_angle
/NXbeam_splitter/deflection_angle-field
/NXgrating/deflection_angle-field
deflector
/NXcollectioncolumn/DEFLECTOR-group
/NXelectronanalyser/DEFLECTOR-group
/NXenergydispersion/DEFLECTOR-group
/NXspindispersion/DEFLECTOR-group
defocus
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/defocus-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/defocus-field
/NXoptical_system_em/defocus-field
deformation_gradient
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/deformation_gradient-group
/NXms/ENTRY/ROI_SET/snapshot_set/evolution/deformation_gradient-group
deformed_grain_identifier
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front/deformed_grain_identifier-field
defragment_cell_cache
/NXms_score_config/ENTRY/numerics/defragment_cell_cache-field
defragment_x
/NXms_score_config/ENTRY/numerics/defragment_x-field
delay
/NXdisk_chopper/delay-field
delay_difference
/NXxpcs/entry/data/delay_difference-field
delocalization
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION-group
delta_time
/NXaberration/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/delta_time-field
density
/NXcontainer/density-field
/NXcrystal/density-field
/NXem/ENTRY/sample/density-field
/NXfilter/density-field
/NXsample/density-field
/NXsample_component/density-field
depends_on
/NXaperture/depends_on-field
/NXattenuator/depends_on-field
/NXbeam/depends_on-field
/NXbeam_path/SOURCE/depends_on-field
/NXbeam_path/depends_on-field
/NXbeam_path/window_NUMBER/depends_on-field
/NXbeam_stop/depends_on-field
/NXbending_magnet/depends_on-field
/NXcapillary/depends_on-field
/NXcollectioncolumn/depends_on-field
/NXcollimator/depends_on-field
/NXcrystal/depends_on-field
/NXdeflector/depends_on-field
/NXdetector/depends_on-field
/NXdetector_module/depends_on-field
/NXdisk_chopper/depends_on-field
/NXelectronanalyser/depends_on-field
/NXenvironment/depends_on-field
/NXfermi_chopper/depends_on-field
/NXfilter/depends_on-field
/NXflipper/depends_on-field
/NXfresnel_zone_plate/depends_on-field
/NXgrating/depends_on-field
/NXguide/depends_on-field
/NXinsertion_device/depends_on-field
/NXlens_em/depends_on-field
/NXmanipulator/depends_on-field
/NXmirror/depends_on-field
/NXmoderator/depends_on-field
/NXmonitor/depends_on-field
/NXmonochromator/depends_on-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/depends_on-field
/NXmx/ENTRY/SAMPLE/depends_on-field
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/depends_on-field
/NXpinhole/depends_on-field
/NXpolarizer/depends_on-field
/NXpositioner/depends_on-field
/NXquadric/depends_on-field
/NXregistration/depends_on-field
/NXsample/depends_on-field
/NXsensor/depends_on-field
/NXslit/depends_on-field
/NXsource/depends_on-field
/NXspindispersion/depends_on-field
/NXvelocity_selector/depends_on-field
/NXxraylens/depends_on-field
depolarization
/NXopt/ENTRY/derived_parameters/depolarization-field
depth
/NXgrating/depth-field
derived_parameters
/NXopt/ENTRY/derived_parameters-group
description
/NXaperture/description-field
/NXaperture_em/description-field
/NXapm/ENTRY/atom_probe/REFLECTRON/description-field
/NXapm/ENTRY/atom_probe/analysis_chamber/description-field
/NXapm/ENTRY/atom_probe/buffer_chamber/description-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/description-field
/NXapm/ENTRY/sample/description-field
/NXapm/ENTRY/specimen/description-field
/NXapm_composition_space_results/ENTRY/description-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXarchive/entry/instrument/description-field
/NXarchive/entry/sample/description-field
/NXbeam_stop/description-field
/NXcalibration/description-field
/NXcanSAS/ENTRY/PROCESS/description-field
/NXchamber/description-field
/NXcite/description-field
/NXcontainer/description-field
/NXcorrector_cs/ZEMLIN_TABLEAU/description-field
/NXcorrector_cs/description-field
/NXcs_profiling_event/description-field
/NXdeflector/description-field
/NXdetector/description-field
/NXdispersion_repeated_parameter/description-field
/NXdispersion_single_parameter/description-field
/NXdistortion/description-field
/NXebeam_column/electron_source/description-field
/NXelectronanalyser/description-field
/NXelectrostatic_kicker/description-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/description-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/description-field
/NXem/ENTRY/em_lab/stage_lab/description-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/description-field
/NXem/ENTRY/sample/description-field
/NXem_ebsd/ENTRY/correlation/PROCESS/description-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/description-field
/NXenvironment/description-field
/NXfiber/description-field
/NXfilter/description-field
/NXgeometry/description-field
/NXguide/description-field
/NXibeam_column/ion_source/description-field
/NXlens_em/description-field
/NXlog/description-field
/NXmagnetic_kicker/description-field
/NXmanipulator/description-field
/NXmirror/description-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/description-field
/NXnote/description-field
/NXpid/description-field
/NXpositioner/description-field
/NXquadrupole_magnet/description-field
/NXreflectron/description-field
/NXregistration/description-field
/NXsample/description-field
/NXsample_component/description-field
/NXseparator/description-field
/NXsnsevent/ENTRY/DASlogs/LOG/description-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field
/NXsnsevent/ENTRY/SNSHistoTool/description-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/description-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/description-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/description-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/description-field
/NXsnshisto/ENTRY/DASlogs/LOG/description-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/description-field
/NXsnshisto/ENTRY/SNSHistoTool/description-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/description-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/description-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/description-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/description-field
/NXsolenoid_magnet/description-field
/NXspin_rotator/description-field
/NXstage_lab/description-field
/NXxpcs/entry/instrument/DETECTOR/description-field
descriptor
/NXem_ebsd/ENTRY/correlation/region_of_interest/descriptor-field
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/descriptor-field
design
/NXapm/ENTRY/atom_probe/getter_pump/design-field
/NXapm/ENTRY/atom_probe/roughening_pump/design-field
/NXapm/ENTRY/atom_probe/turbomolecular_pump/design-field
/NXem/ENTRY/em_lab/stage_lab/design-field
/NXpump/design-field
/NXstage_lab/design-field
det_module
/NXreflections/det_module-field
details
/NXcanSAS/ENTRY/SAMPLE/details-field
detection_angle
/NXopt/ENTRY/INSTRUMENT/detection_angle-field
detection_gas_path
/NXdetector/detection_gas_path-field
detection_rate
/NXapm/ENTRY/atom_probe/specimen_monitoring/detection_rate-field
detector
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR-group
/NXelectronanalyser/DETECTOR-group
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/DETECTOR-group
/NXem/ENTRY/em_lab/DETECTOR-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/DETECTOR-group
/NXinstrument/DETECTOR-group
/NXlauetof/entry/instrument/detector-group
/NXmonopd/entry/INSTRUMENT/DETECTOR-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR-group
/NXrefscan/entry/instrument/DETECTOR-group
/NXreftof/entry/instrument/detector-group
/NXsas/ENTRY/INSTRUMENT/DETECTOR-group
/NXsastof/ENTRY/instrument/detector-group
/NXscan/ENTRY/INSTRUMENT/DETECTOR-group
/NXsnsevent/ENTRY/instrument/DETECTOR-group
/NXsnshisto/ENTRY/instrument/DETECTOR-group
/NXstxm/ENTRY/INSTRUMENT/DETECTOR-group
/NXtas/entry/INSTRUMENT/DETECTOR-group
/NXtofnpd/entry/INSTRUMENT/detector-group
/NXtofraw/entry/instrument/detector-group
/NXtofsingle/entry/INSTRUMENT/detector-group
/NXtomo/entry/instrument/detector-group
/NXtransmission/ENTRY/instrument/DETECTOR-group
/NXxbase/entry/instrument/detector-group
/NXxeuler/entry/instrument/detector-group
/NXxkappa/entry/instrument/detector-group
/NXxlaueplate/entry/instrument/detector-group
/NXxnb/entry/instrument/detector-group
/NXxpcs/entry/instrument/DETECTOR-group
/NXxrot/entry/instrument/detector-group
detector_1
/NXcxi_ptycho/entry_1/instrument_1/detector_1-group
detector_faces
/NXoff_geometry/detector_faces-field
detector_group
/NXinstrument/DETECTOR_GROUP-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP-group
detector_identifier
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/PROCESS/detector_identifier-field
/NXimage_set/PROCESS/detector_identifier-field
/NXspectrum_set/PROCESS/detector_identifier-field
detector_module
/NXdetector/DETECTOR_MODULE-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE-group
detector_number
/NXcylindrical_geometry/detector_number-field
/NXdetector/detector_number-field
/NXtofnpd/entry/INSTRUMENT/detector/detector_number-field
/NXtofnpd/entry/data/detector_number-link
/NXtofraw/entry/data/detector_number-link
/NXtofraw/entry/instrument/detector/detector_number-field
detector_readout_time
/NXdetector/detector_readout_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/detector_readout_time-field
detector_reference_frame
/NXem_ebsd/ENTRY/conventions/detector_reference_frame-group
/NXem_ebsd_conventions/detector_reference_frame-group
detector_type
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field
diameter
/NXdetector/diameter-field
/NXenergydispersion/diameter-field
/NXpinhole/diameter-field
/NXwaveplate/diameter-field
/NXxlaueplate/entry/instrument/detector/diameter-field
dielectric_function
/NXdispersion_table/dielectric_function-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/dielectric_function-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/dielectric_function-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/dielectric_function-field
diffraction_order
/NXgrating/diffraction_order-field
diffractometer
/NXinstrument/DIFFRACTOMETER-group
dimensionality
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/dimensionality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/face_normal/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/vertex_normal/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/face_normal/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/vertex_normal/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/dimensionality-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/dimensionality-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/dimensionality-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/dimensionality-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/dimensionality-field
/NXcg_alpha_complex/dimensionality-field
/NXcg_cylinder_set/dimensionality-field
/NXcg_ellipsoid_set/dimensionality-field
/NXcg_face_list_data_structure/dimensionality-field
/NXcg_grid/dimensionality-field
/NXcg_half_edge_data_structure/dimensionality-field
/NXcg_hexahedron_set/dimensionality-field
/NXcg_parallelogram_set/dimensionality-field
/NXcg_point_set/dimensionality-field
/NXcg_polygon_set/dimensionality-field
/NXcg_polyhedron_set/dimensionality-field
/NXcg_polyline_set/dimensionality-field
/NXcg_sphere_set/dimensionality-field
/NXcg_tetrahedron_set/dimensionality-field
/NXcg_triangle_set/dimensionality-field
/NXcg_unit_normal_set/dimensionality-field
/NXgraph_node_set/dimensionality-field
/NXisocontour/dimensionality-field
/NXms_feature_set/dimensionality-field
/NXms_score_results/ENTRY/ROI_SET/grid/dimensionality-field
direction
/NXbeam/TRANSFORMATIONS/DIRECTION-field
/NXshape/direction-field
direction_model
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/direction_model-field
directionality
/NXgraph_edge_set/directionality-field
disk_chopper
/NXbeam_path/DISK_CHOPPER-group
/NXdirecttof/entry/INSTRUMENT/disk_chopper-group
/NXinstrument/DISK_CHOPPER-group
/NXsnsevent/ENTRY/instrument/DISK_CHOPPER-group
/NXsnshisto/ENTRY/instrument/DISK_CHOPPER-group
dislocation_density
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grain_ensemble/dislocation_density-field
dispersion
/NXfiber/dispersion-field
dispersion_function
/NXdispersion/DISPERSION_FUNCTION-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION-group
dispersion_repeated_parameter
/NXdispersion_function/DISPERSION_REPEATED_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
dispersion_single_parameter
/NXdispersion_function/DISPERSION_SINGLE_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
dispersion_table
/NXdispersion/DISPERSION_TABLE-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE-group
dispersion_type
/NXdispersive_material/ENTRY/dispersion_type-field
/NXfiber/dispersion_type-field
dispersion_x
/NXdispersive_material/ENTRY/dispersion_x-group
dispersion_y
/NXdispersive_material/ENTRY/dispersion_y-group
dispersion_z
/NXdispersive_material/ENTRY/dispersion_z-group
dispersoid_drag_model
/NXms_score_config/ENTRY/dispersoid_drag_model-group
distance
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/distance-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/knn/distance-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/rdf/distance-field
/NXattenuator/distance-field
/NXbeam/distance-field
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/distance-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/distance-field
/NXdetector/distance-field
/NXdisk_chopper/distance-field
/NXfermi_chopper/distance-field
/NXindirecttof/entry/INSTRUMENT/analyser/distance-field
/NXlauetof/entry/instrument/detector/distance-field
/NXmoderator/distance-field
/NXmonitor/distance-field
/NXmpes/ENTRY/INSTRUMENT/BEAM/distance-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/distance-field
/NXreftof/entry/instrument/chopper/distance-field
/NXreftof/entry/instrument/detector/distance-field
/NXsample/distance-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/distance-field
/NXsastof/ENTRY/instrument/detector/distance-field
/NXsnsevent/ENTRY/MONITOR/distance-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/ATTENUATOR/distance-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/DETECTOR/distance-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/DISK_CHOPPER/distance-field
/NXsnsevent/ENTRY/instrument/moderator/distance-field
/NXsnshisto/ENTRY/MONITOR/distance-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/translation/distance-field
/NXsnshisto/ENTRY/instrument/ATTENUATOR/distance-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
/NXsnshisto/ENTRY/instrument/DETECTOR/distance-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation/distance-field
/NXsnshisto/ENTRY/instrument/DISK_CHOPPER/distance-field
/NXsnshisto/ENTRY/instrument/FERMI_CHOPPER/distance-field
/NXsnshisto/ENTRY/instrument/moderator/distance-field
/NXsource/distance-field
/NXspe/ENTRY/data/distance-field
/NXtofnpd/entry/INSTRUMENT/detector/distance-field
/NXtofnpd/entry/MONITOR/distance-field
/NXtofraw/entry/MONITOR/distance-field
/NXtofraw/entry/instrument/detector/distance-field
/NXtofsingle/entry/INSTRUMENT/detector/distance-field
/NXtofsingle/entry/MONITOR/distance-field
/NXtomo/entry/instrument/detector/distance-field
/NXtomophase/entry/instrument/sample/distance-field
/NXxbase/entry/instrument/detector/distance-field
/NXxbase/entry/sample/distance-field
/NXxpcs/entry/instrument/DETECTOR/distance-field
distance_derived
/NXmx/ENTRY/INSTRUMENT/DETECTOR/distance_derived-field
distance_to_detector
/NXbeam_stop/distance_to_detector-field
distances
/NXtranslation/distances-field
distancing_model
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/distancing_model-field
distribution
/NXmonochromator/distribution-group
/NXsource/distribution-group
/NXxlaue/entry/instrument/source/distribution-group
divergence
/NXbeam_path/SOURCE/divergence-field
divergence_x
/NXcollimator/divergence_x-field
divergence_x_minus
/NXbending_magnet/divergence_x_minus-field
divergence_x_plus
/NXbending_magnet/divergence_x_plus-field
divergence_y
/NXcollimator/divergence_y-field
divergence_y_minus
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divergence_y_plus
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doi
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/NXdispersive_material/ENTRY/REFERENCES/doi-field
domain_identifier
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domain_size
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downsampled
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dql
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dqw
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drain_current
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/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current-field
dspacing
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/NXem_ebsd_crystal_structure_model/dspacing-field
duration
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/NXsnsevent/ENTRY/DASlogs/POSITIONER/duration-field
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/NXtofsingle/entry/duration-field
duty_cycle
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dynamic_phi_list
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dynamic_q_list
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dynamic_roi_map
/NXxpcs/entry/instrument/masks/dynamic_roi_map-field
ebeam_column
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ebeam_deflector
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/ebeam_deflector-group
ebsd
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edge_contact
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edge_distance
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edge_handling_method
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edge_identifier
/NXcg_face_list_data_structure/edge_identifier-field
edge_identifier_offset
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/NXcg_face_list_data_structure/edge_identifier_offset-field
edge_length
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/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/edge_length-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/edge_length-field
/NXcg_polygon_set/edge_length-field
/NXcg_polyhedron_set/edge_length-field
/NXcg_tetrahedron_set/edge_length-field
/NXcg_triangle_set/edge_length-field
edge_normal
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/NXcg_parallelogram_set/edge_normal-group
/NXcg_polygon_set/edge_normal-group
/NXcg_polyhedron_set/edge_normal-group
/NXcg_polyline_set/edge_normal-group
/NXcg_tetrahedron_set/edge_normal-group
/NXcg_triangle_set/edge_normal-group
edge_of_the_dataset
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edge_threshold
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edges
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edges_are_unique
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eels
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ef
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/NXtas/entry/INSTRUMENT/analyser/ef-field
efficiency
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ei
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elapsed_time
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/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/elapsed_time-field
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electric_field
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/NXms/ENTRY/ROI_SET/snapshot_set/evolution/electric_field-group
/NXsample/electric_field-field
electrical_conductivity
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electron_source
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electronanalyser
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element_names
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element_whitelist
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elementname
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/NXspectrum_set_em_xray/indexing/ELEMENTNAME-group
ellipsometer_type
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em_ebsd_crystal_structure_model
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email
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/NXapm_paraprobe_results_distancer/ENTRY/USER/email-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/email-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/email-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/email-field
/NXapm_paraprobe_results_selector/ENTRY/USER/email-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/email-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/email-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/email-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/email-field
/NXem/ENTRY/USER/email-field
/NXem_ebsd/ENTRY/USER/email-field
/NXmpes/ENTRY/USER/email-field
/NXms/ENTRY/USER/email-field
/NXms_score_results/ENTRY/USER/email-field
/NXopt/ENTRY/USER/email-field
/NXsensor_scan/ENTRY/USER/email-field
/NXtransmission/ENTRY/operator/email-field
/NXuser/email-field
embedding_medium
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emittance_x
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emittance_y
/NXsource/emittance_y-field
emitter_material
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emitter_type
/NXebeam_column/electron_source/emitter_type-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/emitter_type-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/emitter_type-field
/NXibeam_column/ion_source/emitter_type-field
en
/NXsqom/ENTRY/DATA/en-field
/NXtas/entry/DATA/en-link
/NXtas/entry/SAMPLE/en-field
end_time
/NXapm/ENTRY/end_time-field
/NXapm_composition_space_results/ENTRY/end_time-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/end_time-field
/NXapm_composition_space_results/ENTRY/performance/end_time-field
/NXapm_paraprobe_results_clusterer/ENTRY/end_time-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/end_time-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/end_time-field
/NXapm_paraprobe_results_distancer/ENTRY/end_time-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/end_time-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/end_time-field
/NXapm_paraprobe_results_intersector/ENTRY/end_time-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/end_time-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/end_time-field
/NXapm_paraprobe_results_nanochem/ENTRY/end_time-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/end_time-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/end_time-field
/NXapm_paraprobe_results_ranger/ENTRY/end_time-field
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/NXapm_paraprobe_results_ranger/ENTRY/performance/end_time-field
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/NXapm_paraprobe_results_transcoder/ENTRY/end_time-field
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/NXcs_profiling/end_time-field
/NXcs_profiling_event/end_time-field
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/NXem/ENTRY/end_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/end_time-field
/NXem_ebsd/ENTRY/end_time-field
/NXentry/end_time-field
/NXevent_data_em/end_time-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/end_time-field
/NXlab_sample_mounting/ENTRY/end_time-field
/NXmonitor/end_time-field
/NXms/ENTRY/end_time-field
/NXms_score_results/ENTRY/end_time-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/end_time-field
/NXms_score_results/ENTRY/performance/end_time-field
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/NXrefscan/entry/end_time-field
/NXreftof/entry/end_time-field
/NXsas/ENTRY/end_time-field
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/NXsensor_scan/ENTRY/end_time-field
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/NXsnshisto/ENTRY/end_time-field
/NXstxm/ENTRY/end_time-field
/NXsubentry/end_time-field
/NXtomo/entry/end_time-field
/NXtomophase/entry/end_time-field
/NXxpcs/entry/end_time-field
end_time_estimated
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endnote
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energies
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energy
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/NXcxi_ptycho/entry_1/instrument_1/source_1/energy-field
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/NXdirecttof/entry/INSTRUMENT/fermi_chopper/energy-field
/NXdispersion_table/energy-field
/NXfermi_chopper/energy-field
/NXfluo/entry/INSTRUMENT/fluorescence/energy-field
/NXfluo/entry/data/energy-link
/NXindirecttof/entry/INSTRUMENT/analyser/energy-field
/NXinsertion_device/energy-field
/NXmonochromator/energy-field
/NXsource/energy-field
/NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER/energy-field
/NXspe/ENTRY/data/energy-field
/NXstxm/ENTRY/DATA/energy-field
/NXstxm/ENTRY/INSTRUMENT/monochromator/energy-field
/NXxas/ENTRY/DATA/energy-link
/NXxas/ENTRY/INSTRUMENT/monochromator/energy-field
/NXxasproc/ENTRY/DATA/energy-field
energy_calibration
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energy_error
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energy_errors
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energy_identifier
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/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/energy_identifier-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/energy_identifier-field
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energy_interval
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energy_max
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energy_min
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energy_resolution
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/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution-field
/NXmpes/ENTRY/INSTRUMENT/energy_resolution-field
energy_scan_mode
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energy_transfer
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energy_unit
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/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/energy_unit-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/energy_unit-field
energydispersion
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/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group
entering
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entrance_slit
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entrance_slit_setting
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entrance_slit_shape
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entrance_slit_size
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entry
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/NXapm_paraprobe_config_clusterer/ENTRY-group
/NXapm_paraprobe_config_distancer/ENTRY-group
/NXapm_paraprobe_config_intersector/ENTRY-group
/NXapm_paraprobe_config_nanochem/ENTRY-group
/NXapm_paraprobe_config_ranger/ENTRY-group
/NXapm_paraprobe_config_selector/ENTRY-group
/NXapm_paraprobe_config_spatstat/ENTRY-group
/NXapm_paraprobe_config_surfacer/ENTRY-group
/NXapm_paraprobe_config_tessellator/ENTRY-group
/NXapm_paraprobe_config_transcoder/ENTRY-group
/NXapm_paraprobe_results_clusterer/ENTRY-group
/NXapm_paraprobe_results_distancer/ENTRY-group
/NXapm_paraprobe_results_intersector/ENTRY-group
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/NXapm_paraprobe_results_ranger/ENTRY-group
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/NXapm_paraprobe_results_spatstat/ENTRY-group
/NXapm_paraprobe_results_surfacer/ENTRY-group
/NXapm_paraprobe_results_tessellator/ENTRY-group
/NXapm_paraprobe_results_transcoder/ENTRY-group
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/NXarpes/ENTRY-group
/NXcanSAS/ENTRY-group
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/NXem/ENTRY-group
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/NXiv_temp/ENTRY-group
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/NXsnshisto/ENTRY-group
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/NXsqom/ENTRY-group
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entry_1
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entry_identifier_uuid
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environment
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environment_conditions
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eps
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error
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errors
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estimated_field_at_the_apex
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euler
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euler_angle_convention
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evaporation_id_filter
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evaporation_id_included
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even_layer_density
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even_layer_material
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event_data
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event_data_em
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/NXevent_data_em_set/EVENT_DATA_EM-group
event_id
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event_identifier
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event_index
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/NXsnsevent/ENTRY/instrument/DETECTOR/event_index-field
event_pixel_id
/NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_pixel_id-field
event_time_of_flight
/NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_time_of_flight-field
event_time_offset
/NXevent_data/event_time_offset-field
event_time_zero
/NXevent_data/event_time_zero-field
event_type
/NXem/ENTRY/measurement/EVENT_DATA_EM/event_type-field
/NXevent_data_em/event_type-field
evolution
/NXms/ENTRY/ROI_SET/snapshot_set/evolution-group
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/evolution-group
excitation_wavelength
/NXbeam_path/SOURCE/excitation_wavelength-field
exit_slit
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/exit_slit-group
experiment
/NXem_ebsd/ENTRY/experiment-group
experiment_description
/NXapm/ENTRY/experiment_description-field
/NXarchive/entry/experiment_description-field
/NXellipsometry/ENTRY/experiment_description-field
/NXem/ENTRY/experiment_description-field
/NXentry/experiment_description-field
/NXopt/ENTRY/experiment_description-field
/NXsensor_scan/ENTRY/experiment_description-field
/NXsubentry/experiment_description-field
/NXtransmission/ENTRY/experiment_description-field
experiment_documentation
/NXapm/ENTRY/experiment_documentation-group
/NXem/ENTRY/experiment_documentation-group
/NXentry/experiment_documentation-group
/NXsubentry/experiment_documentation-group
experiment_identifier
/NXapm/ENTRY/experiment_identifier-field
/NXarchive/entry/experiment_identifier-field
/NXem/ENTRY/experiment_identifier-field
/NXentry/experiment_identifier-field
/NXopt/ENTRY/experiment_identifier-field
/NXsensor_scan/ENTRY/experiment_identifier-field
/NXsnsevent/ENTRY/experiment_identifier-field
/NXsnshisto/ENTRY/experiment_identifier-field
/NXsubentry/experiment_identifier-field
/NXtransmission/ENTRY/experiment_identifier-field
experiment_or_simulation
/NXms/ENTRY/experiment_or_simulation-field
/NXms_score_results/ENTRY/experiment_or_simulation-field
experiment_type
/NXellipsometry/ENTRY/experiment_type-field
/NXopt/ENTRY/experiment_type-field
experiments
/NXreflections/experiments-field
exposure_time
/NXcorrector_cs/ZEMLIN_TABLEAU/exposure_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/exposure_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/exposure_time-field
extent
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/extent-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/extent-field
/NXbeam/extent-field
/NXcg_grid/extent-field
/NXcxi_ptycho/entry_1/instrument_1/beam_1/extent-field
/NXms_score_results/ENTRY/ROI_SET/grid/extent-field
/NXxpcs/entry/instrument/incident_beam/extent-field
external
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external-group
external_adc
/NXsample/external_ADC-group
external_dac
/NXsample/external_DAC-field
external_field_brief
/NXsensor/external_field_brief-field
external_field_full
/NXsensor/external_field_full-group
external_material
/NXguide/external_material-field
/NXmirror/external_material-field
extinction_ratio
/NXpolarizer_opt/extinction_ratio-field
extractor_current
/NXcollectioncolumn/extractor_current-field
extractor_voltage
/NXcollectioncolumn/extractor_voltage-field
fabrication
/NXaperture_em/FABRICATION-group
/NXapm/ENTRY/atom_probe/FABRICATION-group
/NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION-group
/NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION-group
/NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION-group
/NXapm/ENTRY/atom_probe/getter_pump/FABRICATION-group
/NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION-group
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/FABRICATION-group
/NXapm/ENTRY/atom_probe/pulser/SOURCE/FABRICATION-group
/NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION-group
/NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION-group
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
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/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
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/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
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/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
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/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXchamber/FABRICATION-group
/NXcorrector_cs/FABRICATION-group
/NXcs_cpu/FABRICATION-group
/NXcs_gpu/FABRICATION-group
/NXcs_io_obj/FABRICATION-group
/NXebeam_column/FABRICATION-group
/NXebeam_column/electron_source/FABRICATION-group
/NXem/ENTRY/em_lab/DETECTOR/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/FABRICATION-group
/NXem/ENTRY/em_lab/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_DEFLECTOR/FABRICATION-group
/NXem/ENTRY/em_lab/stage_lab/FABRICATION-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION-group
/NXfresnel_zone_plate/fabrication-field
/NXibeam_column/FABRICATION-group
/NXlens_em/FABRICATION-group
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXpulser_apm/FABRICATION-group
/NXpulser_apm/SOURCE/FABRICATION-group
/NXpump/FABRICATION-group
/NXreflectron/FABRICATION-group
/NXscanbox_em/FABRICATION-group
/NXstage_lab/FABRICATION-group
face_area
/NXcg_hexahedron_set/face_area-field
/NXcg_polyhedron_set/face_area-field
/NXcg_tetrahedron_set/face_area-field
face_half_edge
/NXcg_half_edge_data_structure/face_half_edge-field
face_identifier
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/face_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/face_identifier-field
/NXcg_face_list_data_structure/face_identifier-field
face_identifier_offset
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/face_identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/face_identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron/face_identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_identifier_offset-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/tetrahedra/face_identifier_offset-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/face_identifier_offset-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/face_identifier_offset-field
/NXcg_face_list_data_structure/face_identifier_offset-field
/NXcg_half_edge_data_structure/face_identifier_offset-field
face_normal
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/face_normal-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/face_normal-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_normal-group
/NXcg_hexahedron_set/face_normal-group
/NXcg_parallelogram_set/face_normal-group
/NXcg_polygon_set/face_normal-group
/NXcg_polyhedron_set/face_normal-group
/NXcg_tetrahedron_set/face_normal-group
/NXcg_triangle_set/face_normal-group
face_normals
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron/face_normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron/face_normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID/polyhedron/face_normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/objectID/polyhedron/face_normals-field
faces
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID/polyhedron/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/objectID/polyhedron/faces-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/faces-field
/NXcg_face_list_data_structure/faces-field
/NXoff_geometry/faces-field
faces_are_unique
/NXcg_face_list_data_structure/faces_are_unique-field
facility_user_id
/NXarchive/entry/user/facility_user_id-field
/NXsnsevent/ENTRY/USER/facility_user_id-field
/NXsnshisto/ENTRY/USER/facility_user_id-field
/NXuser/facility_user_id-field
fast_axes
/NXelectronanalyser/fast_axes-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field
fast_pixel_direction
/NXdetector_module/fast_pixel_direction-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction-field
fax_number
/NXuser/fax_number-field
feature
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE-group
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE-group
feature_identifier
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/feature_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/feature_identifier-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/statistics/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/feature_identifier-field
/NXsimilarity_grouping/statistics/feature_identifier-field
feature_member_count
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/statistics/feature_member_count-field
/NXsimilarity_grouping/statistics/feature_member_count-field
feature_mesh
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh-group
feature_type
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/feature_type-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/feature_type-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/feature_type-field
feature_type_dict_keyword
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/feature_type_dict_keyword-field
feature_type_dict_value
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/feature_type_dict_value-field
features
/NXentry/features-field
fermi_chopper
/NXdirecttof/entry/INSTRUMENT/fermi_chopper-group
/NXinstrument/FERMI_CHOPPER-group
/NXsnshisto/ENTRY/instrument/FERMI_CHOPPER-group
/NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER-group
fiber
/NXbeam_path/FIBER-group
field_aperture
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/field_aperture-group
field_of_view
/NXapm/ENTRY/atom_probe/field_of_view-field
/NXoptical_system_em/field_of_view-field
fieldname_errors
/NXdata/FIELDNAME_errors-field
figure_data
/NXgrating/figure_data-group
/NXmirror/figure_data-group
figure_of_merit
/NXspindispersion/figure_of_merit-field
file_name
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/file_name-field
/NXnote/file_name-field
filename
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/NXapm_composition_space_results/ENTRY/iontypes/filename-field
/NXapm_input_ranging/filename-field
/NXapm_input_reconstruction/filename-field
/NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/filename-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/filename-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/ion_to_edge_distances/filename-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes/filename-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/filename-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes/filename-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/filename-field
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/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/filename-field
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/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes/filename-field
/NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/dataset/filename-field
/NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/iontypes/filename-field
/NXms_score_config/ENTRY/initial_microstructure/ebsd/filename-field
filenames
/NXiqproc/ENTRY/reduction/input/filenames-field
/NXsqom/ENTRY/reduction/input/filenames-field
filter
/NXinstrument/FILTER-group
filter_number
/NXbeam_path/filter_NUMBER-group
final_beam_divergence
/NXbeam/final_beam_divergence-field
final_energy
/NXbeam/final_energy-field
final_polarization
/NXbeam/final_polarization-field
final_polarization_stokes
/NXbeam/final_polarization_stokes-field
final_wavelength
/NXbeam/final_wavelength-field
final_wavelength_spread
/NXbeam/final_wavelength_spread-field
firmware
/NXopt/ENTRY/INSTRUMENT/firmware-group
fit_function
/NXcalibration/fit_function-field
fixed_energy
/NXspe/ENTRY/NXSPE_info/fixed_energy-field
fixed_revolutions
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/rotating_element/fixed_revolutions-field
fixed_slit
/NXbeam_path/MONOCHROMATOR/SLIT/fixed_slit-field
flags
/NXreflections/flags-field
flatfield
/NXdetector/flatfield-field
/NXdetector_channel/flatfield-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield-field
flatfield_applied
/NXdetector/flatfield_applied-field
/NXdetector_channel/flatfield_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_applied-field
flatfield_error
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_error-field
flatfield_errors
/NXdetector/flatfield_errors-field
/NXdetector_channel/flatfield_errors-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_errors-field
flight_path_length
/NXapm/ENTRY/atom_probe/flight_path_length-field
flip_current
/NXflipper/flip_current-field
flip_turns
/NXflipper/flip_turns-field
flipper
/NXinstrument/FLIPPER-group
fluorescence
/NXfluo/entry/INSTRUMENT/fluorescence-group
flux
/NXbeam/flux-field
/NXmx/ENTRY/INSTRUMENT/BEAM/flux-field
/NXsource/flux-field
flux_integrated
/NXmx/ENTRY/INSTRUMENT/BEAM/flux_integrated-field
flyback_time
/NXscanbox_em/flyback_time-field
focal_length
/NXlens_opt/focal_length-field
focal_size
/NXcapillary/focal_size-field
focus_parameters
/NXfresnel_zone_plate/focus_parameters-field
focus_type
/NXxraylens/focus_type-field
focussing_probes
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/focussing_probes-group
force
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force-field
force_control
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force_control-field
formula
/NXdispersion_function/formula-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/formula-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/formula-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/formula-field
frame_average
/NXxpcs/entry/data/frame_average-field
frame_start_number
/NXdetector/frame_start_number-field
/NXxbase/entry/instrument/detector/frame_start_number-field
frame_sum
/NXxpcs/entry/data/frame_sum-field
frame_time
/NXdetector/frame_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/frame_time-field
/NXxpcs/entry/instrument/DETECTOR/frame_time-field
frequency
/NXcollimator/frequency-field
/NXsnsevent/ENTRY/instrument/SNS/frequency-field
/NXsnshisto/ENTRY/instrument/SNS/frequency-field
/NXsource/frequency-field
frequency_log
/NXcollimator/frequency_log-group
frequency_resolution
/NXbeam_path/DISK_CHOPPER/frequency_resolution-field
g2
/NXxpcs/entry/data/g2-field
g2_derr
/NXxpcs/entry/data/g2_derr-field
g2_err_from_two_time_corr_func
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func-field
g2_err_from_two_time_corr_func_partials
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func_partials-field
g2_from_two_time_corr_func
/NXxpcs/entry/twotime/g2_from_two_time_corr_func-field
g2_from_two_time_corr_func_partials
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials-field
g2_unnormalized
/NXxpcs/entry/data/G2_unnormalized-field
gain
/NXcapillary/gain-group
/NXtransmission/ENTRY/instrument/DETECTOR/gain-field
gain_setting
/NXdetector/gain_setting-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/gain_setting-field
gap
/NXinsertion_device/gap-field
gas
/NXxraylens/gas-field
gas_pressure
/NXdetector/gas_pressure-field
/NXmpes/ENTRY/SAMPLE/gas_pressure-field
/NXxraylens/gas_pressure-field
gbcd
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/gbcd-group
geometry
/NXaperture/GEOMETRY-group
/NXbeam_path/ATTENUATOR/GEOMETRY-group
/NXbeam_stop/GEOMETRY-group
/NXbending_magnet/GEOMETRY-group
/NXcollimator/GEOMETRY-group
/NXcrystal/GEOMETRY-group
/NXcsg/geometry-field
/NXdetector/GEOMETRY-group
/NXdisk_chopper/GEOMETRY-group
/NXfermi_chopper/GEOMETRY-group
/NXfilter/GEOMETRY-group
/NXguide/GEOMETRY-group
/NXinsertion_device/GEOMETRY-group
/NXmirror/GEOMETRY-group
/NXmoderator/GEOMETRY-group
/NXmonitor/GEOMETRY-group
/NXmonochromator/geometry-group
/NXms_feature_set/interfaces/geometry-group
/NXms_feature_set/lines/geometry-group
/NXms_feature_set/points/geometry-group
/NXms_feature_set/volumes/geometry-group
/NXorientation/GEOMETRY-group
/NXsample/geometry-group
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY-group
/NXsastof/ENTRY/instrument/collimator/geometry-group
/NXsensor/geometry-group
/NXsource/geometry-group
/NXtranslation/geometry-group
/NXvelocity_selector/geometry-group
geometry_1
/NXcxi_ptycho/sample_1/geometry_1-group
getter_pump
/NXapm/ENTRY/atom_probe/getter_pump-group
gnomonic_projection_reference_frame
/NXem_ebsd/ENTRY/conventions/gnomonic_projection_reference_frame-group
/NXem_ebsd_conventions/gnomonic_projection_reference_frame-group
gradient_guide_magnitude
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_normal/gradient_guide_magnitude-field
gradient_guide_projection
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_normal/gradient_guide_projection-field
grain_boundary_mobility_model
/NXms_score_config/ENTRY/grain_boundary_mobility_model-group
grain_diameter
/NXapm/ENTRY/sample/grain_diameter-field
/NXms_score_config/ENTRY/initial_microstructure/grain_diameter-field
grain_diameter_error
/NXapm/ENTRY/sample/grain_diameter_error-field
grain_ensemble
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grain_ensemble-group
grain_euler
/NXms_score_config/ENTRY/initial_microstructure/grain_euler-field
grain_identifier
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grid/grain_identifier-field
grain_size
/NXms_score_config/ENTRY/initial_microstructure/grain_size-field
grain_size_distribution
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grain_size_distribution-group
grating
/NXbeam_path/GRATING-group
/NXbeam_path/MONOCHROMATOR/GRATING-group
/NXmonochromator/GRATING-group
/NXtransmission/ENTRY/instrument/spectrometer/GRATING-group
grating_wavelength_max
/NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_max-field
grating_wavelength_min
/NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_min-field
grid
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid-group
/NXcg_marching_cubes/grid-group
/NXdelocalization/grid-field
/NXisocontour/grid-group
/NXms/ENTRY/ROI_SET/grid-group
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grid-group
/NXms_score_results/ENTRY/ROI_SET/grid-group
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grid-group
gridresolutions
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/gridresolutions-field
grinding_machine
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine-group
grinding_step
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP-group
grooves
/NXbeam_path/GRATING/grooves-field
group_index
/NXdetector_group/group_index-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_index-field
group_name_iontypes
/NXapm_input_ranging/group_name_iontypes-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/check_existent_ranging/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes/group_name_iontypes-field
group_names
/NXdetector_group/group_names-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_names-field
group_parent
/NXdetector_group/group_parent-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_parent-field
group_type
/NXdetector_group/group_type-field
groupname_geometry_prefix
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/groupname_geometry_prefix-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/groupname_geometry_prefix-field
guide
/NXinstrument/GUIDE-group
guide_current
/NXflipper/guide_current-field
guide_turns
/NXflipper/guide_turns-field
h
/NXreflections/h-field
hagb_enthalpy
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/hagb_enthalpy-field
/NXms_score_config/ENTRY/grain_boundary_mobility_model/sebald_gottstein_parameters/hagb_enthalpy-field
hagb_pre_factor
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/hagb_pre_factor-field
/NXms_score_config/ENTRY/grain_boundary_mobility_model/sebald_gottstein_parameters/hagb_pre_factor-field
half_axes_radii
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXcg_ellipsoid_set/half_axes_radii-field
half_axes_radius
/NXcg_ellipsoid_set/half_axes_radius-field
half_edge_identifier_offset
/NXcg_half_edge_data_structure/half_edge_identifier_offset-field
half_edge_incident_face
/NXcg_half_edge_data_structure/half_edge_incident_face-field
half_edge_next
/NXcg_half_edge_data_structure/half_edge_next-field
half_edge_prev
/NXcg_half_edge_data_structure/half_edge_prev-field
half_edge_twin
/NXcg_half_edge_data_structure/half_edge_twin-field
half_edge_vertex_origin
/NXcg_half_edge_data_structure/half_edge_vertex_origin-field
halo_region
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front/halo_region-field
harmonic
/NXinsertion_device/harmonic-field
has_cell_edge_detection
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_edge_detection-field
has_cell_geometry
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_geometry-field
has_cell_neighbors
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_neighbors-field
has_cell_volume
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_volume-field
has_closure
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/has_closure-field
has_current_to_next_links
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/has_current_to_next_links-field
has_exterior_facets
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/has_exterior_facets-field
has_interior_tetrahedra
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/has_interior_tetrahedra-field
has_next_to_current_links
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/has_next_to_current_links-field
has_object
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object-field
has_object_auto_proxigram
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_auto_proxigram-field
has_object_auto_proxigram_edge_contact
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_auto_proxigram_edge_contact-field
has_object_edge_contact
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_edge_contact-field
has_object_geometry
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_geometry-field
has_object_ions
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_ions-field
has_object_obb
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_obb-field
has_object_properties
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_properties-field
has_proxy
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy-field
has_proxy_edge_contact
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_edge_contact-field
has_proxy_geometry
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_geometry-field
has_proxy_ions
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_ions-field
has_proxy_obb
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_obb-field
has_proxy_properties
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_properties-field
has_scalar_fields
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/has_scalar_fields-field
has_triangle_soup
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_triangle_soup-field
hdbscan
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hdbscan-group
heat_treatment_quenching_rate
/NXapm/ENTRY/sample/heat_treatment_quenching_rate-field
heat_treatment_quenching_rate_error
/NXapm/ENTRY/sample/heat_treatment_quenching_rate_error-field
heat_treatment_temperature
/NXapm/ENTRY/sample/heat_treatment_temperature-field
heat_treatment_temperature_error
/NXapm/ENTRY/sample/heat_treatment_temperature_error-field
heater_power
/NXmanipulator/heater_power-field
height
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
/NXcg_cylinder_set/height-field
/NXcg_hexahedron_set/height-field
/NXfermi_chopper/height-field
/NXvelocity_selector/height-field
hexahedra
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/hexahedra-group
/NXcg_hexahedron_set/hexahedra-group
hexahedron
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron-group
/NXcg_hexahedron_set/hexahedron-group
hexahedron_half_edge
/NXcg_hexahedron_set/hexahedron_half_edge-group
high_throughput_method
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dbscan/high_throughput_method-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hdbscan/high_throughput_method-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/optics/high_throughput_method-field
high_trip_value
/NXsensor/high_trip_value-field
histogram_min_incr_max
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/statistics/knn/histogram_min_incr_max-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/statistics/rdf/histogram_min_incr_max-field
hit_multiplicity
/NXapm/ENTRY/atom_probe/hit_multiplicity-group
/NXapm/ENTRY/atom_probe/hit_multiplicity/hit_multiplicity-field
hit_multiplicity_filter
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hit_multiplicity_filter-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/hit_multiplicity_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/hit_multiplicity_filter-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/hit_multiplicity_filter-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/hit_multiplicity_filter-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/hit_multiplicity_filter-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/hit_multiplicity_filter-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/hit_multiplicity_filter-group
hit_positions
/NXapm/ENTRY/atom_probe/ion_impact_positions/hit_positions-field
hit_quality_filtering
/NXapm/ENTRY/atom_probe/hit_quality_filtering-group
hit_rate
/NXem_ebsd/ENTRY/experiment/indexing/hit_rate-field
holder
/NXsnsevent/ENTRY/sample/holder-field
/NXsnshisto/ENTRY/sample/holder-field
i
/NXcanSAS/ENTRY/DATA/I-field
ibeam_column
/NXem/ENTRY/em_lab/IBEAM_COLUMN-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN-group
ibeam_deflector
/NXem/ENTRY/em_lab/IBEAM_DEFLECTOR-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/ibeam_deflector-group
id
/NXreflections/id-field
identifier
/NXapm/ENTRY/atom_probe/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/getter_pump/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/FABRICATION/identifier-field
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incident_energy
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incident_wavelength_spectrum
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independent_controllers
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index_of_refraction_coating
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initial_cell_cache
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instrument_calibration
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instrument_name
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int_prf
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int_prf_errors
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int_prf_var
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int_sum
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int_sum_errors
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int_sum_var
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integral_log
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integration_radius
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intensity
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interaction_vol_em
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interface_model
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interfaces
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interfacial_excess
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interior_angle
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interior_atmosphere
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interior_cells
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interior_tetrahedra
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intersection_detection_method
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intersection_volume
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ion
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/NXapm/ENTRY/sample/CHEMICAL_COMPOSITION/ION-group
/NXapm_composition_space_results/ENTRY/voxelization/ION-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/composition/ION-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/composition/ION-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/composition/ION-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/composition/ION-group
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/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION-group
/NXchemical_composition/ION-group
/NXspectrum_set_em_xray/indexing/PEAK/ION-group
ion_detector
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ion_energy_profile
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ion_filtering
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ion_identifier
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron/ion_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron/ion_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID/polyhedron/ion_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/objectID/polyhedron/ion_identifier-field
ion_impact_positions
/NXapm/ENTRY/atom_probe/ion_impact_positions-group
ion_multiplicity
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ion_query_isotope_vector
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ion_query_isotope_vector_source
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ion_query_isotope_vector_target
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ion_query_type_source
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ion_query_type_target
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_query_type_target-field
ion_source
/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_source-group
/NXibeam_column/ion_source-group
ion_to_edge_distances
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/ion_to_edge_distances-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_edge_distances-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/ion_to_edge_distances-group
ion_to_feature_distances
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_feature_distances-group
ion_type
/NXion/ion_type-field
ion_type_filter
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/ion_type_filter-field
iontype_filter
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontype_filter-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontype_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontype_filter-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontype_filter-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/iontype_filter-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontype_filter-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontype_filter-group
iontypes
/NXapm_composition_space_results/ENTRY/iontypes-group
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/check_existent_ranging/iontypes-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontypes-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/iontypes-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes-field
iontypes_randomized
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/iontypes_randomized-field
ipf_rgb_color_model
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model-group
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model-group
ipf_rgb_map
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map-group
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map-group
is_a
/NXgraph_edge_set/is_a-field
/NXgraph_node_set/is_a-field
is_axis_aligned
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/is_axis_aligned-field
/NXcg_hexahedron_set/is_axis_aligned-field
/NXcg_parallelogram_set/is_axis_aligned-field
is_box
/NXcg_hexahedron_set/is_box-field
is_centrosymmetric
/NXem_ebsd_crystal_structure_model/is_centrosymmetric-field
is_chiral
/NXem_ebsd_crystal_structure_model/is_chiral-field
is_closed
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/NXcg_polyline_set/is_closed-field
/NXcg_sphere_set/is_closed-field
is_core
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is_cylindrical
/NXcrystal/is_cylindrical-field
is_deformed
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is_noise
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is_polycrystalline
/NXapm/ENTRY/specimen/is_polycrystalline-field
is_recrystallized
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is_specific
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is_watertight
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iso_surface
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iso_surface_analysis
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isosurfacing
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isotope
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isotope_matrix
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isotope_vector
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/isotope_vector-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/composition/ION/isotope_vector-field
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/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/check_existent_ranging/charged_ION/isotope_vector-field
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/isotope_vector-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/probe/isotope_vector-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_source/probe/isotope_vector-field
/NXion/isotope_vector-field
isotope_vector_matrix
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isotope_whitelist
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/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/isotope_whitelist-field
/NXdelocalization/isotope_whitelist-field
isotopic_decomposition_rule
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isovalue
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/NXisocontour/isovalue-field
iteration
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/iteration-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/iteration-field
/NXms_snapshot/iteration-field
iupac_line_names
/NXspectrum_set_em_xray/indexing/PEAK/ION/iupac_line_names-field
job_pyiron_identifier
/NXapm_composition_space_results/ENTRY/job_pyiron_identifier-field
jones_quality_factor
/NXopt/ENTRY/derived_parameters/Jones_quality_factor-field
k
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/NXreflections/k-field
k_d_value
/NXpid/K_d_value-field
k_i_value
/NXpid/K_i_value-field
k_p_value
/NXpid/K_p_value-field
kappa
/NXxkappa/entry/name/kappa-link
/NXxkappa/entry/sample/kappa-field
kernel_mu
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/kernel_mu-field
kernel_sigma
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/kernel_sigma-field
kernel_size
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/kernel_size-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/kernel_size-field
kernel_variance
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/kernel_variance-field
ki_over_kf_scaling
/NXspe/ENTRY/NXSPE_info/ki_over_kf_scaling-field
kikuchi
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi-group
kinetics
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/evolution/kinetics-group
knn
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/statistics/knn-group
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/knn-group
l
/NXreflections/l-field
label
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PEAK/label-field
/NXgraph_edge_set/label-field
/NXgraph_node_set/label-field
/NXpeak/label-field
lagb_enthalpy
/NXms_score_config/ENTRY/grain_boundary_mobility_model/sebald_gottstein_parameters/lagb_enthalpy-field
lagb_pre_factor
/NXms_score_config/ENTRY/grain_boundary_mobility_model/sebald_gottstein_parameters/lagb_pre_factor-field
lagb_to_hagb_cut
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/lagb_to_hagb_cut-field
lagb_to_hagb_exponent
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/lagb_to_hagb_exponent-field
lagb_to_hagb_transition
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/lagb_to_hagb_transition-field
lambda
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/lambda-field
last_fill
/NXsource/last_fill-field
last_process
/NXcalibration/last_process-field
/NXdistortion/last_process-field
/NXregistration/last_process-field
lateral_surface_area
/NXcg_cylinder_set/lateral_surface_area-field
lattice_type
/NXslip_system_set/lattice_type-field
laue_group
/NXem_ebsd_crystal_structure_model/laue_group-field
layer_structure
/NXopt/ENTRY/SAMPLE/layer_structure-field
layer_thickness
/NXgrating/layer_thickness-field
/NXmirror/layer_thickness-field
layout
/NXdetector/layout-field
length
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/length-field
/NXcg_hexahedron_set/length-field
/NXcg_parallelogram_set/length-field
/NXcg_polyline_set/length-field
/NXfiber/length-field
/NXinsertion_device/length-field
/NXvelocity_selector/length-field
lens_diameter
/NXlens_opt/lens_diameter-field
lens_em
/NXcollectioncolumn/LENS_EM-group
/NXcorrector_cs/LENS_EM-group
/NXebeam_column/LENS_EM-group
/NXelectronanalyser/LENS_EM-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/LENS_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/LENS_EM-group
/NXenergydispersion/LENS_EM-group
/NXibeam_column/LENS_EM-group
/NXspindispersion/LENS_EM-group
lens_geometry
/NXxraylens/lens_geometry-field
lens_length
/NXxraylens/lens_length-field
lens_material
/NXxraylens/lens_material-field
lens_mode
/NXarpes/ENTRY/INSTRUMENT/analyser/lens_mode-field
lens_opt
/NXbeam_path/LENS_OPT-group
lens_thickness
/NXxraylens/lens_thickness-field
lifespan
/NXbeam_path/SOURCE/lifespan-field
light_source
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/light_source-group
line_time
/NXscanbox_em/line_time-field
linear_range_min_incr_max
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/evaporation_id_filter/linear_range_min_incr_max-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/evaporation_id_filter/linear_range_min_incr_max-field
/NXsubsampling_filter/linear_range_min_incr_max-field
lines
/NXms_feature_set/lines-group
load_lock_chamber
/NXapm/ENTRY/atom_probe/control_software/load_lock_chamber-group
/NXapm/ENTRY/atom_probe/load_lock_chamber-group
local_electrode
/NXapm/ENTRY/atom_probe/local_electrode-group
local_name
/NXdetector/local_name-field
/NXem/ENTRY/em_lab/DETECTOR/local_name-field
location
/NXapm/ENTRY/atom_probe/location-field
/NXem/ENTRY/em_lab/location-field
log
/NXsnsevent/ENTRY/DASlogs/LOG-group
/NXsnshisto/ENTRY/DASlogs/LOG-group
low_trip_value
/NXsensor/low_trip_value-field
lower_cap_radius
/NXcg_cylinder_set/lower_cap_radius-field
lp
/NXreflections/lp-field
lubricant
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/lubricant-field
m_value
/NXfilter/m_value-field
/NXguide/m_value-field
/NXmirror/m_value-field
magnetic_field
/NXarchive/entry/sample/magnetic_field-field
/NXbending_magnet/magnetic_field-field
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/magnetic_field-group
/NXms/ENTRY/ROI_SET/snapshot_set/evolution/magnetic_field-group
/NXsample/magnetic_field-field
/NXsample/magnetic_field-group
magnetic_field_env
/NXsample/magnetic_field_env-group
magnetic_field_log
/NXsample/magnetic_field_log-group
magnetic_wavelength
/NXinsertion_device/magnetic_wavelength-field
magnification
/NXcollectioncolumn/magnification-field
/NXcorrector_cs/ZEMLIN_TABLEAU/magnification-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/magnification-field
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/magnification-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/magnification-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/magnification-field
/NXoptical_system_em/magnification-field
magnitude
/NXaberration/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/magnitude-field
manipulator
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR-group
manufacturer
/NXcapillary/manufacturer-field
/NXtransmission/ENTRY/instrument/manufacturer-group
manufacturer_model
/NXdeflector/manufacturer_model-field
manufacturer_name
/NXapm/ENTRY/atom_probe/ion_detector/manufacturer_name-field
/NXdeflector/manufacturer_name-field
/NXlens_em/manufacturer_name-field
marching_cubes
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/marching_cubes-group
mark
/NXdelocalization/mark-field
mask
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/sign_valid/mask-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window/mask-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window_triangles/mask-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/window/mask-field
/NXapm_paraprobe_results_selector/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/window/mask-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_bottom/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_front/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_global/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_left/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_rear/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_right/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_top/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/window/mask-field
/NXcs_filter_boolean_mask/mask-field
mask_material
/NXfresnel_zone_plate/mask_material-field
mask_thickness
/NXfresnel_zone_plate/mask_thickness-field
masks
/NXxpcs/entry/instrument/masks-group
mass
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/mass-field
/NXsample/mass-field
/NXsample_component/mass-field
mass_spectrum
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum-group
mass_to_charge
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
mass_to_charge_conversion
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion-group
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/mass_to_charge_conversion-group
mass_to_charge_distribution
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution-group
mass_to_charge_interval
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/mass_to_charge_interval-field
mass_to_charge_range
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/ION/mass_to_charge_range-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/check_existent_ranging/charged_ION/mass_to_charge_range-field
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field
/NXion/mass_to_charge_range-field
mass_to_charge_state_ratio
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/mass_to_charge_state_ratio-field
mass_vector
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/charge_model/mass_vector-field
match
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/patch_identifier_filter/match-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter/match-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/hit_multiplicity_filter/match-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontype_filter/match-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/hit_multiplicity_filter/match-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontype_filter/match-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/atomic_decomposition_rule/match-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/isotopic_decomposition_rule/match-field
/NXmatch_filter/match-field
material
/NXaperture/material-field
/NXbeam_path/window_NUMBER/material-field
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/material-field
material_phase
/NXdispersive_material/ENTRY/sample/material_phase-field
material_phase_comment
/NXdispersive_material/ENTRY/sample/material_phase_comment-field
material_properties
/NXms_score_config/ENTRY/material_properties-group
max_delta_x
/NXms_score_config/ENTRY/numerics/max_delta_x-field
max_eps
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/optics/max_eps-field
max_frequency
/NXbeam_path/DISK_CHOPPER/max_frequency-field
max_gap
/NXbeam_path/MONOCHROMATOR/SLIT/max_gap-field
max_iteration
/NXms_score_config/ENTRY/stop_criteria/max_iteration-field
max_physical_capacity
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXcs_io_obj/max_physical_capacity-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
max_resident_memory_snapshot
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXcs_profiling_event/max_resident_memory_snapshot-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
max_revolutions
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/rotating_element/max_revolutions-field
max_time
/NXms_score_config/ENTRY/stop_criteria/max_time-field
max_virtual_memory_snapshot
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXcs_profiling_event/max_virtual_memory_snapshot-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
max_x
/NXms_score_config/ENTRY/stop_criteria/max_x-field
maximum_charge
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/maximum_charge-field
maximum_incident_angle
/NXcapillary/maximum_incident_angle-field
maximum_number_of_atoms_per_molecular_ion
/NXapm/ENTRY/atom_probe/ranging/maximum_number_of_atoms_per_molecular_ion-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/maximum_number_of_atoms_per_molecular_ion-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/check_existent_ranging/maximum_number_of_atoms_per_molecular_ion-field
maximum_number_of_isotopes
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/maximum_number_of_isotopes-field
maximum_value
/NXlog/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/maximum_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/maximum_value-field
measure_time
/NXbeam_path/SOURCE/measure_time-field
measured_data
/NXopt/ENTRY/data_collection/measured_data-field
/NXtransmission/ENTRY/instrument/measured_data-field
measured_data_errors
/NXopt/ENTRY/data_collection/measured_data_errors-field
measurement
/NXem/ENTRY/measurement-group
/NXsensor/measurement-field
measurement_sensors
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/measurement_sensors-field
medium
/NXopt/ENTRY/INSTRUMENT/sample_stage/environment_conditions/medium-field
medium_refractive_indices
/NXopt/ENTRY/INSTRUMENT/sample_stage/environment_conditions/medium_refractive_indices-field
melting_temperature
/NXms_score_config/ENTRY/material_properties/melting_temperature-field
mesh_curr_post_dcom_step
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP-group
mesh_curr_pre_dcom_step
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP-group
method
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/patch_identifier_filter/method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter/method-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/hit_multiplicity_filter/method-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontype_filter/method-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/hit_multiplicity_filter/method-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontype_filter/method-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/method-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/atomic_decomposition_rule/method-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/isotopic_decomposition_rule/method-field
/NXem/ENTRY/sample/method-field
/NXem_ebsd/ENTRY/experiment/indexing/method-field
/NXmatch_filter/method-field
miller_direction
/NXslip_system_set/miller_direction-field
miller_plane
/NXslip_system_set/miller_plane-field
min_abundance_product
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/charge_model/min_abundance_product-field
min_cluster_size
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hdbscan/min_cluster_size-field
min_frequency
/NXbeam_path/DISK_CHOPPER/min_frequency-field
min_half_life
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/charge_model/min_half_life-field
min_pts
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dbscan/min_pts-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/optics/min_pts-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/min_pts-field
min_samples
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hdbscan/min_samples-field
minimum_value
/NXlog/minimum_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/minimum_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/minimum_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/minimum_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/minimum_value-field
mirror
/NXbeam_path/MIRROR-group
/NXinstrument/MIRROR-group
mobility_weight
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front/mobility_weight-field
mode
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/mode-field
/NXcg_alpha_complex/mode-field
/NXcollectioncolumn/mode-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/PROCESS/mode-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/mode-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/PROCESS/mode-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/PROCESS/mode-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/PROCESS/mode-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/PROCESS/mode-field
/NXfluo/entry/MONITOR/mode-field
/NXimage_set/PROCESS/mode-field
/NXlauetof/entry/control/mode-field
/NXmonitor/mode-field
/NXmonopd/entry/MONITOR/mode-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/mode-field
/NXrefscan/entry/control/mode-field
/NXreftof/entry/control/mode-field
/NXsas/ENTRY/MONITOR/mode-field
/NXsastof/ENTRY/control/mode-field
/NXsnsevent/ENTRY/MONITOR/mode-field
/NXsnshisto/ENTRY/MONITOR/mode-field
/NXsource/mode-field
/NXspectrum_set/PROCESS/mode-field
/NXtas/entry/MONITOR/mode-field
/NXtofnpd/entry/MONITOR/mode-field
/NXtofraw/entry/MONITOR/mode-field
/NXtofsingle/entry/MONITOR/mode-field
/NXxas/ENTRY/DATA/mode-field
/NXxas/ENTRY/MONITOR/mode-field
/NXxbase/entry/control/mode-field
model
/NXaberration_model/model-field
/NXaberration_model_ceos/model-field
/NXaberration_model_nion/model-field
/NXapm/ENTRY/atom_probe/FABRICATION/model-field
/NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION/model-field
/NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION/model-field
/NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION/model-field
/NXapm/ENTRY/atom_probe/getter_pump/FABRICATION/model-field
/NXapm/ENTRY/atom_probe/ion_detector/model-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION/model-field
/NXapm/ENTRY/atom_probe/pulser/SOURCE/FABRICATION/model-field
/NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION/model-field
/NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION/model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/FABRICATION/model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/FABRICATION/model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/FABRICATION/model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION/model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/FABRICATION/model-field
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/FABRICATION/model-field
/NXem/ENTRY/em_lab/FABRICATION/model-field