NeXus NXDL vocabulary

Anchors for all NeXus fields, groups, attributes, and links

NXDL Vocabulary

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@auxiliary_signals
/NXdata@auxiliary_signals-attribute
@axes
/NXcxi_ptycho/DATA@axes-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@axes-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1@axes-attribute
/NXdata/DATA@axes-attribute
/NXdata@axes-attribute
/NXdetector/efficiency@axes-attribute
/NXellipsometry/ENTRY/plot@axes-attribute
/NXguide/reflectivity@axes-attribute
@axis
/NXdata/AXISNAME@axis-attribute
/NXdetector/time_of_flight@axis-attribute
/NXdetector/x_pixel_offset@axis-attribute
/NXdetector/y_pixel_offset@axis-attribute
/NXdetector/z_pixel_offset@axis-attribute
@axisname_indices
/NXdata@AXISNAME_indices-attribute
@baseline_reference
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@baseline_reference-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute
/NXxpcs/entry/twotime/two_time_corr_func@baseline_reference-attribute
@cansas_class
/NXcanSAS/ENTRY/COLLECTION@canSAS_class-attribute
/NXcanSAS/ENTRY/DATA@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT@canSAS_class-attribute
/NXcanSAS/ENTRY/PROCESS/COLLECTION@canSAS_class-attribute
/NXcanSAS/ENTRY/PROCESS@canSAS_class-attribute
/NXcanSAS/ENTRY/SAMPLE@canSAS_class-attribute
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@canSAS_class-attribute
/NXcanSAS/ENTRY@canSAS_class-attribute
@check_sum
/NXdetector/data@check_sum-attribute
@comment
/NXentry/revision@comment-attribute
/NXsubentry/revision@comment-attribute
@configuration
/NXentry/program_name@configuration-attribute
/NXsubentry/program_name@configuration-attribute
@creator
/NXroot@creator-attribute
@creator_version
/NXroot@creator_version-attribute
@default
/NXaperture@default-attribute
/NXattenuator@default-attribute
/NXbeam@default-attribute
/NXbeam_stop@default-attribute
/NXbending_magnet@default-attribute
/NXcanSAS/ENTRY@default-attribute
/NXcapillary@default-attribute
/NXcite@default-attribute
/NXcollimator@default-attribute
/NXcrystal@default-attribute
/NXcylindrical_geometry@default-attribute
/NXdetector@default-attribute
/NXdetector_group@default-attribute
/NXdetector_module@default-attribute
/NXdisk_chopper@default-attribute
/NXentry@default-attribute
/NXevent_data@default-attribute
/NXfermi_chopper@default-attribute
/NXfilter@default-attribute
/NXflipper@default-attribute
/NXfresnel_zone_plate@default-attribute
/NXgeometry@default-attribute
/NXgrating@default-attribute
/NXguide@default-attribute
/NXinsertion_device@default-attribute
/NXinstrument@default-attribute
/NXlog@default-attribute
/NXmirror@default-attribute
/NXmoderator@default-attribute
/NXmonitor@default-attribute
/NXmonochromator@default-attribute
/NXnote@default-attribute
/NXoff_geometry@default-attribute
/NXorientation@default-attribute
/NXparameters@default-attribute
/NXpinhole@default-attribute
/NXpolarizer@default-attribute
/NXpositioner@default-attribute
/NXprocess@default-attribute
/NXreflections@default-attribute
/NXroot@default-attribute
/NXsample@default-attribute
/NXsample_component@default-attribute
/NXsensor@default-attribute
/NXshape@default-attribute
/NXslit@default-attribute
/NXsource@default-attribute
/NXsubentry@default-attribute
/NXtransformations@default-attribute
/NXtranslation@default-attribute
/NXuser@default-attribute
/NXvelocity_selector@default-attribute
/NXxraylens@default-attribute
@depends_on
/NXbeam/TRANSFORMATIONS/DIRECTION@depends_on-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@depends_on-attribute
/NXdetector_module/fast_pixel_direction@depends_on-attribute
/NXdetector_module/module_offset@depends_on-attribute
/NXdetector_module/slow_pixel_direction@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@depends_on-attribute
/NXtransformations/AXISNAME@depends_on-attribute
@description
/NXelectrostatic_kicker/timing@description-attribute
/NXmagnetic_kicker/timing@description-attribute
/NXreflections/background_mean@description-attribute
/NXreflections/bounding_box@description-attribute
/NXreflections/d@description-attribute
/NXreflections/det_module@description-attribute
/NXreflections/entering@description-attribute
/NXreflections/flags@description-attribute
/NXreflections/h@description-attribute
/NXreflections/id@description-attribute
/NXreflections/int_prf@description-attribute
/NXreflections/int_prf_errors@description-attribute
/NXreflections/int_prf_var@description-attribute
/NXreflections/int_sum@description-attribute
/NXreflections/int_sum_errors@description-attribute
/NXreflections/int_sum_var@description-attribute
/NXreflections/k@description-attribute
/NXreflections/l@description-attribute
/NXreflections/lp@description-attribute
/NXreflections/observed_frame@description-attribute
/NXreflections/observed_frame_errors@description-attribute
/NXreflections/observed_frame_var@description-attribute
/NXreflections/observed_phi@description-attribute
/NXreflections/observed_phi_errors@description-attribute
/NXreflections/observed_phi_var@description-attribute
/NXreflections/observed_px_x@description-attribute
/NXreflections/observed_px_x_errors@description-attribute
/NXreflections/observed_px_x_var@description-attribute
/NXreflections/observed_px_y@description-attribute
/NXreflections/observed_px_y_errors@description-attribute
/NXreflections/observed_px_y_var@description-attribute
/NXreflections/observed_x@description-attribute
/NXreflections/observed_x_errors@description-attribute
/NXreflections/observed_x_var@description-attribute
/NXreflections/observed_y@description-attribute
/NXreflections/observed_y_errors@description-attribute
/NXreflections/observed_y_var@description-attribute
/NXreflections/overlaps@description-attribute
/NXreflections/partiality@description-attribute
/NXreflections/polar_angle@description-attribute
/NXreflections/predicted_frame@description-attribute
/NXreflections/predicted_phi@description-attribute
/NXreflections/predicted_px_x@description-attribute
/NXreflections/predicted_px_y@description-attribute
/NXreflections/predicted_x@description-attribute
/NXreflections/predicted_y@description-attribute
/NXreflections/prf_cc@description-attribute
/NXreflections/reflection_id@description-attribute
/NXreflections@description-attribute
@direction
/NXsample/electric_field@direction-attribute
/NXsample/magnetic_field@direction-attribute
/NXsample/stress_field@direction-attribute
@distribution
/NXdata/AXISNAME@distribution-attribute
@entry
/NXarpes/ENTRY@entry-attribute
/NXiqproc/ENTRY@entry-attribute
/NXsastof/ENTRY@entry-attribute
/NXsqom/ENTRY@entry-attribute
/NXxas/ENTRY@entry-attribute
/NXxasproc/ENTRY@entry-attribute
@equipment_component
/NXtransformations/AXISNAME@equipment_component-attribute
@file_name
/NXroot@file_name-attribute
@file_time
/NXroot@file_time-attribute
@file_update_time
/NXroot@file_update_time-attribute
@first_good
/NXdata/AXISNAME@first_good-attribute
@first_point_for_fit
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
@flux
/NXmx/ENTRY/INSTRUMENT/BEAM@flux-attribute
@frequency
/NXdetector/raw_time_of_flight@frequency-attribute
@h5py_version
/NXroot@h5py_version-attribute
@hdf5_version
/NXroot@HDF5_Version-attribute
@hdf_version
/NXroot@HDF_version-attribute
@i_axes
/NXcanSAS/ENTRY/DATA@I_axes-attribute
@idf_version
/NXentry@IDF_Version-attribute
/NXsubentry@IDF_Version-attribute
@index
/NXarchive/entry@index-attribute
@interpretation
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@interpretation-attribute
@last_good
/NXdata/AXISNAME@last_good-attribute
@local_name
/NXdetector/crate@local_name-attribute
/NXdetector/input@local_name-attribute
/NXdetector/slot@local_name-attribute
@long_name
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA@long_name-attribute
/NXdata/AXISNAME@long_name-attribute
/NXdata/DATA@long_name-attribute
/NXdetector/data@long_name-attribute
/NXdetector/time_of_flight@long_name-attribute
/NXdetector/x_pixel_offset@long_name-attribute
/NXdetector/y_pixel_offset@long_name-attribute
/NXdetector/z_pixel_offset@long_name-attribute
/NXimage_set_em_adf/DATA/image_id@long_name-attribute
/NXimage_set_em_adf/DATA/xpos@long_name-attribute
/NXimage_set_em_adf/DATA/ypos@long_name-attribute
/NXimage_set_em_adf/DATA@long_name-attribute
/NXimage_set_em_kikuchi/DATA/image_id@long_name-attribute
/NXimage_set_em_kikuchi/DATA/intensity@long_name-attribute
/NXimage_set_em_kikuchi/DATA/xpos@long_name-attribute
/NXimage_set_em_kikuchi/DATA/ypos@long_name-attribute
/NXimage_set_em_se/DATA/image_id@long_name-attribute
/NXimage_set_em_se/DATA/intensity@long_name-attribute
/NXimage_set_em_se/DATA/xpos@long_name-attribute
/NXimage_set_em_se/DATA/ypos@long_name-attribute
/NXspectrum_set_em_xray/DATA/photon_energy@long_name-attribute
/NXspectrum_set_em_xray/DATA/xpos@long_name-attribute
/NXspectrum_set_em_xray/DATA/ypos@long_name-attribute
/NXspectrum_set_em_xray/DATA@long_name-attribute
/NXspectrum_set_em_xray/indexing/composition_map/DATA/xpos@long_name-attribute
/NXspectrum_set_em_xray/indexing/composition_map/DATA/ypos@long_name-attribute
/NXspectrum_set_em_xray/indexing/composition_map/DATA@long_name-attribute
@mask
/NXcanSAS/ENTRY/DATA@mask-attribute
@mask_indices
/NXcanSAS/ENTRY/DATA@Mask_indices-attribute
@mime_type
/NXsubentry/thumbnail@mime_type-attribute
@name
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@name-attribute
/NXcanSAS/ENTRY/run@name-attribute
@nexus_version
/NXroot@NeXus_version-attribute
@nx_class
/NXroot@NX_class-attribute
@offset
/NXbeam/TRANSFORMATIONS/DIRECTION@offset-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@offset-attribute
/NXdetector_module/fast_pixel_direction@offset-attribute
/NXdetector_module/module_offset@offset-attribute
/NXdetector_module/slow_pixel_direction@offset-attribute
/NXevent_data/event_time_zero@offset-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@offset-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@offset-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@offset-attribute
/NXtomoproc/entry/data/data@offset-attribute
/NXtransformations/AXISNAME@offset-attribute
@offset_units
/NXdetector_module/fast_pixel_direction@offset_units-attribute
/NXdetector_module/module_offset@offset_units-attribute
/NXdetector_module/slow_pixel_direction@offset_units-attribute
/NXtransformations/AXISNAME@offset_units-attribute
@populated_elements
/NXxpcs/entry/twotime/two_time_corr_func@populated_elements-attribute
@primary
/NXdetector/time_of_flight@primary-attribute
/NXdetector/x_pixel_offset@primary-attribute
/NXdetector/y_pixel_offset@primary-attribute
/NXdetector/z_pixel_offset@primary-attribute
@q_indices
/NXcanSAS/ENTRY/DATA@Q_indices-attribute
@region_type
/NXregion@region_type-attribute
@resolutions
/NXcanSAS/ENTRY/DATA/Q@resolutions-attribute
@resolutions_description
/NXcanSAS/ENTRY/DATA/Q@resolutions_description-attribute
@scaling
/NXtomoproc/entry/data/data@scaling-attribute
@scaling_factor
/NXcanSAS/ENTRY/DATA/I@scaling_factor-attribute
/NXlog/cue_timestamp_zero@scaling_factor-attribute
/NXlog/time@scaling_factor-attribute
@short_name
/NXelectronanalyser/name@short_name-attribute
/NXinstrument/name@short_name-attribute
/NXmx/ENTRY/INSTRUMENT/name@short_name-attribute
/NXmx/ENTRY/SOURCE/name@short_name-attribute
/NXsource/name@short_name-attribute
@signal
/NXcanSAS/ENTRY/DATA@signal-attribute
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@signal-attribute
/NXcxi_ptycho/DATA@signal-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1@signal-attribute
/NXdata/DATA@signal-attribute
/NXdata@signal-attribute
/NXdetector/efficiency@signal-attribute
/NXguide/reflectivity@signal-attribute
/NXlauetof/entry/instrument/detector/data@signal-attribute
/NXmpes/ENTRY/DATA@signal-attribute
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA@signal-attribute
/NXsas/ENTRY/DATA@signal-attribute
/NXxbase/entry/instrument/detector/data@signal-attribute
@start
/NXdetector/start_time@start-attribute
/NXdetector/stop_time@start-attribute
/NXdisk_chopper/top_dead_center@start-attribute
/NXevent_data/cue_timestamp_zero@start-attribute
/NXlog/cue_timestamp_zero@start-attribute
/NXlog/time@start-attribute
@storage_mode
/NXxpcs/entry/data/G2_unnormalized@storage_mode-attribute
/NXxpcs/entry/data/delay_difference@storage_mode-attribute
/NXxpcs/entry/data/g2@storage_mode-attribute
/NXxpcs/entry/data/g2_derr@storage_mode-attribute
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func@storage_mode-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@storage_mode-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@storage_mode-attribute
/NXxpcs/entry/twotime/two_time_corr_func@storage_mode-attribute
@surface_indices
/NXguide/reflectivity@surface_indices-attribute
@t_axes
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@T_axes-attribute
@time
/NXattenuator/status@time-attribute
/NXsource/last_fill@time-attribute
@time_origin_location
/NXxpcs/entry/twotime/two_time_corr_func@time_origin_location-attribute
@timestamp
/NXcanSAS/ENTRY/DATA@timestamp-attribute
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@timestamp-attribute
@transform
/NXtomoproc/entry/data/data@transform-attribute
@transformation_type
/NXbeam/TRANSFORMATIONS/DIRECTION@transformation_type-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@transformation_type-attribute
/NXdetector_module/fast_pixel_direction@transformation_type-attribute
/NXdetector_module/module_offset@transformation_type-attribute
/NXdetector_module/slow_pixel_direction@transformation_type-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@transformation_type-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@transformation_type-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@transformation_type-attribute
/NXtransformations/AXISNAME@transformation_type-attribute
@type
/NXapm/ENTRY/thumbnail@type-attribute
/NXem/ENTRY/thumbnail@type-attribute
/NXentry/thumbnail@type-attribute
@uncertainties
/NXcanSAS/ENTRY/DATA/I@uncertainties-attribute
/NXcanSAS/ENTRY/DATA/Q@uncertainties-attribute
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T@uncertainties-attribute
@units
/NXcanSAS/ENTRY/DATA/I@units-attribute
/NXcanSAS/ENTRY/DATA/Idev@units-attribute
/NXcanSAS/ENTRY/DATA/Q@units-attribute
/NXcanSAS/ENTRY/DATA/Qdev@units-attribute
/NXcanSAS/ENTRY/DATA/Qmean@units-attribute
/NXcanSAS/ENTRY/DATA/dQl@units-attribute
/NXcanSAS/ENTRY/DATA/dQw@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/energy@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/extent@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/distance@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size@units-attribute
/NXparameters/term@units-attribute
@url
/NXellipsometry/ENTRY/INSTRUMENT/firmware@url-attribute
/NXellipsometry/ENTRY/acquisition_program@url-attribute
/NXellipsometry/ENTRY/definition@url-attribute
/NXentry/definition@URL-attribute
/NXentry/definition_local@URL-attribute
/NXsubentry/definition@URL-attribute
/NXsubentry/definition_local@URL-attribute
@varied_variable
/NXiqproc/ENTRY/DATA/variable@varied_variable-attribute
@vector
/NXbeam/TRANSFORMATIONS/DIRECTION@vector-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@vector-attribute
/NXcxi_ptycho/sample_1/transformations@vector-attribute
/NXdetector_module/fast_pixel_direction@vector-attribute
/NXdetector_module/module_offset@vector-attribute
/NXdetector_module/slow_pixel_direction@vector-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@vector-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@vector-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@vector-attribute
/NXtransformations/AXISNAME@vector-attribute
@version
/NXapm/ENTRY/atom_probe/hit_multiplicity/program@version-attribute
/NXapm/ENTRY/atom_probe/ion_filtering/program@version-attribute
/NXapm/ENTRY/atom_probe/ion_impact_positions/program@version-attribute
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/background_quantification/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/peak_identification/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/program@version-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/program@version-attribute
/NXapm/ENTRY/atom_probe/reconstruction/program@version-attribute
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/program@version-attribute
/NXapm/ENTRY/program@version-attribute
/NXapm/ENTRY@version-attribute
/NXarchive/entry/program@version-attribute
/NXcanSAS/ENTRY@version-attribute
/NXellipsometry/ENTRY/INSTRUMENT/firmware@version-attribute
/NXellipsometry/ENTRY/INSTRUMENT/model@version-attribute
/NXellipsometry/ENTRY/definition@version-attribute
/NXem/ENTRY/program@version-attribute
/NXem/ENTRY@version-attribute
/NXentry/definition@version-attribute
/NXentry/definition_local@version-attribute
/NXentry/entry_identifier_uuid@version-attribute
/NXentry/program_name@version-attribute
/NXimage_set_em_adf/PROCESS/program@version-attribute
/NXmpes/ENTRY/definition@version-attribute
/NXmx/ENTRY@version-attribute
/NXspe/ENTRY/definition@version-attribute
/NXspectrum_set_em_xray/indexing/composition_map/program@version-attribute
/NXspectrum_set_em_xray/indexing/program@version-attribute
/NXsubentry/definition@version-attribute
/NXsubentry/definition_local@version-attribute
/NXsubentry/program_name@version-attribute
@wavelength_indices
/NXdetector/efficiency@wavelength_indices-attribute
/NXguide/reflectivity@wavelength_indices-attribute
@xml_version
/NXroot@XML_version-attribute
a
/NXcsg/a-group
aberration
/NXcorrector_cs/ABERRATION-group
absorbed_beam
/NXxas/ENTRY/DATA/absorbed_beam-link
/NXxas/ENTRY/INSTRUMENT/absorbed_beam-group
absorbing_material
/NXcollimator/absorbing_material-field
/NXfermi_chopper/absorbing_material-field
absorption_cross_section
/NXattenuator/absorption_cross_section-field
ac_line_sync
/NXscanbox_em/ac_line_sync-field
acceleration_time
/NXpositioner/acceleration_time-field
accepted_photon_beam_divergence
/NXbending_magnet/accepted_photon_beam_divergence-field
accepting_aperture
/NXcapillary/accepting_aperture-field
acquisition_mode
/NXarpes/ENTRY/INSTRUMENT/analyser/acquisition_mode-field
/NXdetector/acquisition_mode-field
acquisition_program
/NXellipsometry/ENTRY/acquisition_program-group
acquisition_speed
/NXimage_set_em_kikuchi/profiling/acquisition_speed-field
acquisition_time
/NXimage_set_em_kikuchi/profiling/acquisition_time-field
active
/NXimage_set_em_se/dynamic_focus/active-field
/NXimage_set_em_se/tilt_correction/active-field
address
/NXapm/ENTRY/operator/address-field
/NXellipsometry/ENTRY/operator/address-field
/NXem/ENTRY/operator/address-field
/NXuser/address-field
adf_inner_half_angle
/NXimage_set_em_adf/PROCESS/adf_inner_half_angle-field
adf_outer_half_angle
/NXimage_set_em_adf/PROCESS/adf_outer_half_angle-field
aequatorial_angle
/NXsas/ENTRY/INSTRUMENT/DETECTOR/aequatorial_angle-field
/NXsas/ENTRY/SAMPLE/aequatorial_angle-field
/NXsastof/ENTRY/instrument/detector/aequatorial_angle-field
/NXsastof/ENTRY/sample/aequatorial_angle-field
affiliation
/NXapm/ENTRY/operator/affiliation-field
/NXellipsometry/ENTRY/operator/affiliation-field
/NXem/ENTRY/operator/affiliation-field
/NXuser/affiliation-field
alpha
/NXxkappa/entry/sample/alpha-field
alternative
/NXellipsometry/ENTRY/INSTRUMENT/stage/TRANSFORMATIONS/alternative-field
amplifier_type
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field
analyser
/NXarpes/ENTRY/INSTRUMENT/analyser-group
/NXindirecttof/entry/INSTRUMENT/analyser-group
/NXtas/entry/INSTRUMENT/analyser-group
analysis_chamber
/NXapm/ENTRY/atom_probe/analysis_chamber-group
/NXapm/ENTRY/atom_probe/control_software/analysis_chamber-group
angle_of_incidence
/NXellipsometry/ENTRY/INSTRUMENT/angle_of_incidence-field
angles
/NXarpes/ENTRY/INSTRUMENT/analyser/angles-field
/NXgrating/angles-field
angular_calibration
/NXdetector/angular_calibration-field
/NXmpes/ENTRY/PROCESS/angular_calibration-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration-field
angular_calibration_applied
/NXdetector/angular_calibration_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration_applied-field
angular_dispersion
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING/angular_dispersion-field
angular_resolution
/NXelectronanalyser/angular_resolution-field
angular_spread
/NXellipsometry/ENTRY/INSTRUMENT/angular_spread-field
aperture
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE-group
/NXcollectioncolumn/APERTURE-group
/NXenergydispersion/APERTURE-group
/NXinstrument/APERTURE-group
/NXsnsevent/ENTRY/instrument/APERTURE-group
/NXsnshisto/ENTRY/instrument/APERTURE-group
/NXxraylens/aperture-field
aperture_em
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM-group
/NXebeam_column/APERTURE_EM-group
/NXibeam_column/APERTURE_EM-group
applied
/NXapm/ENTRY/atom_probe/REFLECTRON/applied-field
/NXcalibration/applied-field
/NXcorrector_cs/applied-field
/NXdistortion/applied-field
/NXmpes/ENTRY/PROCESS/angular_calibration/applied-field
/NXmpes/ENTRY/PROCESS/energy_calibration/applied-field
/NXmpes/ENTRY/PROCESS/momentum_calibration/applied-field
/NXmpes/ENTRY/PROCESS/spatial_calibration/applied-field
/NXregistration/applied-field
arrival_time_pairs
/NXapm/ENTRY/atom_probe/ion_impact_positions/arrival_time_pairs-field
atom_probe
/NXapm/ENTRY/atom_probe-group
atom_types
/NXapm/ENTRY/specimen/atom_types-field
/NXellipsometry/ENTRY/SAMPLE/atom_types-field
/NXem/ENTRY/SAMPLE/atom_types-field
attached_to
/NXsensor/attached_to-field
attenuator
/NXinstrument/ATTENUATOR-group
/NXmx/ENTRY/INSTRUMENT/ATTENUATOR-group
/NXsnsevent/ENTRY/instrument/ATTENUATOR-group
/NXsnshisto/ENTRY/instrument/ATTENUATOR-group
/NXxrot/entry/instrument/attenuator-group
attenuator_transmission
/NXattenuator/attenuator_transmission-field
/NXmx/ENTRY/INSTRUMENT/ATTENUATOR/attenuator_transmission-field
/NXxrot/entry/instrument/attenuator/attenuator_transmission-field
author
/NXnote/author-field
/NXsnsevent/ENTRY/SNSHistoTool/author-field
/NXsnshisto/ENTRY/SNSHistoTool/author-field
average_value
/NXlog/average_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value-field
average_value_error
/NXlog/average_value_error-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value_error-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value_error-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_error-field
average_value_errors
/NXlog/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value_errors-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_errors-field
axisname
/NXdata/AXISNAME-field
/NXtransformations/AXISNAME-field
axisname_end
/NXtransformations/AXISNAME_end-field
axisname_increment_set
/NXtransformations/AXISNAME_increment_set-field
azimuthal
/NXspe/ENTRY/data/azimuthal-field
azimuthal_angle
/NXcrystal/azimuthal_angle-field
/NXdetector/azimuthal_angle-field
/NXlauetof/entry/instrument/detector/azimuthal_angle-field
/NXreflections/azimuthal_angle-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/azimuthal_angle-field
/NXsastof/ENTRY/instrument/detector/azimuthal_angle-field
/NXsnsevent/ENTRY/instrument/DETECTOR/azimuthal_angle-field
/NXsnshisto/ENTRY/instrument/DETECTOR/azimuthal_angle-field
/NXtofnpd/entry/INSTRUMENT/detector/azimuthal_angle-field
/NXtofraw/entry/instrument/detector/azimuthal_angle-field
/NXtofsingle/entry/INSTRUMENT/detector/azimuthal_angle-field
azimuthal_width
/NXspe/ENTRY/data/azimuthal_width-field
b
/NXcsg/b-group
background_correction
/NXimage_set_em_kikuchi/oim/background_correction-group
background_mean
/NXreflections/background_mean-field
background_quantification
/NXapm/ENTRY/atom_probe/ranging/background_quantification-group
band_contrast
/NXimage_set_em_kikuchi/oim/band_detection/band_contrast-field
band_detection
/NXimage_set_em_kikuchi/oim/band_detection-group
band_slope
/NXimage_set_em_kikuchi/oim/band_detection/band_slope-field
bands
/NXimage_set_em_kikuchi/oim/band_detection/bands-field
bandwidth
/NXinsertion_device/bandwidth-field
base_temperature
/NXapm/ENTRY/atom_probe/STAGE_LAB/base_temperature-field
beam
/NXcontainer/beam-group
/NXebeam_column/BEAM-group
/NXibeam_column/BEAM-group
/NXinstrument/BEAM-group
/NXmpes/ENTRY/INSTRUMENT/BEAM-group
/NXmx/ENTRY/INSTRUMENT/BEAM-group
/NXsample/BEAM-group
beam_1
/NXcxi_ptycho/entry_1/instrument_1/beam_1-group
beam_center_derived
/NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_derived-field
beam_center_x
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x-field
/NXdetector/beam_center_x-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
/NXsastof/ENTRY/instrument/detector/beam_center_x-field
/NXxpcs/entry/instrument/DETECTOR/beam_center_x-field
/NXxrot/entry/instrument/detector/beam_center_x-field
beam_center_y
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y-field
/NXdetector/beam_center_y-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
/NXsastof/ENTRY/instrument/detector/beam_center_y-field
/NXxpcs/entry/instrument/DETECTOR/beam_center_y-field
/NXxrot/entry/instrument/detector/beam_center_y-field
beam_position
/NXdisk_chopper/beam_position-field
beam_shape
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_shape-field
beam_size_x
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_x-field
beam_size_y
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_y-field
beam_stop
/NXinstrument/BEAM_STOP-group
beamline
/NXsnsevent/ENTRY/instrument/beamline-field
/NXsnshisto/ENTRY/instrument/beamline-field
beamline_distance
/NXelectrostatic_kicker/beamline_distance-field
/NXmagnetic_kicker/beamline_distance-field
/NXquadrupole_magnet/beamline_distance-field
/NXseparator/beamline_distance-field
/NXsolenoid_magnet/beamline_distance-field
/NXspin_rotator/beamline_distance-field
bend_angle_x
/NXguide/bend_angle_x-field
/NXmirror/bend_angle_x-field
bend_angle_y
/NXguide/bend_angle_y-field
/NXmirror/bend_angle_y-field
bending_magnet
/NXinstrument/BENDING_MAGNET-group
bending_radius
/NXbending_magnet/bending_radius-field
bias_voltage
/NXimage_set_em_se/bias_voltage-field
/NXstage_lab/bias_voltage-field
bibtex
/NXcite/bibtex-field
bin_ends
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/bin_ends-field
binning
/NXimage_set_em_kikuchi/binning-group
/NXimage_set_em_kikuchi/binning/binning-field
bit_depth_readout
/NXdetector/bit_depth_readout-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/bit_depth_readout-field
blade_geometry
/NXaperture/BLADE_GEOMETRY-group
blade_spacing
/NXcollimator/blade_spacing-field
blade_thickness
/NXcollimator/blade_thickness-field
block
/NXregion/block-field
bounding_box
/NXreflections/bounding_box-field
bragg_angle
/NXcrystal/bragg_angle-field
bright_field
/NXtomophase/entry/instrument/bright_field-group
brightness
/NXibeam_column/ion_gun/brightness-field
broadening
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/broadening-field
buffer_chamber
/NXapm/ENTRY/atom_probe/buffer_chamber-group
bunch_distance
/NXsource/bunch_distance-field
bunch_length
/NXsource/bunch_length-field
bunch_pattern
/NXsource/bunch_pattern-group
c_1_0
/NXaberration/c_1_0-field
c_1_2_a
/NXaberration/c_1_2_a-field
c_1_2_b
/NXaberration/c_1_2_b-field
c_2_1_a
/NXaberration/c_2_1_a-field
c_2_1_b
/NXaberration/c_2_1_b-field
c_2_3_a
/NXaberration/c_2_3_a-field
c_2_3_b
/NXaberration/c_2_3_b-field
c_3_0
/NXaberration/c_3_0-field
c_3_2_a
/NXaberration/c_3_2_a-field
c_3_2_b
/NXaberration/c_3_2_b-field
c_3_4_a
/NXaberration/c_3_4_a-field
c_3_4_b
/NXaberration/c_3_4_b-field
c_5_0
/NXaberration/c_5_0-field
calibrated_axis
/NXcalibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/angular_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/energy_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/momentum_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/spatial_calibration/calibrated_axis-field
calibrated_tof
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/calibrated_tof-field
calibration
/NXellipsometry/ENTRY/INSTRUMENT/calibration-group
/NXimage_set_em_kikuchi/calibration-group
calibration_angle_of_incidence
/NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_angle_of_incidence-field
calibration_data
/NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data-group
/NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_data-field
calibration_data_type
/NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_data_type-field
calibration_date
/NXdetector/calibration_date-field
calibration_method
/NXdetector/calibration_method-group
calibration_sample
/NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_sample-field
calibration_status
/NXellipsometry/ENTRY/INSTRUMENT/calibration_status-field
calibration_style
/NXscanbox_em/calibration_style-field
calibration_time
/NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_time-field
calibration_wavelength
/NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_wavelength-field
camera_length
/NXoptical_system_em/camera_length-field
capability
/NXmanufacturer/capability-field
capillary
/NXinstrument/CAPILLARY-group
cdeform_field
/NXdistortion/cdeform_field-field
center
/NXscanbox_em/center-field
center_energy
/NXenergydispersion/center_energy-field
central_stop_diameter
/NXfresnel_zone_plate/central_stop_diameter-field
central_stop_material
/NXfresnel_zone_plate/central_stop_material-field
central_stop_thickness
/NXfresnel_zone_plate/central_stop_thickness-field
changer_position
/NXsample/changer_position-field
/NXsnsevent/ENTRY/sample/changer_position-field
/NXsnshisto/ENTRY/sample/changer_position-field
charge_state
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state-field
/NXion/charge_state-field
chemical_formula
/NXarchive/entry/sample/chemical_formula-field
/NXcontainer/chemical_formula-field
/NXcrystal/chemical_formula-field
/NXfilter/chemical_formula-field
/NXmpes/ENTRY/SAMPLE/chemical_formula-field
/NXsample/chemical_formula-field
/NXsample_component/chemical_formula-field
chi
/NXxeuler/entry/name/chi-link
/NXxeuler/entry/sample/chi-field
chopper
/NXreftof/entry/instrument/chopper-group
coating_material
/NXfilter/coating_material-field
/NXgrating/coating_material-field
/NXguide/coating_material-field
/NXmirror/coating_material-field
coating_roughness
/NXfilter/coating_roughness-field
/NXgrating/coating_roughness-field
/NXguide/coating_roughness-field
/NXmirror/coating_roughness-field
coefficients
/NXcalibration/coefficients-field
collection
/NXcanSAS/ENTRY/COLLECTION-group
/NXcanSAS/ENTRY/PROCESS/COLLECTION-group
/NXdetector/COLLECTION-group
/NXentry/COLLECTION-group
/NXinstrument/COLLECTION-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/COLLECTION-group
/NXpeak/COLLECTION-group
/NXsubentry/COLLECTION-group
collection_description
/NXarchive/entry/collection_description-field
/NXentry/collection_description-field
/NXsubentry/collection_description-field
collection_identifier
/NXarchive/entry/collection_identifier-field
/NXentry/collection_identifier-field
/NXsnsevent/ENTRY/collection_identifier-field
/NXsnshisto/ENTRY/collection_identifier-field
/NXsubentry/collection_identifier-field
collection_time
/NXarchive/entry/collection_time-field
/NXentry/collection_time-field
/NXsubentry/collection_time-field
collection_title
/NXsnsevent/ENTRY/collection_title-field
/NXsnshisto/ENTRY/collection_title-field
collectioncolumn
/NXelectronanalyser/COLLECTIONCOLUMN-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group
collimator
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR-group
/NXinstrument/COLLIMATOR-group
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR-group
/NXsastof/ENTRY/instrument/collimator-group
column_names
/NXellipsometry/ENTRY/SAMPLE/column_names-field
command1
/NXsnsevent/ENTRY/SNSHistoTool/command1-field
/NXsnshisto/ENTRY/SNSHistoTool/command1-field
comp_current
/NXflipper/comp_current-field
comp_turns
/NXflipper/comp_turns-field
company
/NXellipsometry/ENTRY/INSTRUMENT/company-field
component
/NXsample/component-field
component_index
/NXgeometry/component_index-field
composition
/NXpolarizer/composition-field
composition_map
/NXspectrum_set_em_xray/indexing/composition_map-group
concentration
/NXsample/concentration-field
confidence_index
/NXimage_set_em_kikuchi/oim/indexing/confidence_index-field
construction_year
/NXellipsometry/ENTRY/INSTRUMENT/construction_year-field
contrast_aperture
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/contrast_aperture-group
control
/NXlauetof/entry/control-group
/NXrefscan/entry/control-group
/NXreftof/entry/control-group
/NXsastof/ENTRY/control-group
/NXstxm/ENTRY/control-group
/NXtomo/entry/control-group
/NXtomophase/entry/control-group
/NXxbase/entry/control-group
control_software
/NXapm/ENTRY/atom_probe/control_software-group
controller_record
/NXpositioner/controller_record-field
coordinate_system_set
/NXapm/ENTRY/COORDINATE_SYSTEM_SET-group
/NXem/ENTRY/COORDINATE_SYSTEM_SET-group
corrector_cs
/NXebeam_column/CORRECTOR_CS-group
count
/NXregion/count-field
count_time
/NXdetector/count_time-field
/NXmonitor/count_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/count_time-field
/NXxpcs/entry/instrument/DETECTOR/count_time-field
countrate_correction_applied
/NXdetector/countrate_correction_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_applied-field
countrate_correction_lookup_table
/NXdetector/countrate_correction_lookup_table-field
counts
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/counts-field
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/counts-field
/NXspectrum_set_em_xray/DATA/counts-field
/NXspectrum_set_em_xray/indexing/composition_map/DATA/counts-field
coupled
/NXmoderator/coupled-field
coupling_material
/NXmoderator/coupling_material-field
/NXsnsevent/ENTRY/instrument/moderator/coupling_material-field
/NXsnshisto/ENTRY/instrument/moderator/coupling_material-field
crate
/NXdetector/crate-field
critical_energy
/NXbending_magnet/critical_energy-field
cryocoolant
/NXmanipulator/cryocoolant-field
cryostat_temperature
/NXmanipulator/cryostat_temperature-field
crystal
/NXinstrument/CRYSTAL-group
/NXmonochromator/CRYSTAL-group
/NXmonopd/entry/INSTRUMENT/CRYSTAL-group
/NXsnsevent/ENTRY/instrument/CRYSTAL-group
/NXsnshisto/ENTRY/instrument/CRYSTAL-group
csg
/NXsolid_geometry/CSG-group
cue_index
/NXevent_data/cue_index-field
/NXlog/cue_index-field
cue_timestamp_zero
/NXevent_data/cue_timestamp_zero-field
/NXlog/cue_timestamp_zero-field
current
/NXdeflector/current-field
/NXibeam_column/ion_gun/current-field
/NXlens_em/current-field
/NXsource/current-field
curvature
/NXxraylens/curvature-field
curvature_horizontal
/NXcrystal/curvature_horizontal-field
curvature_vertical
/NXcrystal/curvature_vertical-field
cut_angle
/NXcrystal/cut_angle-field
cylinder_orientation
/NXxraylens/cylinder_orientation-group
cylinders
/NXcylindrical_geometry/cylinders-field
cylindrical
/NXxraylens/cylindrical-field
cylindrical_geometry
/NXbeam_stop/CYLINDRICAL_GEOMETRY-group
cylindrical_orientation_angle
/NXcrystal/cylindrical_orientation_angle-field
d
/NXreflections/d-field
d_spacing
/NXcrystal/d_spacing-field
dark_field
/NXtomophase/entry/instrument/dark_field-group
daslogs
/NXsnsevent/ENTRY/DASlogs-group
/NXsnshisto/ENTRY/DASlogs-group
data
/NXapm/ENTRY/DATA-group
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA-group
/NXarpes/ENTRY/DATA-group
/NXarpes/ENTRY/INSTRUMENT/analyser/data-field
/NXbeam/DATA-group
/NXcanSAS/ENTRY/DATA-group
/NXcxi_ptycho/DATA-group
/NXcxi_ptycho/DATA/data-link
/NXcxi_ptycho/data_1/data-link
/NXcxi_ptycho/entry_1/instrument_1/MONITOR/data-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/data-field
/NXdata/DATA-field
/NXdetector/data-field
/NXellipsometry/ENTRY/INSTRUMENT/window/reference_data/data-field
/NXem/ENTRY/DATA-group
/NXentry/DATA-group
/NXfluo/entry/INSTRUMENT/fluorescence/data-field
/NXfluo/entry/MONITOR/data-field
/NXfluo/entry/data-group
/NXfluo/entry/data/data-link
/NXguide/reflectivity/data-field
/NXimage_set_em_adf/DATA-group
/NXimage_set_em_bf/DATA-group
/NXimage_set_em_bse/DATA-group
/NXimage_set_em_chamber/DATA-group
/NXimage_set_em_df/DATA-group
/NXimage_set_em_diffrac/DATA-group
/NXimage_set_em_ecci/DATA-group
/NXimage_set_em_kikuchi/DATA-group
/NXimage_set_em_ronchigram/DATA-group
/NXimage_set_em_se/DATA-group
/NXinteraction_vol_em/DATA-group
/NXiqproc/ENTRY/DATA-group
/NXiqproc/ENTRY/DATA/data-field
/NXlauetof/entry/control/data-field
/NXlauetof/entry/instrument/detector/data-field
/NXlauetof/entry/name/data-link
/NXmonitor/data-field
/NXmonopd/entry/DATA-group
/NXmonopd/entry/DATA/data-link
/NXmonopd/entry/INSTRUMENT/DETECTOR/data-field
/NXmpes/ENTRY/DATA-group
/NXmpes/ENTRY/DATA/data-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA-group
/NXmx/ENTRY/DATA-group
/NXmx/ENTRY/DATA/data-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/data-field
/NXnote/data-field
/NXrefscan/entry/control/data-field
/NXrefscan/entry/data-group
/NXrefscan/entry/data/data-link
/NXrefscan/entry/instrument/DETECTOR/data-field
/NXreftof/entry/control/data-field
/NXreftof/entry/data-group
/NXreftof/entry/data/data-link
/NXreftof/entry/instrument/detector/data-field
/NXsas/ENTRY/DATA-group
/NXsas/ENTRY/DATA/data-link
/NXsas/ENTRY/INSTRUMENT/DETECTOR/data-field
/NXsastof/ENTRY/control/data-field
/NXsastof/ENTRY/data-group
/NXsastof/ENTRY/data/data-link
/NXsastof/ENTRY/instrument/detector/data-field
/NXscan/ENTRY/DATA-group
/NXscan/ENTRY/DATA/data-link
/NXscan/ENTRY/INSTRUMENT/DETECTOR/data-field
/NXscan/ENTRY/MONITOR/data-field
/NXsnsevent/ENTRY/DATA-group
/NXsnsevent/ENTRY/MONITOR/data-field
/NXsnshisto/ENTRY/DATA-group
/NXsnshisto/ENTRY/DATA/data-link
/NXsnshisto/ENTRY/MONITOR/data-field
/NXsnshisto/ENTRY/instrument/DETECTOR/data-field
/NXspe/ENTRY/data-group
/NXspe/ENTRY/data/data-field
/NXspectrum_set_em_auger/DATA-group
/NXspectrum_set_em_cathodolum/DATA-group
/NXspectrum_set_em_eels/DATA-group
/NXspectrum_set_em_xray/DATA-group
/NXspectrum_set_em_xray/indexing/composition_map/DATA-group
/NXsqom/ENTRY/DATA-group
/NXsqom/ENTRY/DATA/data-field
/NXstxm/ENTRY/DATA-group
/NXstxm/ENTRY/DATA/data-field
/NXstxm/ENTRY/INSTRUMENT/DETECTOR/data-field
/NXstxm/ENTRY/INSTRUMENT/sample_x/data-field
/NXstxm/ENTRY/INSTRUMENT/sample_y/data-field
/NXstxm/ENTRY/INSTRUMENT/sample_z/data-field
/NXstxm/ENTRY/control/data-field
/NXsubentry/DATA-group
/NXtas/entry/DATA-group
/NXtas/entry/DATA/data-link
/NXtas/entry/INSTRUMENT/DETECTOR/data-field
/NXtas/entry/MONITOR/data-field
/NXtofnpd/entry/INSTRUMENT/detector/data-field
/NXtofnpd/entry/MONITOR/data-field
/NXtofnpd/entry/data-group
/NXtofnpd/entry/data/data-link
/NXtofraw/entry/MONITOR/data-field
/NXtofraw/entry/data-group
/NXtofraw/entry/data/data-link
/NXtofraw/entry/instrument/detector/data-field
/NXtofsingle/entry/INSTRUMENT/detector/data-field
/NXtofsingle/entry/MONITOR/data-field
/NXtofsingle/entry/data-group
/NXtofsingle/entry/data/data-link
/NXtomo/entry/control/data-field
/NXtomo/entry/data-group
/NXtomo/entry/data/data-link
/NXtomo/entry/instrument/detector/data-field
/NXtomophase/entry/data-group
/NXtomophase/entry/data/data-link
/NXtomophase/entry/instrument/bright_field/data-field
/NXtomophase/entry/instrument/dark_field/data-field
/NXtomophase/entry/instrument/sample/data-field
/NXtomoproc/entry/data-group
/NXtomoproc/entry/data/data-field
/NXxas/ENTRY/DATA-group
/NXxas/ENTRY/INSTRUMENT/absorbed_beam/data-field
/NXxas/ENTRY/INSTRUMENT/incoming_beam/data-field
/NXxas/ENTRY/MONITOR/data-field
/NXxasproc/ENTRY/DATA-group
/NXxasproc/ENTRY/DATA/data-field
/NXxbase/entry/DATA-group
/NXxbase/entry/DATA/data-link
/NXxbase/entry/instrument/detector/data-field
/NXxlaue/entry/instrument/source/distribution/data-field
/NXxpcs/entry/data-group
data_1
/NXcxi_ptycho/data_1-group
/NXcxi_ptycho/entry_1/instrument_1/detector_1/data_1-link
data_correction
/NXellipsometry/ENTRY/INSTRUMENT/data_correction-field
data_error
/NXellipsometry/ENTRY/SAMPLE/data_error-field
data_errors
/NXdetector/data_errors-field
data_file
/NXdetector/data_file-group
data_identifier
/NXellipsometry/ENTRY/SAMPLE/data_identifier-field
data_origin
/NXdetector_module/data_origin-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_origin-field
data_size
/NXdetector_module/data_size-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_size-field
data_stride
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_stride-field
data_type
/NXellipsometry/ENTRY/SAMPLE/data_type-field
data_x_time_of_flight
/NXsnshisto/ENTRY/DATA/data_x_time_of_flight-link
/NXsnshisto/ENTRY/instrument/DETECTOR/data_x_time_of_flight-field
data_x_y
/NXsnsevent/ENTRY/DATA/data_x_y-link
/NXsnsevent/ENTRY/instrument/DETECTOR/data_x_y-field
/NXsnshisto/ENTRY/DATA/data_x_y-link
/NXsnshisto/ENTRY/instrument/DETECTOR/data_x_y-field
data_y_time_of_flight
/NXsnshisto/ENTRY/DATA/data_y_time_of_flight-link
/NXsnshisto/ENTRY/instrument/DETECTOR/data_y_time_of_flight-field
date
/NXcanSAS/ENTRY/PROCESS/date-field
/NXnote/date-field
/NXprocess/date-field
/NXsnsevent/ENTRY/SNSHistoTool/date-field
/NXsnshisto/ENTRY/SNSHistoTool/date-field
/NXtomoproc/entry/reconstruction/date-field
/NXxasproc/ENTRY/XAS_data_reduction/date-field
dead_time
/NXdetector/dead_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/dead_time-field
definition
/NXapm/ENTRY/definition-field
/NXarchive/entry/definition-field
/NXarpes/ENTRY/definition-field
/NXcanSAS/ENTRY/definition-field
/NXcxi_ptycho/entry_1/definition-field
/NXdirecttof/entry/definition-field
/NXellipsometry/ENTRY/definition-field
/NXem/ENTRY/definition-field
/NXentry/definition-field
/NXfluo/entry/definition-field
/NXindirecttof/entry/definition-field
/NXiqproc/ENTRY/definition-field
/NXlauetof/entry/definition-field
/NXmonopd/entry/definition-field
/NXmpes/ENTRY/definition-field
/NXmx/ENTRY/definition-field
/NXrefscan/entry/definition-field
/NXreftof/entry/definition-field
/NXsas/ENTRY/definition-field
/NXsastof/ENTRY/definition-field
/NXscan/ENTRY/definition-field
/NXsnsevent/ENTRY/definition-field
/NXsnshisto/ENTRY/definition-field
/NXspe/ENTRY/definition-field
/NXsqom/ENTRY/definition-field
/NXstxm/ENTRY/definition-field
/NXsubentry/definition-field
/NXtas/entry/definition-field
/NXtofnpd/entry/definition-field
/NXtofraw/entry/definition-field
/NXtofsingle/entry/definition-field
/NXtomo/entry/definition-field
/NXtomophase/entry/definition-field
/NXtomoproc/entry/definition-field
/NXxas/ENTRY/definition-field
/NXxasproc/ENTRY/definition-field
/NXxbase/entry/definition-field
/NXxeuler/entry/definition-field
/NXxkappa/entry/definition-field
/NXxlaue/entry/definition-field
/NXxlaueplate/entry/definition-field
/NXxnb/entry/definition-field
/NXxpcs/entry/definition-field
/NXxrot/entry/definition-field
definition_local
/NXentry/definition_local-field
/NXsubentry/definition_local-field
deflection_angle
/NXgrating/deflection_angle-field
deflector
/NXcollectioncolumn/DEFLECTOR-group
/NXelectronanalyser/DEFLECTOR-group
/NXenergydispersion/DEFLECTOR-group
/NXspindispersion/DEFLECTOR-group
defocus
/NXoptical_system_em/defocus-field
delay
/NXdisk_chopper/delay-field
delay_difference
/NXxpcs/entry/data/delay_difference-field
density
/NXcontainer/density-field
/NXcrystal/density-field
/NXfilter/density-field
/NXsample/density-field
/NXsample_component/density-field
depends_on
/NXaperture/depends_on-field
/NXattenuator/depends_on-field
/NXbeam/depends_on-field
/NXbeam_stop/depends_on-field
/NXbending_magnet/depends_on-field
/NXcapillary/depends_on-field
/NXcollectioncolumn/depends_on-field
/NXcollimator/depends_on-field
/NXcrystal/depends_on-field
/NXdeflector/depends_on-field
/NXdetector/depends_on-field
/NXdetector_module/depends_on-field
/NXdisk_chopper/depends_on-field
/NXelectronanalyser/depends_on-field
/NXenvironment/depends_on-field
/NXfermi_chopper/depends_on-field
/NXfilter/depends_on-field
/NXflipper/depends_on-field
/NXfresnel_zone_plate/depends_on-field
/NXgrating/depends_on-field
/NXguide/depends_on-field
/NXinsertion_device/depends_on-field
/NXlens_em/depends_on-field
/NXmanipulator/depends_on-field
/NXmirror/depends_on-field
/NXmoderator/depends_on-field
/NXmonitor/depends_on-field
/NXmonochromator/depends_on-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/depends_on-field
/NXmx/ENTRY/SAMPLE/depends_on-field
/NXpinhole/depends_on-field
/NXpolarizer/depends_on-field
/NXpositioner/depends_on-field
/NXquadric/depends_on-field
/NXregistration/depends_on-field
/NXsample/depends_on-field
/NXsensor/depends_on-field
/NXslit/depends_on-field
/NXsource/depends_on-field
/NXspindispersion/depends_on-field
/NXvelocity_selector/depends_on-field
/NXxraylens/depends_on-field
depolarization
/NXellipsometry/ENTRY/derived_parameters/depolarization-field
depth
/NXgrating/depth-field
derived_parameters
/NXellipsometry/ENTRY/derived_parameters-group
description
/NXaperture/description-field
/NXaperture_em/description-field
/NXapm/ENTRY/specimen/description-field
/NXarchive/entry/instrument/description-field
/NXarchive/entry/sample/description-field
/NXbeam_stop/description-field
/NXcalibration/description-field
/NXcanSAS/ENTRY/PROCESS/description-field
/NXchamber/description-field
/NXcite/description-field
/NXcontainer/description-field
/NXcorrector_cs/description-field
/NXdeflector/description-field
/NXdetector/description-field
/NXdistortion/description-field
/NXebeam_column/electron_gun/description-field
/NXelectronanalyser/description-field
/NXelectrostatic_kicker/description-field
/NXellipsometry/ENTRY/INSTRUMENT/stage/description-field
/NXem/ENTRY/SAMPLE/description-field
/NXem/ENTRY/em_lab/DETECTOR/description-field
/NXenvironment/description-field
/NXfilter/description-field
/NXgeometry/description-field
/NXguide/description-field
/NXibeam_column/ion_gun/description-field
/NXlens_em/description-field
/NXlog/description-field
/NXmagnetic_kicker/description-field
/NXmanipulator/description-field
/NXmirror/description-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/description-field
/NXnote/description-field
/NXpositioner/description-field
/NXquadrupole_magnet/description-field
/NXreflectron/description-field
/NXregistration/description-field
/NXsample/description-field
/NXsample_component/description-field
/NXseparator/description-field
/NXsnsevent/ENTRY/DASlogs/LOG/description-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field
/NXsnsevent/ENTRY/SNSHistoTool/description-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/description-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/description-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/description-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/description-field
/NXsnshisto/ENTRY/DASlogs/LOG/description-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/description-field
/NXsnshisto/ENTRY/SNSHistoTool/description-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/description-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/description-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/description-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/description-field
/NXsolenoid_magnet/description-field
/NXspin_rotator/description-field
/NXstage_lab/description-field
/NXxpcs/entry/instrument/DETECTOR/description-field
design
/NXpump/design-field
/NXstage_lab/design-field
det_module
/NXreflections/det_module-field
details
/NXcanSAS/ENTRY/SAMPLE/details-field
detection_gas_path
/NXdetector/detection_gas_path-field
detection_rate
/NXapm/ENTRY/atom_probe/ion_impact_positions/detection_rate-field
detector
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR-group
/NXelectronanalyser/DETECTOR-group
/NXellipsometry/ENTRY/INSTRUMENT/DETECTOR-group
/NXem/ENTRY/em_lab/DETECTOR-group
/NXinstrument/DETECTOR-group
/NXlauetof/entry/instrument/detector-group
/NXmonopd/entry/INSTRUMENT/DETECTOR-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR-group
/NXrefscan/entry/instrument/DETECTOR-group
/NXreftof/entry/instrument/detector-group
/NXsas/ENTRY/INSTRUMENT/DETECTOR-group
/NXsastof/ENTRY/instrument/detector-group
/NXscan/ENTRY/INSTRUMENT/DETECTOR-group
/NXsnsevent/ENTRY/instrument/DETECTOR-group
/NXsnshisto/ENTRY/instrument/DETECTOR-group
/NXstxm/ENTRY/INSTRUMENT/DETECTOR-group
/NXtas/entry/INSTRUMENT/DETECTOR-group
/NXtofnpd/entry/INSTRUMENT/detector-group
/NXtofraw/entry/instrument/detector-group
/NXtofsingle/entry/INSTRUMENT/detector-group
/NXtomo/entry/instrument/detector-group
/NXxbase/entry/instrument/detector-group
/NXxeuler/entry/instrument/detector-group
/NXxkappa/entry/instrument/detector-group
/NXxlaueplate/entry/instrument/detector-group
/NXxnb/entry/instrument/detector-group
/NXxpcs/entry/instrument/DETECTOR-group
/NXxrot/entry/instrument/detector-group
detector_1
/NXcxi_ptycho/entry_1/instrument_1/detector_1-group
detector_distance
/NXimage_set_em_kikuchi/oim/detector_distance-field
detector_faces
/NXoff_geometry/detector_faces-field
detector_group
/NXinstrument/DETECTOR_GROUP-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP-group
detector_identifier
/NXem/ENTRY/measurement/EVENT_DATA_EM/detector_identifier-field
/NXevent_data_em/detector_identifier-field
detector_module
/NXdetector/DETECTOR_MODULE-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE-group
detector_number
/NXcylindrical_geometry/detector_number-field
/NXdetector/detector_number-field
/NXtofnpd/entry/INSTRUMENT/detector/detector_number-field
/NXtofnpd/entry/data/detector_number-link
/NXtofraw/entry/data/detector_number-link
/NXtofraw/entry/instrument/detector/detector_number-field
detector_readout_time
/NXdetector/detector_readout_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/detector_readout_time-field
detector_type
/NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/detector_type-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field
diameter
/NXdetector/diameter-field
/NXenergydispersion/diameter-field
/NXpinhole/diameter-field
/NXxlaueplate/entry/instrument/detector/diameter-field
diffraction_order
/NXgrating/diffraction_order-field
diffractometer
/NXinstrument/DIFFRACTOMETER-group
direction
/NXbeam/TRANSFORMATIONS/DIRECTION-field
/NXshape/direction-field
disk_chopper
/NXdirecttof/entry/INSTRUMENT/disk_chopper-group
/NXinstrument/DISK_CHOPPER-group
/NXsnsevent/ENTRY/instrument/DISK_CHOPPER-group
/NXsnshisto/ENTRY/instrument/DISK_CHOPPER-group
distance
/NXattenuator/distance-field
/NXbeam/distance-field
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/distance-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/distance-field
/NXdetector/distance-field
/NXdisk_chopper/distance-field
/NXfermi_chopper/distance-field
/NXindirecttof/entry/INSTRUMENT/analyser/distance-field
/NXlauetof/entry/instrument/detector/distance-field
/NXmoderator/distance-field
/NXmonitor/distance-field
/NXmpes/ENTRY/INSTRUMENT/BEAM/distance-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/distance-field
/NXreftof/entry/instrument/chopper/distance-field
/NXreftof/entry/instrument/detector/distance-field
/NXsample/distance-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/distance-field
/NXsastof/ENTRY/instrument/detector/distance-field
/NXsnsevent/ENTRY/MONITOR/distance-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/ATTENUATOR/distance-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/DETECTOR/distance-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/DISK_CHOPPER/distance-field
/NXsnsevent/ENTRY/instrument/moderator/distance-field
/NXsnshisto/ENTRY/MONITOR/distance-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/translation/distance-field
/NXsnshisto/ENTRY/instrument/ATTENUATOR/distance-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
/NXsnshisto/ENTRY/instrument/DETECTOR/distance-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation/distance-field
/NXsnshisto/ENTRY/instrument/DISK_CHOPPER/distance-field
/NXsnshisto/ENTRY/instrument/FERMI_CHOPPER/distance-field
/NXsnshisto/ENTRY/instrument/moderator/distance-field
/NXsource/distance-field
/NXspe/ENTRY/data/distance-field
/NXtofnpd/entry/INSTRUMENT/detector/distance-field
/NXtofnpd/entry/MONITOR/distance-field
/NXtofraw/entry/MONITOR/distance-field
/NXtofraw/entry/instrument/detector/distance-field
/NXtofsingle/entry/INSTRUMENT/detector/distance-field
/NXtofsingle/entry/MONITOR/distance-field
/NXtomo/entry/instrument/detector/distance-field
/NXtomophase/entry/instrument/sample/distance-field
/NXxbase/entry/instrument/detector/distance-field
/NXxbase/entry/sample/distance-field
/NXxpcs/entry/instrument/DETECTOR/distance-field
distance_derived
/NXmx/ENTRY/INSTRUMENT/DETECTOR/distance_derived-field
distance_to_detector
/NXbeam_stop/distance_to_detector-field
distances
/NXtranslation/distances-field
distribution
/NXmonochromator/distribution-group
/NXsource/distribution-group
/NXxlaue/entry/instrument/source/distribution-group
divergence_x
/NXcollimator/divergence_x-field
divergence_x_minus
/NXbending_magnet/divergence_x_minus-field
divergence_x_plus
/NXbending_magnet/divergence_x_plus-field
divergence_y
/NXcollimator/divergence_y-field
divergence_y_minus
/NXbending_magnet/divergence_y_minus-field
divergence_y_plus
/NXbending_magnet/divergence_y_plus-field
doi
/NXcite/doi-field
downsampled
/NXregion/downsampled-group
dql
/NXcanSAS/ENTRY/DATA/dQl-field
dqw
/NXcanSAS/ENTRY/DATA/dQw-field
drain_current
/NXmanipulator/drain_current-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/MANIPULATOR/drain_current-field
duration
/NXarchive/entry/duration-field
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/duration-field
/NXentry/duration-field
/NXlog/duration-field
/NXsnsevent/ENTRY/DASlogs/LOG/duration-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/duration-field
/NXsnsevent/ENTRY/duration-field
/NXsnshisto/ENTRY/DASlogs/LOG/duration-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/duration-field
/NXsnshisto/ENTRY/duration-field
/NXsubentry/duration-field
/NXtofraw/entry/duration-field
/NXtofsingle/entry/duration-field
duty_cycle
/NXgrating/duty_cycle-field
dwell_time
/NXimage_set_em_se/dwell_time-field
dynamic_focus
/NXimage_set_em_se/dynamic_focus-group
dynamic_phi_list
/NXxpcs/entry/instrument/masks/dynamic_phi_list-field
dynamic_q_list
/NXxpcs/entry/instrument/masks/dynamic_q_list-field
dynamic_roi_map
/NXxpcs/entry/instrument/masks/dynamic_roi_map-field
ebeam_column
/NXem/ENTRY/em_lab/EBEAM_COLUMN-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/EBEAM_COLUMN-group
/NXevent_data_em/EBEAM_COLUMN-group
ebeam_deflector
/NXem/ENTRY/em_lab/ebeam_deflector-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/ebeam_deflector-group
/NXevent_data_em/ebeam_deflector-group
ef
/NXtas/entry/DATA/ef-link
/NXtas/entry/INSTRUMENT/analyser/ef-field
efficiency
/NXdetector/efficiency-group
/NXdetector/efficiency/efficiency-field
/NXmonitor/efficiency-field
/NXpolarizer/efficiency-field
ei
/NXtas/entry/DATA/ei-link
/NXtas/entry/INSTRUMENT/monochromator/ei-field
electric_field
/NXarchive/entry/sample/electric_field-field
/NXsample/electric_field-field
electron_gun
/NXebeam_column/electron_gun-group
electronanalyser
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER-group
element_names
/NXspectrum_set_em_xray/indexing/element_names-field
ellipsometry_type
/NXellipsometry/ENTRY/INSTRUMENT/ellipsometry_type-field
em_lab
/NXem/ENTRY/em_lab-group
email
/NXapm/ENTRY/operator/email-field
/NXellipsometry/ENTRY/operator/email-field
/NXem/ENTRY/operator/email-field
/NXuser/email-field
emittance_x
/NXsource/emittance_x-field
emittance_y
/NXsource/emittance_y-field
emitter_material
/NXebeam_column/electron_gun/emitter_material-field
emitter_type
/NXebeam_column/electron_gun/emitter_type-field
/NXibeam_column/ion_gun/emitter_type-field
en
/NXsqom/ENTRY/DATA/en-field
/NXtas/entry/DATA/en-link
/NXtas/entry/SAMPLE/en-field
end_time
/NXapm/ENTRY/end_time-field
/NXarchive/entry/end_time-field
/NXcxi_ptycho/entry_1/end_time-field
/NXem/ENTRY/end_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/end_time-field
/NXentry/end_time-field
/NXevent_data_em/end_time-field
/NXmonitor/end_time-field
/NXmx/ENTRY/end_time-field
/NXrefscan/entry/end_time-field
/NXreftof/entry/end_time-field
/NXsas/ENTRY/end_time-field
/NXscan/ENTRY/end_time-field
/NXsnsevent/ENTRY/end_time-field
/NXsnshisto/ENTRY/end_time-field
/NXstxm/ENTRY/end_time-field
/NXsubentry/end_time-field
/NXtomo/entry/end_time-field
/NXtomophase/entry/end_time-field
/NXxpcs/entry/end_time-field
end_time_estimated
/NXmx/ENTRY/end_time_estimated-field
endnote
/NXcite/endnote-field
energies
/NXarpes/ENTRY/INSTRUMENT/analyser/energies-field
energy
/NXarpes/ENTRY/INSTRUMENT/monochromator/energy-field
/NXcxi_ptycho/entry_1/instrument_1/beam_1/energy-field
/NXcxi_ptycho/entry_1/instrument_1/source_1/energy-field
/NXdirecttof/entry/INSTRUMENT/disk_chopper/energy-field
/NXdirecttof/entry/INSTRUMENT/fermi_chopper/energy-field
/NXfermi_chopper/energy-field
/NXfluo/entry/INSTRUMENT/fluorescence/energy-field
/NXfluo/entry/data/energy-link
/NXindirecttof/entry/INSTRUMENT/analyser/energy-field
/NXinsertion_device/energy-field
/NXmonochromator/energy-field
/NXsource/energy-field
/NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER/energy-field
/NXspe/ENTRY/data/energy-field
/NXstxm/ENTRY/DATA/energy-field
/NXstxm/ENTRY/INSTRUMENT/monochromator/energy-field
/NXxas/ENTRY/DATA/energy-link
/NXxas/ENTRY/INSTRUMENT/monochromator/energy-field
/NXxasproc/ENTRY/DATA/energy-field
energy_calibration
/NXmpes/ENTRY/PROCESS/energy_calibration-group
energy_error
/NXmonochromator/energy_error-field
energy_errors
/NXmonochromator/energy_errors-field
energy_interval
/NXenergydispersion/energy_interval-field
energy_resolution
/NXelectronanalyser/energy_resolution-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution-field
/NXmpes/ENTRY/INSTRUMENT/energy_resolution-field
energy_scan_mode
/NXenergydispersion/energy_scan_mode-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field
energy_transfer
/NXbeam/energy_transfer-field
energydispersion
/NXelectronanalyser/ENERGYDISPERSION-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group
entering
/NXreflections/entering-field
entrance_slit
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit-group
entrance_slit_setting
/NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_setting-field
entrance_slit_shape
/NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_shape-field
entrance_slit_size
/NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_size-field
entry
/NXapm/ENTRY-group
/NXarchive/entry-group
/NXarpes/ENTRY-group
/NXcanSAS/ENTRY-group
/NXdirecttof/entry-group
/NXellipsometry/ENTRY-group
/NXem/ENTRY-group
/NXfluo/entry-group
/NXindirecttof/entry-group
/NXiqproc/ENTRY-group
/NXlauetof/entry-group
/NXmonopd/entry-group
/NXmpes/ENTRY-group
/NXmx/ENTRY-group
/NXrefscan/entry-group
/NXreftof/entry-group
/NXroot/ENTRY-group
/NXsas/ENTRY-group
/NXsastof/ENTRY-group
/NXscan/ENTRY-group
/NXsnsevent/ENTRY-group
/NXsnshisto/ENTRY-group
/NXspe/ENTRY-group
/NXsqom/ENTRY-group
/NXstxm/ENTRY-group
/NXtas/entry-group
/NXtofnpd/entry-group
/NXtofraw/entry-group
/NXtofsingle/entry-group
/NXtomo/entry-group
/NXtomophase/entry-group
/NXtomoproc/entry-group
/NXxas/ENTRY-group
/NXxasproc/ENTRY-group
/NXxbase/entry-group
/NXxeuler/entry-group
/NXxkappa/entry-group
/NXxlaue/entry-group
/NXxlaueplate/entry-group
/NXxnb/entry-group
/NXxpcs/entry-group
/NXxrot/entry-group
entry_1
/NXcxi_ptycho/entry_1-group
entry_identifier
/NXarchive/entry/entry_identifier-field
/NXentry/entry_identifier-field
/NXsnsevent/ENTRY/entry_identifier-field
/NXsnshisto/ENTRY/entry_identifier-field
/NXsubentry/entry_identifier-field
/NXxpcs/entry/entry_identifier-field
entry_identifier_uuid
/NXentry/entry_identifier_uuid-field
/NXxpcs/entry/entry_identifier_uuid-field
environment_conditions
/NXellipsometry/ENTRY/SAMPLE/environment_conditions-group
error
/NXspe/ENTRY/data/error-field
errors
/NXdata/errors-field
evaporation_id_included
/NXapm/ENTRY/atom_probe/ion_filtering/evaporation_id_included-field
even_layer_density
/NXmirror/even_layer_density-field
even_layer_material
/NXmirror/even_layer_material-field
event_data
/NXinstrument/EVENT_DATA-group
/NXsnsevent/ENTRY/EVENT_DATA-group
event_data_em
/NXem/ENTRY/measurement/EVENT_DATA_EM-group
/NXevent_data_em_set/EVENT_DATA_EM-group
event_id
/NXevent_data/event_id-field
event_identifier
/NXem/ENTRY/measurement/EVENT_DATA_EM/event_identifier-field
/NXevent_data_em/event_identifier-field
event_index
/NXevent_data/event_index-field
/NXsnsevent/ENTRY/EVENT_DATA/event_index-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_index-field
event_pixel_id
/NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_pixel_id-field
event_time_of_flight
/NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_time_of_flight-field
event_time_offset
/NXevent_data/event_time_offset-field
event_time_zero
/NXevent_data/event_time_zero-field
event_type
/NXem/ENTRY/measurement/EVENT_DATA_EM/event_type-field
/NXevent_data_em/event_type-field
exit_slit
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/exit_slit-group
experiment_description
/NXapm/ENTRY/experiment_description-field
/NXarchive/entry/experiment_description-field
/NXellipsometry/ENTRY/experiment_description-field
/NXem/ENTRY/experiment_description-field
/NXentry/experiment_description-field
/NXsubentry/experiment_description-field
experiment_documentation
/NXapm/ENTRY/experiment_documentation-group
/NXem/ENTRY/experiment_documentation-group
/NXentry/experiment_documentation-group
/NXsubentry/experiment_documentation-group
experiment_identifier
/NXapm/ENTRY/experiment_identifier-field
/NXarchive/entry/experiment_identifier-field
/NXellipsometry/ENTRY/experiment_identifier-field
/NXem/ENTRY/experiment_identifier-field
/NXentry/experiment_identifier-field
/NXsnsevent/ENTRY/experiment_identifier-field
/NXsnshisto/ENTRY/experiment_identifier-field
/NXsubentry/experiment_identifier-field
experiments
/NXreflections/experiments-field
extent
/NXbeam/extent-field
/NXcxi_ptycho/entry_1/instrument_1/beam_1/extent-field
/NXxpcs/entry/instrument/incident_beam/extent-field
external_adc
/NXsample/external_ADC-group
external_dac
/NXsample/external_DAC-field
external_field_brief
/NXsensor/external_field_brief-field
external_field_full
/NXsensor/external_field_full-group
external_material
/NXguide/external_material-field
/NXmirror/external_material-field
extractor_current
/NXcollectioncolumn/extractor_current-field
extractor_voltage
/NXcollectioncolumn/extractor_voltage-field
fabrication
/NXfresnel_zone_plate/fabrication-field
faces
/NXoff_geometry/faces-field
facility_user_id
/NXarchive/entry/user/facility_user_id-field
/NXsnsevent/ENTRY/USER/facility_user_id-field
/NXsnshisto/ENTRY/USER/facility_user_id-field
/NXuser/facility_user_id-field
fast_axes
/NXelectronanalyser/fast_axes-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field
fast_pixel_direction
/NXdetector_module/fast_pixel_direction-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction-field
fax_number
/NXuser/fax_number-field
features
/NXentry/features-field
fermi_chopper
/NXdirecttof/entry/INSTRUMENT/fermi_chopper-group
/NXinstrument/FERMI_CHOPPER-group
/NXsnshisto/ENTRY/instrument/FERMI_CHOPPER-group
/NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER-group
field_aperture
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/field_aperture-group
field_of_view
/NXapm/ENTRY/atom_probe/field_of_view-field
/NXoptical_system_em/field_of_view-field
fieldname_errors
/NXdata/FIELDNAME_errors-field
figure_data
/NXgrating/figure_data-group
/NXmirror/figure_data-group
figure_of_merit
/NXspindispersion/figure_of_merit-field
file_name
/NXnote/file_name-field
filenames
/NXiqproc/ENTRY/reduction/input/filenames-field
/NXsqom/ENTRY/reduction/input/filenames-field
filter
/NXinstrument/FILTER-group
final_beam_divergence
/NXbeam/final_beam_divergence-field
final_energy
/NXbeam/final_energy-field
final_polarization
/NXbeam/final_polarization-field
final_polarization_stokes
/NXbeam/final_polarization_stokes-field
final_wavelength
/NXbeam/final_wavelength-field
final_wavelength_spread
/NXbeam/final_wavelength_spread-field
firmware
/NXellipsometry/ENTRY/INSTRUMENT/firmware-field
fit_function
/NXcalibration/fit_function-field
fixed_energy
/NXspe/ENTRY/NXSPE_info/fixed_energy-field
fixed_revolution
/NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/fixed_revolution-field
fixed_slit
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer/SLIT/fixed_slit-field
flags
/NXreflections/flags-field
flatfield
/NXdetector/flatfield-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield-field
flatfield_applied
/NXdetector/flatfield_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_applied-field
flatfield_error
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_error-field
flatfield_errors
/NXdetector/flatfield_errors-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_errors-field
flight_path_length
/NXapm/ENTRY/atom_probe/flight_path_length-field
flip_current
/NXflipper/flip_current-field
flip_turns
/NXflipper/flip_turns-field
flipper
/NXinstrument/FLIPPER-group
fluorescence
/NXfluo/entry/INSTRUMENT/fluorescence-group
flux
/NXbeam/flux-field
/NXmx/ENTRY/INSTRUMENT/BEAM/flux-field
/NXsource/flux-field
flux_integrated
/NXmx/ENTRY/INSTRUMENT/BEAM/flux_integrated-field
flyback_time
/NXscanbox_em/flyback_time-field
focal_size
/NXcapillary/focal_size-field
focus_parameters
/NXfresnel_zone_plate/focus_parameters-field
focus_type
/NXxraylens/focus_type-field
focussing_probes
/NXellipsometry/ENTRY/INSTRUMENT/focussing_probes-field
frame_average
/NXxpcs/entry/data/frame_average-field
frame_start_number
/NXdetector/frame_start_number-field
/NXxbase/entry/instrument/detector/frame_start_number-field
frame_sum
/NXxpcs/entry/data/frame_sum-field
frame_time
/NXdetector/frame_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/frame_time-field
/NXxpcs/entry/instrument/DETECTOR/frame_time-field
frequency
/NXcollimator/frequency-field
/NXsnsevent/ENTRY/instrument/SNS/frequency-field
/NXsnshisto/ENTRY/instrument/SNS/frequency-field
/NXsource/frequency-field
frequency_log
/NXcollimator/frequency_log-group
g2
/NXxpcs/entry/data/g2-field
g2_derr
/NXxpcs/entry/data/g2_derr-field
g2_err_from_two_time_corr_func
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func-field
g2_err_from_two_time_corr_func_partials
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func_partials-field
g2_from_two_time_corr_func
/NXxpcs/entry/twotime/g2_from_two_time_corr_func-field
g2_from_two_time_corr_func_partials
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials-field
g2_unnormalized
/NXxpcs/entry/data/G2_unnormalized-field
gain
/NXcapillary/gain-group
gain_setting
/NXdetector/gain_setting-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/gain_setting-field
gap
/NXinsertion_device/gap-field
gas
/NXxraylens/gas-field
gas_pressure
/NXdetector/gas_pressure-field
/NXmpes/ENTRY/SAMPLE/gas_pressure-field
/NXxraylens/gas_pressure-field
geometry
/NXaperture/GEOMETRY-group
/NXbeam_stop/GEOMETRY-group
/NXbending_magnet/GEOMETRY-group
/NXcollimator/GEOMETRY-group
/NXcrystal/GEOMETRY-group
/NXcsg/geometry-field
/NXdetector/GEOMETRY-group
/NXdisk_chopper/GEOMETRY-group
/NXfermi_chopper/GEOMETRY-group
/NXfilter/GEOMETRY-group
/NXguide/GEOMETRY-group
/NXinsertion_device/GEOMETRY-group
/NXmirror/GEOMETRY-group
/NXmoderator/GEOMETRY-group
/NXmonitor/GEOMETRY-group
/NXmonochromator/geometry-group
/NXorientation/GEOMETRY-group
/NXsample/geometry-group
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY-group
/NXsastof/ENTRY/instrument/collimator/geometry-group
/NXsensor/geometry-group
/NXsource/geometry-group
/NXtranslation/geometry-group
/NXvelocity_selector/geometry-group
geometry_1
/NXcxi_ptycho/sample_1/geometry_1-group
getter_pump
/NXapm/ENTRY/atom_probe/getter_pump-group
grating
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING-group
/NXmonochromator/GRATING-group
grating_wavelength_max
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING/grating_wavelength_max-field
grating_wavelength_min
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING/grating_wavelength_min-field
grid_type
/NXimage_set_em_kikuchi/grid_type-field
group_index
/NXdetector_group/group_index-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_index-field
group_names
/NXdetector_group/group_names-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_names-field
group_parent
/NXdetector_group/group_parent-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_parent-field
group_type
/NXdetector_group/group_type-field
guide
/NXinstrument/GUIDE-group
guide_current
/NXflipper/guide_current-field
guide_turns
/NXflipper/guide_turns-field
h
/NXreflections/h-field
harmonic
/NXinsertion_device/harmonic-field
heater_power
/NXmanipulator/heater_power-field
height
/NXfermi_chopper/height-field
/NXvelocity_selector/height-field
high_trip_value
/NXsensor/high_trip_value-field
hit_multiplicity
/NXapm/ENTRY/atom_probe/hit_multiplicity-group
/NXapm/ENTRY/atom_probe/hit_multiplicity/hit_multiplicity-field
hit_positions
/NXapm/ENTRY/atom_probe/ion_impact_positions/hit_positions-field
hit_rate
/NXimage_set_em_kikuchi/profiling/hit_rate-field
holder
/NXsnsevent/ENTRY/sample/holder-field
/NXsnshisto/ENTRY/sample/holder-field
hough_transformation
/NXimage_set_em_kikuchi/hough_transformation-group
i
/NXcanSAS/ENTRY/DATA/I-field
ibeam_column
/NXem/ENTRY/em_lab/IBEAM_COLUMN-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/IBEAM_COLUMN-group
/NXevent_data_em/IBEAM_COLUMN-group
ibeam_deflector
/NXem/ENTRY/em_lab/ibeam_deflector-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/ibeam_deflector-group
/NXevent_data_em/ibeam_deflector-group
id
/NXreflections/id-field
identifier
/NXmanufacturer/identifier-field
/NXsnsevent/ENTRY/sample/identifier-field
/NXsnshisto/ENTRY/sample/identifier-field
idev
/NXcanSAS/ENTRY/DATA/Idev-field
image_id
/NXimage_set_em_adf/DATA/image_id-field
/NXimage_set_em_kikuchi/DATA/image_id-field
/NXimage_set_em_se/DATA/image_id-field
image_key
/NXdetector/image_key-field
/NXtomo/entry/data/image_key-link
/NXtomo/entry/instrument/detector/image_key-field
image_set_em_adf
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_ADF-group
/NXevent_data_em/IMAGE_SET_EM_ADF-group
image_set_em_bf
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_BF-group
/NXevent_data_em/IMAGE_SET_EM_BF-group
image_set_em_bse
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_BSE-group
/NXevent_data_em/IMAGE_SET_EM_BSE-group
image_set_em_chamber
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_CHAMBER-group
/NXevent_data_em/IMAGE_SET_EM_CHAMBER-group
image_set_em_df
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_DF-group
/NXevent_data_em/IMAGE_SET_EM_DF-group
image_set_em_diffrac
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_DIFFRAC-group
/NXevent_data_em/IMAGE_SET_EM_DIFFRAC-group
image_set_em_ecci
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_ECCI-group
/NXevent_data_em/IMAGE_SET_EM_ECCI-group
image_set_em_kikuchi
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_KIKUCHI-group
/NXevent_data_em/IMAGE_SET_EM_KIKUCHI-group
image_set_em_ronchigram
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_RONCHIGRAM-group
/NXevent_data_em/IMAGE_SET_EM_RONCHIGRAM-group
image_set_em_se
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_SE-group
/NXevent_data_em/IMAGE_SET_EM_SE-group
incident_angle
/NXguide/incident_angle-field
/NXmirror/incident_angle-field
incident_beam
/NXxpcs/entry/instrument/incident_beam-group
incident_beam_divergence
/NXbeam/incident_beam_divergence-field
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence-field
incident_beam_energy
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy-field
incident_beam_size
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_beam_size-field
incident_energy
/NXbeam/incident_energy-field
/NXmpes/ENTRY/INSTRUMENT/BEAM/incident_energy-field
/NXxpcs/entry/instrument/incident_beam/incident_energy-field
incident_energy_spread
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread-field
/NXmpes/ENTRY/INSTRUMENT/BEAM/incident_energy_spread-field
/NXxpcs/entry/instrument/incident_beam/incident_energy_spread-field
incident_polarisation_stokes
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarisation_stokes-field
incident_polarization
/NXbeam/incident_polarization-field
/NXmpes/ENTRY/INSTRUMENT/BEAM/incident_polarization-field
incident_polarization_stokes
/NXbeam/incident_polarization_stokes-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarization_stokes-field
incident_polarization_type
/NXxpcs/entry/instrument/incident_beam/incident_polarization_type-field
incident_wavelength
/NXbeam/incident_wavelength-field
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength-field
incident_wavelength_spectrum
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spectrum-group
incident_wavelength_spread
/NXbeam/incident_wavelength_spread-field
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength_spread-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spread-field
incident_wavelength_weight
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weight-field
incident_wavelength_weights
/NXbeam/incident_wavelength_weights-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weights-field
incoming_beam
/NXxas/ENTRY/INSTRUMENT/incoming_beam-group
indexing
/NXimage_set_em_kikuchi/oim/indexing-group
/NXspectrum_set_em_xray/indexing-group
initial_radius
/NXapm/ENTRY/atom_probe/specimen_monitoring/initial_radius-field
input
/NXdetector/input-field
/NXiqproc/ENTRY/reduction/input-group
/NXsqom/ENTRY/reduction/input-group
insertion_device
/NXinstrument/INSERTION_DEVICE-group
instrument
/NXarchive/entry/instrument-group
/NXarpes/ENTRY/INSTRUMENT-group
/NXcanSAS/ENTRY/INSTRUMENT-group
/NXdirecttof/entry/INSTRUMENT-group
/NXellipsometry/ENTRY/INSTRUMENT-group
/NXentry/INSTRUMENT-group
/NXfluo/entry/INSTRUMENT-group
/NXindirecttof/entry/INSTRUMENT-group
/NXiqproc/ENTRY/instrument-group
/NXlauetof/entry/instrument-group
/NXmonopd/entry/INSTRUMENT-group
/NXmpes/ENTRY/INSTRUMENT-group
/NXmx/ENTRY/INSTRUMENT-group
/NXrefscan/entry/instrument-group
/NXreftof/entry/instrument-group
/NXsas/ENTRY/INSTRUMENT-group
/NXsastof/ENTRY/instrument-group
/NXscan/ENTRY/INSTRUMENT-group
/NXsnsevent/ENTRY/instrument-group
/NXsnshisto/ENTRY/instrument-group
/NXspe/ENTRY/INSTRUMENT-group
/NXsqom/ENTRY/instrument-group
/NXstxm/ENTRY/INSTRUMENT-group
/NXsubentry/INSTRUMENT-group
/NXtas/entry/INSTRUMENT-group
/NXtofnpd/entry/INSTRUMENT-group
/NXtofraw/entry/instrument-group
/NXtofsingle/entry/INSTRUMENT-group
/NXtomo/entry/instrument-group
/NXtomophase/entry/instrument-group
/NXtomoproc/entry/INSTRUMENT-group
/NXxas/ENTRY/INSTRUMENT-group
/NXxbase/entry/instrument-group
/NXxeuler/entry/instrument-group
/NXxkappa/entry/instrument-group
/NXxlaue/entry/instrument-group
/NXxlaueplate/entry/instrument-group
/NXxnb/entry/instrument-group
/NXxpcs/entry/instrument-group
/NXxrot/entry/instrument-group
instrument_1
/NXcxi_ptycho/entry_1/instrument_1-group
instrument_name
/NXapm/ENTRY/atom_probe/instrument_name-field
/NXem/ENTRY/em_lab/instrument_name-field
int_prf
/NXreflections/int_prf-field
int_prf_errors
/NXreflections/int_prf_errors-field
int_prf_var
/NXreflections/int_prf_var-field
int_sum
/NXreflections/int_sum-field
int_sum_errors
/NXreflections/int_sum_errors-field
int_sum_var
/NXreflections/int_sum_var-field
integral
/NXmonitor/integral-field
/NXmonopd/entry/MONITOR/integral-field
/NXreftof/entry/control/integral-field
/NXsas/ENTRY/MONITOR/integral-field
/NXtomophase/entry/control/integral-field
/NXxbase/entry/control/integral-field
integral_counts
/NXtofraw/entry/MONITOR/integral_counts-field
integral_log
/NXmonitor/integral_log-group
intensity
/NXimage_set_em_adf/DATA/intensity-field
/NXimage_set_em_kikuchi/DATA/intensity-field
/NXimage_set_em_se/DATA/intensity-field
/NXpeak/intensity-field
intensity_threshold
/NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/intensity_threshold-field
interior_atmosphere
/NXgrating/interior_atmosphere-field
/NXguide/interior_atmosphere-field
/NXmirror/interior_atmosphere-field
ion
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION-group
/NXspectrum_set_em_xray/indexing/PEAK/ION-group
ion_detector
/NXapm/ENTRY/atom_probe/ion_detector-group
ion_energy_profile
/NXibeam_column/ion_gun/ion_energy_profile-field
ion_filtering
/NXapm/ENTRY/atom_probe/ion_filtering-group
ion_gun
/NXibeam_column/ion_gun-group
ion_impact_positions
/NXapm/ENTRY/atom_probe/ion_impact_positions-group
ion_type
/NXion/ion_type-field
is_cylindrical
/NXcrystal/is_cylindrical-field
isotope_vector
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/isotope_vector-field
/NXion/isotope_vector-field
iupac_line_names
/NXspectrum_set_em_xray/indexing/PEAK/ION/iupac_line_names-field
k
/NXinsertion_device/k-field
/NXreflections/k-field
kappa
/NXxkappa/entry/name/kappa-link
/NXxkappa/entry/sample/kappa-field
ki_over_kf_scaling
/NXspe/ENTRY/NXSPE_info/ki_over_kf_scaling-field
l
/NXreflections/l-field
label
/NXpeak/label-field
lambda
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/lambda-field
laser_beam
/NXpulser_apm/laser_beam-group
laser_gun
/NXpulser_apm/laser_gun-group
last_fill
/NXsource/last_fill-field
last_process
/NXcalibration/last_process-field
/NXdistortion/last_process-field
/NXregistration/last_process-field
laue_group
/NXimage_set_em_kikuchi/oim/indexing/reflector/laue_group-field
layer_structure
/NXellipsometry/ENTRY/SAMPLE/layer_structure-field
layer_thickness
/NXgrating/layer_thickness-field
/NXmirror/layer_thickness-field
layout
/NXdetector/layout-field
length
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/length-field
/NXinsertion_device/length-field
/NXvelocity_selector/length-field
lens_em
/NXcollectioncolumn/LENS_EM-group
/NXcorrector_cs/LENS_EM-group
/NXebeam_column/LENS_EM-group
/NXelectronanalyser/LENS_EM-group
/NXenergydispersion/LENS_EM-group
/NXibeam_column/LENS_EM-group
/NXspindispersion/LENS_EM-group
lens_geometry
/NXxraylens/lens_geometry-field
lens_length
/NXxraylens/lens_length-field
lens_material
/NXxraylens/lens_material-field
lens_mode
/NXarpes/ENTRY/INSTRUMENT/analyser/lens_mode-field
lens_thickness
/NXxraylens/lens_thickness-field
light_source
/NXellipsometry/ENTRY/INSTRUMENT/light_source-group
line_time
/NXscanbox_em/line_time-field
load_lock_chamber
/NXapm/ENTRY/atom_probe/load_lock_chamber-group
local_electrode
/NXapm/ENTRY/atom_probe/local_electrode-group
local_name
/NXdetector/local_name-field
location
/NXapm/ENTRY/atom_probe/location-field
/NXem/ENTRY/em_lab/location-field
log
/NXsnsevent/ENTRY/DASlogs/LOG-group
/NXsnshisto/ENTRY/DASlogs/LOG-group
low_trip_value
/NXsensor/low_trip_value-field
lp
/NXreflections/lp-field
m_value
/NXfilter/m_value-field
/NXguide/m_value-field
/NXmirror/m_value-field
magnetic_field
/NXarchive/entry/sample/magnetic_field-field
/NXbending_magnet/magnetic_field-field
/NXsample/magnetic_field-field
/NXsample/magnetic_field-group
magnetic_field_env
/NXsample/magnetic_field_env-group
magnetic_field_log
/NXsample/magnetic_field_log-group
magnetic_wavelength
/NXinsertion_device/magnetic_wavelength-field
magnification
/NXcollectioncolumn/magnification-field
/NXoptical_system_em/magnification-field
manipulator
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/MANIPULATOR-group
manufacturer
/NXaperture_em/MANUFACTURER-group
/NXapm/ENTRY/atom_probe/MANUFACTURER-group
/NXcapillary/manufacturer-field
/NXchamber/MANUFACTURER-group
/NXcorrector_cs/MANUFACTURER-group
/NXebeam_column/MANUFACTURER-group
/NXebeam_column/electron_gun/MANUFACTURER-group
/NXem/ENTRY/em_lab/DETECTOR/MANUFACTURER-group
/NXem/ENTRY/em_lab/MANUFACTURER-group
/NXibeam_column/MANUFACTURER-group
/NXlens_em/MANUFACTURER-group
/NXpulser_apm/laser_gun/MANUFACTURER-group
/NXreflectron/MANUFACTURER-group
/NXstage_lab/MANUFACTURER-group
manufacturer_model
/NXdeflector/manufacturer_model-field
manufacturer_name
/NXapm/ENTRY/atom_probe/ion_detector/manufacturer_name-field
/NXdeflector/manufacturer_name-field
/NXlens_em/manufacturer_name-field
mask_material
/NXfresnel_zone_plate/mask_material-field
mask_thickness
/NXfresnel_zone_plate/mask_thickness-field
masks
/NXxpcs/entry/instrument/masks-group
mass
/NXsample/mass-field
/NXsample_component/mass-field
mass_spectrum
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum-group
mass_to_charge
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
mass_to_charge_conversion
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion-group
mass_to_charge_distribution
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution-group
mass_to_charge_range
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field
/NXion/mass_to_charge_range-field
material
/NXaperture/material-field
/NXellipsometry/ENTRY/INSTRUMENT/window/material-field
max_gap
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer/SLIT/max_gap-field
maximum_incident_angle
/NXcapillary/maximum_incident_angle-field
maximum_number_of_atoms_per_molecular_ion
/NXapm/ENTRY/atom_probe/ranging/maximum_number_of_atoms_per_molecular_ion-field
maximum_value
/NXlog/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/maximum_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/maximum_value-field
mean_angular_deviation
/NXimage_set_em_kikuchi/oim/indexing/mean_angular_deviation-field
measured_data
/NXellipsometry/ENTRY/SAMPLE/measured_data-field
measurement
/NXem/ENTRY/measurement-group
/NXsensor/measurement-field
medium
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/medium-field
medium_refractive_indices
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/medium_refractive_indices-field
method
/NXem/ENTRY/SAMPLE/method-field
miller_indices
/NXimage_set_em_kikuchi/oim/indexing/reflector/miller_indices-field
min_bands
/NXimage_set_em_kikuchi/oim/indexing/min_bands-field
min_intensity
/NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/min_intensity-field
minimum_value
/NXlog/minimum_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/minimum_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/minimum_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/minimum_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/minimum_value-field
mirror
/NXinstrument/MIRROR-group
mode
/NXcollectioncolumn/mode-field
/NXfluo/entry/MONITOR/mode-field
/NXimage_set_em_kikuchi/binning/mode-field
/NXimage_set_em_kikuchi/oim/band_detection/mode-field
/NXimage_set_em_kikuchi/oim/indexing/mode-field
/NXlauetof/entry/control/mode-field
/NXmonitor/mode-field
/NXmonopd/entry/MONITOR/mode-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/mode-field
/NXrefscan/entry/control/mode-field
/NXreftof/entry/control/mode-field
/NXsas/ENTRY/MONITOR/mode-field
/NXsastof/ENTRY/control/mode-field
/NXsnsevent/ENTRY/MONITOR/mode-field
/NXsnshisto/ENTRY/MONITOR/mode-field
/NXsource/mode-field
/NXtas/entry/MONITOR/mode-field
/NXtofnpd/entry/MONITOR/mode-field
/NXtofraw/entry/MONITOR/mode-field
/NXtofsingle/entry/MONITOR/mode-field
/NXxas/ENTRY/DATA/mode-field
/NXxas/ENTRY/MONITOR/mode-field
/NXxbase/entry/control/mode-field
model
/NXapm/ENTRY/atom_probe/ion_detector/model-field
/NXellipsometry/ENTRY/INSTRUMENT/model-field
/NXlens_em/model-field
/NXmanufacturer/model-field
/NXsensor/model-field
moderator
/NXinstrument/MODERATOR-group
/NXsnsevent/ENTRY/instrument/moderator-group
/NXsnshisto/ENTRY/instrument/moderator-group
module_offset
/NXdetector_module/module_offset-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset-field
momentum_calibration
/NXmpes/ENTRY/PROCESS/momentum_calibration-group
momentum_resolution
/NXelectronanalyser/momentum_resolution-field
monitor
/NXapm/ENTRY/MONITOR-group
/NXcxi_ptycho/entry_1/instrument_1/MONITOR-group
/NXem/ENTRY/MONITOR-group
/NXentry/MONITOR-group
/NXfluo/entry/MONITOR-group
/NXmonopd/entry/MONITOR-group
/NXsas/ENTRY/MONITOR-group
/NXscan/ENTRY/MONITOR-group
/NXsnsevent/ENTRY/MONITOR-group
/NXsnshisto/ENTRY/MONITOR-group
/NXsubentry/MONITOR-group
/NXtas/entry/MONITOR-group
/NXtofnpd/entry/MONITOR-group
/NXtofraw/entry/MONITOR-group
/NXtofsingle/entry/MONITOR-group
/NXxas/ENTRY/MONITOR-group
monochromator
/NXarpes/ENTRY/INSTRUMENT/monochromator-group
/NXfluo/entry/INSTRUMENT/monochromator-group
/NXinstrument/MONOCHROMATOR-group
/NXrefscan/entry/instrument/monochromator-group
/NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR-group
/NXstxm/ENTRY/INSTRUMENT/monochromator-group
/NXtas/entry/INSTRUMENT/monochromator-group
/NXxas/ENTRY/INSTRUMENT/monochromator-group
/NXxbase/entry/instrument/monochromator-group
mosaic_horizontal
/NXcrystal/mosaic_horizontal-field
mosaic_vertical
/NXcrystal/mosaic_vertical-field
naive_point_cloud_density_map
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map-group
name
/NXaperture_em/name-field
/NXapm/ENTRY/atom_probe/ion_detector/name-field
/NXapm/ENTRY/atom_probe/local_electrode/name-field
/NXapm/ENTRY/operator/name-field
/NXapm/ENTRY/specimen/name-field
/NXarchive/entry/instrument/SOURCE/name-field
/NXarchive/entry/instrument/name-field
/NXarchive/entry/sample/name-field
/NXarchive/entry/user/name-field
/NXarpes/ENTRY/INSTRUMENT/SOURCE/name-field
/NXarpes/ENTRY/SAMPLE/name-field
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/name-field
/NXcanSAS/ENTRY/PROCESS/name-field
/NXcanSAS/ENTRY/SAMPLE/name-field
/NXchamber/name-field
/NXcontainer/name-field
/NXcorrector_cs/name-field
/NXcxi_ptycho/entry_1/instrument_1/source_1/name-field
/NXcxi_ptycho/sample_1/name-field
/NXdeflector/name-field
/NXebeam_column/electron_gun/name-field
/NXelectronanalyser/name-field
/NXellipsometry/ENTRY/operator/name-field
/NXem/ENTRY/SAMPLE/name-field
/NXem/ENTRY/operator/name-field
/NXenvironment/name-field
/NXfluo/entry/INSTRUMENT/SOURCE/name-field
/NXfluo/entry/SAMPLE/name-field
/NXibeam_column/ion_gun/name-field
/NXinstrument/name-field
/NXion/name-field
/NXiqproc/ENTRY/SAMPLE/name-field
/NXiqproc/ENTRY/instrument/SOURCE/name-field
/NXiqproc/ENTRY/instrument/name-field
/NXlauetof/entry/name-group
/NXlauetof/entry/sample/name-field
/NXlens_em/name-field
/NXmanipulator/name-field
/NXmanufacturer/name-field
/NXmonopd/entry/INSTRUMENT/SOURCE/name-field
/NXmonopd/entry/SAMPLE/name-field
/NXmpes/ENTRY/INSTRUMENT/SOURCE/name-field
/NXmpes/ENTRY/SAMPLE/name-field
/NXmx/ENTRY/INSTRUMENT/name-field
/NXmx/ENTRY/SAMPLE/name-field
/NXmx/ENTRY/SOURCE/name-field
/NXpositioner/name-field
/NXpulser_apm/laser_gun/name-field
/NXreflectron/name-field
/NXrefscan/entry/instrument/SOURCE/name-field
/NXrefscan/entry/sample/name-field
/NXreftof/entry/instrument/name-field
/NXreftof/entry/sample/name-field
/NXsample/name-field
/NXsample_component/name-field
/NXsas/ENTRY/INSTRUMENT/SOURCE/name-field
/NXsas/ENTRY/INSTRUMENT/name-field
/NXsas/ENTRY/SAMPLE/name-field
/NXsastof/ENTRY/instrument/name-field
/NXsastof/ENTRY/instrument/source/name-field
/NXsastof/ENTRY/sample/name-field
/NXsensor/name-field
/NXsnsevent/ENTRY/USER/name-field
/NXsnsevent/ENTRY/instrument/SNS/name-field
/NXsnsevent/ENTRY/instrument/name-field
/NXsnsevent/ENTRY/sample/name-field
/NXsnshisto/ENTRY/USER/name-field
/NXsnshisto/ENTRY/instrument/SNS/name-field
/NXsnshisto/ENTRY/instrument/name-field
/NXsnshisto/ENTRY/sample/name-field
/NXsource/name-field
/NXspe/ENTRY/INSTRUMENT/name-field
/NXspectrum_set_em_xray/indexing/composition_map/name-field
/NXsqom/ENTRY/SAMPLE/name-field
/NXsqom/ENTRY/instrument/SOURCE/name-field
/NXsqom/ENTRY/instrument/name-field
/NXstage_lab/name-field
/NXstxm/ENTRY/INSTRUMENT/SOURCE/name-field
/NXtas/entry/INSTRUMENT/SOURCE/name-field
/NXtas/entry/SAMPLE/name-field
/NXtofnpd/entry/SAMPLE/name-field
/NXtofnpd/entry/user/name-field
/NXtofraw/entry/SAMPLE/name-field
/NXtofraw/entry/user/name-field
/NXtofsingle/entry/SAMPLE/name-field
/NXtofsingle/entry/user/name-field
/NXtomo/entry/instrument/SOURCE/name-field
/NXtomo/entry/sample/name-field
/NXtomophase/entry/instrument/SOURCE/name-field
/NXtomophase/entry/sample/name-field
/NXtomoproc/entry/INSTRUMENT/SOURCE/name-field
/NXtomoproc/entry/SAMPLE/name-field
/NXuser/name-field
/NXxas/ENTRY/INSTRUMENT/SOURCE/name-field
/NXxas/ENTRY/SAMPLE/name-field
/NXxasproc/ENTRY/SAMPLE/name-field
/NXxbase/entry/instrument/source/name-field
/NXxbase/entry/sample/name-field
/NXxeuler/entry/name-group
/NXxkappa/entry/name-group
/NXxnb/entry/name-group
/NXxrot/entry/name-group
nature
/NXsnsevent/ENTRY/sample/nature-field
/NXsnshisto/ENTRY/sample/nature-field
/NXtofraw/entry/SAMPLE/nature-field
/NXtofsingle/entry/SAMPLE/nature-field
nominal
/NXmonitor/nominal-field
note
/NXaperture/NOTE-group
/NXcanSAS/ENTRY/PROCESS/NOTE-group
/NXenvironment/NOTE-group
/NXprocess/NOTE-group
/NXxpcs/entry/NOTE-group
notes
/NXentry/notes-group
/NXsnsevent/ENTRY/notes-field
/NXsnshisto/ENTRY/notes-field
/NXsource/notes-group
/NXsubentry/notes-group
num
/NXvelocity_selector/num-field
number
/NXfermi_chopper/number-field
number_of_bunches
/NXsource/number_of_bunches-field
number_of_cycles
/NXdetector/number_of_cycles-field
number_of_frames_averaged
/NXimage_set_em_se/number_of_frames_averaged-field
number_of_ion_types
/NXapm/ENTRY/atom_probe/ranging/number_of_ion_types-field
number_of_lenses
/NXxraylens/number_of_lenses-field
number_of_reflectors
/NXimage_set_em_kikuchi/oim/indexing/reflector/number_of_reflectors-field
number_of_runs
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/number_of_runs-field
number_sections
/NXguide/number_sections-field
nxspe_info
/NXspe/ENTRY/NXSPE_info-group
observed_frame
/NXreflections/observed_frame-field
observed_frame_errors
/NXreflections/observed_frame_errors-field
observed_frame_var
/NXreflections/observed_frame_var-field
observed_phi
/NXreflections/observed_phi-field
observed_phi_errors
/NXreflections/observed_phi_errors-field
observed_phi_var
/NXreflections/observed_phi_var-field
observed_px_x
/NXreflections/observed_px_x-field
observed_px_x_errors
/NXreflections/observed_px_x_errors-field
observed_px_x_var
/NXreflections/observed_px_x_var-field
observed_px_y
/NXreflections/observed_px_y-field
observed_px_y_errors
/NXreflections/observed_px_y_errors-field
observed_px_y_var
/NXreflections/observed_px_y_var-field
observed_x
/NXreflections/observed_x-field
observed_x_errors
/NXreflections/observed_x_errors-field
observed_x_var
/NXreflections/observed_x_var-field
observed_y
/NXreflections/observed_y-field
observed_y_errors
/NXreflections/observed_y_errors-field
observed_y_var
/NXreflections/observed_y_var-field
odd_layer_density
/NXmirror/odd_layer_density-field
odd_layer_material
/NXmirror/odd_layer_material-field
off_geometry
/NXbeam_stop/OFF_GEOMETRY-group
/NXbending_magnet/OFF_GEOMETRY-group
/NXcollimator/OFF_GEOMETRY-group
/NXcrystal/OFF_GEOMETRY-group
/NXdisk_chopper/OFF_GEOMETRY-group
/NXfermi_chopper/OFF_GEOMETRY-group
/NXfilter/OFF_GEOMETRY-group
/NXgrating/OFF_GEOMETRY-group
/NXguide/OFF_GEOMETRY-group
/NXinsertion_device/OFF_GEOMETRY-group
/NXmirror/OFF_GEOMETRY-group
/NXmoderator/OFF_GEOMETRY-group
/NXmonitor/OFF_GEOMETRY-group
/NXmonochromator/OFF_GEOMETRY-group
/NXsample/OFF_GEOMETRY-group
/NXsensor/OFF_GEOMETRY-group
/NXsolid_geometry/OFF_GEOMETRY-group
/NXsource/OFF_GEOMETRY-group
/NXvelocity_selector/OFF_GEOMETRY-group
/NXxraylens/OFF_GEOMETRY-group
offset
/NXcalibration/offset-field
/NXdata/offset-field
oim
/NXimage_set_em_kikuchi/oim-group
operation
/NXcsg/operation-field
operation_mode
/NXapm/ENTRY/operation_mode-field
operator
/NXapm/ENTRY/operator-group
/NXellipsometry/ENTRY/operator-group
/NXem/ENTRY/operator-group
optical_excitation
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation-group
optical_system_em
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/OPTICAL_SYSTEM_EM-group
/NXevent_data_em/OPTICAL_SYSTEM_EM-group
/NXimage_set_em_se/OPTICAL_SYSTEM_EM-group
orcid
/NXapm/ENTRY/operator/orcid-field
/NXellipsometry/ENTRY/operator/orcid-field
/NXem/ENTRY/operator/orcid-field
/NXuser/ORCID-field
order_no
/NXcrystal/order_no-field
orientation
/NXcontainer/orientation-group
/NXgeometry/ORIENTATION-group
/NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation-group
orientation_angle
/NXellipsometry/ENTRY/INSTRUMENT/window/orientation_angle-field
orientation_matrix
/NXcrystal/orientation_matrix-field
/NXfilter/orientation_matrix-field
/NXlauetof/entry/sample/orientation_matrix-field
/NXsample/orientation_matrix-field
/NXsample_component/orientation_matrix-field
/NXtas/entry/SAMPLE/orientation_matrix-field
/NXxbase/entry/sample/orientation_matrix-field
origin
/NXsnsevent/ENTRY/instrument/APERTURE/origin-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin-group
original_axis
/NXcalibration/original_axis-field
original_centre
/NXdistortion/original_centre-field
original_points
/NXdistortion/original_points-field
other_detector
/NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/other_detector-field
other_material
/NXellipsometry/ENTRY/INSTRUMENT/window/other_material-field
outer_diameter
/NXfresnel_zone_plate/outer_diameter-field
outermost_zone_width
/NXfresnel_zone_plate/outermost_zone_width-field
output
/NXiqproc/ENTRY/reduction/output-group
/NXsqom/ENTRY/reduction/output-group
overlaps
/NXreflections/overlaps-field
packing_fraction
/NXcontainer/packing_fraction-field
pair_separation
/NXdisk_chopper/pair_separation-field
parameter
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/parameter-group
/NXapm/ENTRY/atom_probe/reconstruction/parameter-group
parameters
/NXentry/PARAMETERS-group
/NXquadric/parameters-field
/NXsubentry/PARAMETERS-group
/NXtomoproc/entry/reconstruction/parameters-group
/NXxasproc/ENTRY/XAS_data_reduction/parameters-group
parent
/NXregion/parent-field
parent_mask
/NXregion/parent_mask-field
partiality
/NXreflections/partiality-field
pass_energy
/NXarpes/ENTRY/INSTRUMENT/analyser/pass_energy-field
/NXenergydispersion/pass_energy-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field
path_length
/NXsample/path_length-field
path_length_window
/NXsample/path_length_window-field
pattern_center
/NXimage_set_em_kikuchi/oim/pattern_center-field
pattern_quality
/NXimage_set_em_kikuchi/oim/pattern_quality-field
peak
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PEAK-group
/NXspectrum_set_em_xray/indexing/PEAK-group
peak_identification
/NXapm/ENTRY/atom_probe/ranging/peak_identification-group
peak_model
/NXpeak/peak_model-field
peak_search_and_deconvolution
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution-group
peaks
/NXspectrum_set_em_xray/indexing/composition_map/peaks-field
period
/NXgrating/period-field
/NXsource/period-field
phase
/NXdisk_chopper/phase-field
/NXinsertion_device/phase-field
phase_identifier
/NXimage_set_em_kikuchi/oim/indexing/phase_identifier-field
/NXimage_set_em_kikuchi/oim/indexing/reflector/phase_identifier-field
phase_name
/NXimage_set_em_kikuchi/oim/indexing/reflector/phase_name-field
phi
/NXxeuler/entry/name/phi-link
/NXxeuler/entry/sample/phi-field
/NXxkappa/entry/name/phi-link
/NXxkappa/entry/sample/phi-field
photon_energy
/NXspectrum_set_em_xray/DATA/photon_energy-field
pinhole_position
/NXpulser_apm/laser_beam/pinhole_position-group
pitch
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/pitch-field
/NXcanSAS/ENTRY/SAMPLE/pitch-field
pixel_id
/NXsnsevent/ENTRY/instrument/DETECTOR/pixel_id-field
/NXsnshisto/ENTRY/DATA/pixel_id-link
/NXsnshisto/ENTRY/instrument/DETECTOR/pixel_id-field
pixel_mask
/NXdetector/pixel_mask-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask-field
pixel_mask_applied
/NXdetector/pixel_mask_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask_applied-field
pixel_time
/NXscanbox_em/pixel_time-field
plot
/NXellipsometry/ENTRY/plot-group
point_group
/NXsample/point_group-field
/NXsample_component/point_group-field
poison_depth
/NXmoderator/poison_depth-field
poison_material
/NXmoderator/poison_material-field
polar
/NXspe/ENTRY/data/polar-field
polar_angle
/NXcrystal/polar_angle-field
/NXdetector/polar_angle-field
/NXindirecttof/entry/INSTRUMENT/analyser/polar_angle-field
/NXlauetof/entry/instrument/detector/polar_angle-field
/NXmonopd/entry/DATA/polar_angle-link
/NXmonopd/entry/INSTRUMENT/DETECTOR/polar_angle-field
/NXreflections/polar_angle-field
/NXrefscan/entry/data/polar_angle-link
/NXrefscan/entry/instrument/DETECTOR/polar_angle-field
/NXreftof/entry/instrument/detector/polar_angle-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field
/NXsastof/ENTRY/instrument/detector/polar_angle-field
/NXsnsevent/ENTRY/instrument/DETECTOR/polar_angle-field
/NXsnshisto/ENTRY/instrument/DETECTOR/polar_angle-field
/NXtas/entry/INSTRUMENT/DETECTOR/polar_angle-field
/NXtas/entry/INSTRUMENT/analyser/polar_angle-field
/NXtas/entry/SAMPLE/polar_angle-field
/NXtofnpd/entry/INSTRUMENT/detector/polar_angle-field
/NXtofraw/entry/instrument/detector/polar_angle-field
/NXtofsingle/entry/INSTRUMENT/detector/polar_angle-field
/NXxeuler/entry/instrument/detector/polar_angle-field
/NXxeuler/entry/name/polar_angle-link
/NXxkappa/entry/instrument/detector/polar_angle-field
/NXxkappa/entry/name/polar_angle-link
/NXxnb/entry/instrument/detector/polar_angle-field
/NXxnb/entry/name/polar_angle-link
/NXxrot/entry/instrument/detector/polar_angle-field
polar_width
/NXspe/ENTRY/data/polar_width-field
polarizer
/NXinstrument/POLARIZER-group
/NXsnsevent/ENTRY/instrument/POLARIZER-group
/NXsnshisto/ENTRY/instrument/POLARIZER-group
poles
/NXinsertion_device/poles-field
position
/NXenvironment/position-group
/NXpeak/position-field
/NXstage_lab/position-field
position_x
/NXxpcs/entry/sample/position_x-group
position_y
/NXxpcs/entry/sample/position_y-group
position_z
/NXxpcs/entry/sample/position_z-group
positioner
/NXinstrument/POSITIONER-group
/NXmanipulator/POSITIONER-group
/NXsample/POSITIONER-group
/NXsnsevent/ENTRY/DASlogs/POSITIONER-group
/NXsnshisto/ENTRY/DASlogs/POSITIONER-group
/NXstage_lab/POSITIONER-group
power
/NXinsertion_device/power-field
/NXpulser_apm/laser_gun/power-field
/NXsource/power-field
pre_sample_flightpath
/NXentry/pre_sample_flightpath-field
/NXsubentry/pre_sample_flightpath-field
/NXtofnpd/entry/pre_sample_flightpath-field
/NXtofraw/entry/pre_sample_flightpath-field
/NXtofsingle/entry/pre_sample_flightpath-field
predicted_frame
/NXreflections/predicted_frame-field
predicted_phi
/NXreflections/predicted_phi-field
predicted_px_x
/NXreflections/predicted_px_x-field
predicted_px_y
/NXreflections/predicted_px_y-field
predicted_x
/NXreflections/predicted_x-field
predicted_y
/NXreflections/predicted_y-field
preparation_date
/NXapm/ENTRY/specimen/preparation_date-field
/NXarchive/entry/sample/preparation_date-field
/NXellipsometry/ENTRY/SAMPLE/preparation_date-field
/NXem/ENTRY/SAMPLE/preparation_date-field
/NXmpes/ENTRY/SAMPLE/preparation_date-field
/NXsample/preparation_date-field
preparation_description
/NXmpes/ENTRY/SAMPLE/preparation_description-group
preset
/NXfluo/entry/MONITOR/preset-field
/NXlauetof/entry/control/preset-field
/NXmonitor/preset-field
/NXmonopd/entry/MONITOR/preset-field
/NXrefscan/entry/control/preset-field
/NXreftof/entry/control/preset-field
/NXsas/ENTRY/MONITOR/preset-field
/NXsastof/ENTRY/control/preset-field
/NXtas/entry/MONITOR/preset-field
/NXtofnpd/entry/MONITOR/preset-field
/NXtofraw/entry/MONITOR/preset-field
/NXtofsingle/entry/MONITOR/preset-field
/NXxas/ENTRY/MONITOR/preset-field
/NXxbase/entry/control/preset-field
pressure
/NXapm/ENTRY/atom_probe/control_software/analysis_chamber/pressure-field
/NXarchive/entry/sample/pressure-field
/NXsample/pressure-field
prf_cc
/NXreflections/prf_cc-field
probe
/NXarchive/entry/instrument/SOURCE/probe-field
/NXarpes/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXcxi_ptycho/entry_1/instrument_1/source_1/probe-field
/NXebeam_column/electron_gun/probe-field
/NXfluo/entry/INSTRUMENT/SOURCE/probe-field
/NXibeam_column/ion_gun/probe-group
/NXiqproc/ENTRY/instrument/SOURCE/probe-field
/NXmonopd/entry/INSTRUMENT/SOURCE/probe-field
/NXmpes/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXrefscan/entry/instrument/SOURCE/probe-field
/NXsas/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXsastof/ENTRY/instrument/source/probe-field
/NXsnsevent/ENTRY/instrument/SNS/probe-field
/NXsnshisto/ENTRY/instrument/SNS/probe-field
/NXsource/probe-field
/NXsqom/ENTRY/instrument/SOURCE/probe-field
/NXstxm/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXtas/entry/INSTRUMENT/SOURCE/probe-field
/NXtomo/entry/instrument/SOURCE/probe-field
/NXtomophase/entry/instrument/SOURCE/probe-field
/NXtomoproc/entry/INSTRUMENT/SOURCE/probe-field
/NXxas/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXxbase/entry/instrument/source/probe-field
process
/NXcanSAS/ENTRY/PROCESS-group
/NXentry/PROCESS-group
/NXimage_set_em_adf/PROCESS-group
/NXimage_set_em_bf/PROCESS-group
/NXimage_set_em_bse/PROCESS-group
/NXimage_set_em_chamber/PROCESS-group
/NXimage_set_em_df/PROCESS-group
/NXimage_set_em_diffrac/PROCESS-group
/NXimage_set_em_ecci/PROCESS-group
/NXimage_set_em_ronchigram/PROCESS-group
/NXinteraction_vol_em/PROCESS-group
/NXmpes/ENTRY/PROCESS-group
/NXspectrum_set_em_auger/PROCESS-group
/NXspectrum_set_em_cathodolum/PROCESS-group
/NXspectrum_set_em_eels/PROCESS-group
/NXsubentry/PROCESS-group
/NXxpcs/PROCESS-group
profile
/NXmx/ENTRY/INSTRUMENT/BEAM/profile-field
profiling
/NXimage_set_em_kikuchi/profiling-group
program
/NXapm/ENTRY/atom_probe/hit_multiplicity/program-field
/NXapm/ENTRY/atom_probe/ion_filtering/program-field
/NXapm/ENTRY/atom_probe/ion_impact_positions/program-field
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/program-field
/NXapm/ENTRY/atom_probe/ranging/background_quantification/program-field
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/program-field
/NXapm/ENTRY/atom_probe/ranging/peak_identification/program-field
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/program-field
/NXapm/ENTRY/atom_probe/ranging/program-field
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/program-field
/NXapm/ENTRY/atom_probe/reconstruction/program-field
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/program-field
/NXapm/ENTRY/program-field
/NXarchive/entry/program-field
/NXellipsometry/ENTRY/acquisition_program/program-field
/NXem/ENTRY/program-field
/NXenvironment/program-field
/NXimage_set_em_adf/PROCESS/program-field
/NXiqproc/ENTRY/reduction/program-field
/NXprocess/program-field
/NXspectrum_set_em_xray/indexing/composition_map/program-field
/NXspectrum_set_em_xray/indexing/program-field
/NXsqom/ENTRY/reduction/program-field
/NXtomoproc/entry/reconstruction/program-field
/NXxasproc/ENTRY/XAS_data_reduction/program-field
program_name
/NXentry/program_name-field
/NXspe/ENTRY/program_name-field
/NXsubentry/program_name-field
projection
/NXcollectioncolumn/projection-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field
protocol_name
/NXapm/ENTRY/atom_probe/reconstruction/protocol_name-field
proton_charge
/NXsnsevent/ENTRY/proton_charge-field
/NXsnshisto/ENTRY/proton_charge-field
psi
/NXspe/ENTRY/NXSPE_info/psi-field
pulse_energy
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/pulse_energy-field
/NXpulser_apm/laser_gun/pulse_energy-field
pulse_fraction
/NXapm/ENTRY/atom_probe/pulser/pulse_fraction-field
/NXpulser_apm/pulse_fraction-field
pulse_frequency
/NXapm/ENTRY/atom_probe/pulser/pulse_frequency-field
/NXpulser_apm/pulse_frequency-field
pulse_height
/NXevent_data/pulse_height-field
pulse_id
/NXapm/ENTRY/atom_probe/hit_multiplicity/pulse_id-field
pulse_mode
/NXapm/ENTRY/atom_probe/pulser/pulse_mode-field
/NXpulser_apm/pulse_mode-field
pulse_shape
/NXmoderator/pulse_shape-group
/NXsource/pulse_shape-group
pulse_time
/NXsnsevent/ENTRY/EVENT_DATA/pulse_time-link
/NXsnsevent/ENTRY/instrument/DETECTOR/pulse_time-field
pulse_width
/NXsource/pulse_width-field
pulsed_voltage
/NXapm/ENTRY/atom_probe/pulser/pulsed_voltage-field
/NXpulser_apm/pulsed_voltage-field
pulser
/NXapm/ENTRY/atom_probe/pulser-group
pulses_since_last_ion
/NXapm/ENTRY/atom_probe/hit_multiplicity/pulses_since_last_ion-field
pump
/NXem/ENTRY/em_lab/PUMP-group
q
/NXcanSAS/ENTRY/DATA/Q-field
qdev
/NXcanSAS/ENTRY/DATA/Qdev-field
qh
/NXtas/entry/DATA/qh-link
/NXtas/entry/SAMPLE/qh-field
qk
/NXtas/entry/DATA/qk-link
/NXtas/entry/SAMPLE/qk-field
ql
/NXtas/entry/DATA/ql-link
/NXtas/entry/SAMPLE/ql-field
qmean
/NXcanSAS/ENTRY/DATA/Qmean-field
quadric
/NXsolid_geometry/QUADRIC-group
qx
/NXiqproc/ENTRY/DATA/qx-field
/NXsqom/ENTRY/DATA/qx-field
qy
/NXiqproc/ENTRY/DATA/qy-field
/NXsqom/ENTRY/DATA/qy-field
qz
/NXsqom/ENTRY/DATA/qz-field
r_slit
/NXfermi_chopper/r_slit-field
radiation
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/radiation-field
radius
/NXdisk_chopper/radius-field
/NXfermi_chopper/radius-field
/NXvelocity_selector/radius-field
range
/NXmonitor/range-field
range_increment
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/range_increment-field
range_minmax
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/range_minmax-field
ranging
/NXapm/ENTRY/atom_probe/ranging-group
ratio
/NXdisk_chopper/ratio-field
raw
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA/raw-field
raw_file
/NXtomoproc/entry/reconstruction/parameters/raw_file-field
/NXxasproc/ENTRY/XAS_data_reduction/parameters/raw_file-field
raw_frames
/NXsnsevent/ENTRY/raw_frames-field
/NXsnshisto/ENTRY/raw_frames-field
raw_time_of_flight
/NXdetector/raw_time_of_flight-field
raw_tof
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/raw_tof-field
raw_value
/NXlog/raw_value-field
/NXpositioner/raw_value-field
rdeform_field
/NXdistortion/rdeform_field-field
read_bfield_current
/NXseparator/read_Bfield_current-group
/NXspin_rotator/read_Bfield_current-group
read_bfield_voltage
/NXseparator/read_Bfield_voltage-group
/NXspin_rotator/read_Bfield_voltage-group
read_current
/NXelectrostatic_kicker/read_current-group
/NXmagnetic_kicker/read_current-group
/NXquadrupole_magnet/read_current-group
/NXsolenoid_magnet/read_current-group
read_efield_current
/NXseparator/read_Efield_current-group
/NXspin_rotator/read_Efield_current-group
read_efield_voltage
/NXseparator/read_Efield_voltage-group
/NXspin_rotator/read_Efield_voltage-group
read_voltage
/NXelectrostatic_kicker/read_voltage-group
/NXmagnetic_kicker/read_voltage-group
/NXquadrupole_magnet/read_voltage-group
/NXsolenoid_magnet/read_voltage-group
real_time
/NXdetector/real_time-field
reconstructed_positions
/NXapm/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
reconstruction
/NXapm/ENTRY/atom_probe/reconstruction-group
/NXtomoproc/entry/reconstruction-group
reduction
/NXiqproc/ENTRY/reduction-group
/NXsqom/ENTRY/reduction-group
reference_data
/NXellipsometry/ENTRY/INSTRUMENT/window/reference_data-group
reference_measurement
/NXcontainer/reference_measurement-link
reference_plane
/NXbeam/TRANSFORMATIONS/reference_plane-field
reference_sample
/NXellipsometry/ENTRY/INSTRUMENT/window/reference_data/reference_sample-field
reference_wavelength
/NXellipsometry/ENTRY/INSTRUMENT/window/reference_data/reference_wavelength-field
reflection
/NXcrystal/reflection-field
/NXpolarizer/reflection-field
reflection_id
/NXreflections/reflection_id-field
reflectivity
/NXcrystal/reflectivity-group
/NXguide/reflectivity-group
/NXmirror/reflectivity-group
reflector
/NXimage_set_em_kikuchi/oim/indexing/reflector-group
reflectron
/NXapm/ENTRY/atom_probe/REFLECTRON-group
region_origin
/NXarpes/ENTRY/INSTRUMENT/analyser/region_origin-field
region_size
/NXarpes/ENTRY/INSTRUMENT/analyser/region_size-field
relative_molecular_mass
/NXcontainer/relative_molecular_mass-field
/NXsample/relative_molecular_mass-field
/NXsample_component/relative_molecular_mass-field
release_date
/NXarchive/entry/release_date-field
requested_pixel_time
/NXscanbox_em/requested_pixel_time-field
resolution
/NXimage_set_em_kikuchi/hough_transformation/resolution-field
revision
/NXarchive/entry/revision-field
/NXentry/revision-field
/NXsubentry/revision-field
revolution
/NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/revolution-field
roi
/NXimage_set_em_se/roi-field
role
/NXapm/ENTRY/operator/role-field
/NXarchive/entry/user/role-field
/NXem/ENTRY/operator/role-field
/NXsnsevent/ENTRY/USER/role-field
/NXsnshisto/ENTRY/USER/role-field
/NXuser/role-field
roll
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/roll-field
/NXcanSAS/ENTRY/SAMPLE/roll-field
rotating_element
/NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/rotating_element-field
rotation
/NXscanbox_em/rotation-field
/NXstage_lab/rotation-field
rotation_angle
/NXmonopd/entry/SAMPLE/rotation_angle-field
/NXrefscan/entry/data/rotation_angle-link
/NXrefscan/entry/sample/rotation_angle-field
/NXreftof/entry/sample/rotation_angle-field
/NXsample/rotation_angle-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/rotation_angle-field
/NXsastof/ENTRY/instrument/detector/rotation_angle-field
/NXscan/ENTRY/DATA/rotation_angle-link
/NXscan/ENTRY/SAMPLE/rotation_angle-field
/NXspe/ENTRY/SAMPLE/rotation_angle-field
/NXstxm/ENTRY/SAMPLE/rotation_angle-field
/NXtas/entry/INSTRUMENT/analyser/rotation_angle-field
/NXtas/entry/INSTRUMENT/monochromator/rotation_angle-field
/NXtas/entry/SAMPLE/rotation_angle-field
/NXtomo/entry/data/rotation_angle-link
/NXtomo/entry/sample/rotation_angle-field
/NXtomophase/entry/data/rotation_angle-link
/NXtomophase/entry/sample/rotation_angle-field
/NXxeuler/entry/name/rotation_angle-link
/NXxeuler/entry/sample/rotation_angle-field
/NXxkappa/entry/name/rotation_angle-link
/NXxkappa/entry/sample/rotation_angle-field
/NXxnb/entry/name/rotation_angle-link
/NXxnb/entry/sample/rotation_angle-field
/NXxrot/entry/name/rotation_angle-link
/NXxrot/entry/sample/rotation_angle-field
rotation_angle_step
/NXxrot/entry/sample/rotation_angle_step-field
rotation_speed
/NXdirecttof/entry/INSTRUMENT/disk_chopper/rotation_speed-field
/NXdirecttof/entry/INSTRUMENT/fermi_chopper/rotation_speed-field
/NXdisk_chopper/rotation_speed-field
/NXfermi_chopper/rotation_speed-field
/NXvelocity_selector/rotation_speed-field
roughening_pump
/NXapm/ENTRY/atom_probe/roughening_pump-group
run
/NXcanSAS/ENTRY/run-field
run_control
/NXsensor/run_control-field
run_cycle
/NXarchive/entry/run_cycle-field
/NXentry/run_cycle-field
/NXsubentry/run_cycle-field
run_number
/NXapm/ENTRY/run_number-field
/NXsnsevent/ENTRY/run_number-field
/NXsnshisto/ENTRY/run_number-field
/NXtofraw/entry/run_number-field
sample
/NXarchive/entry/sample-group
/NXarpes/ENTRY/SAMPLE-group
/NXcanSAS/ENTRY/SAMPLE-group
/NXellipsometry/ENTRY/SAMPLE-group
/NXem/ENTRY/SAMPLE-group
/NXentry/SAMPLE-group
/NXfluo/entry/SAMPLE-group
/NXiqproc/ENTRY/SAMPLE-group
/NXlauetof/entry/sample-group
/NXmonopd/entry/SAMPLE-group
/NXmpes/ENTRY/SAMPLE-group
/NXmx/ENTRY/SAMPLE-group
/NXrefscan/entry/sample-group
/NXreftof/entry/sample-group
/NXsas/ENTRY/SAMPLE-group
/NXsastof/ENTRY/sample-group
/NXscan/ENTRY/SAMPLE-group
/NXsnsevent/ENTRY/sample-group
/NXsnshisto/ENTRY/sample-group
/NXspe/ENTRY/SAMPLE-group
/NXsqom/ENTRY/SAMPLE-group
/NXstxm/ENTRY/SAMPLE-group
/NXsubentry/SAMPLE-group
/NXtas/entry/SAMPLE-group
/NXtofnpd/entry/SAMPLE-group
/NXtofraw/entry/SAMPLE-group
/NXtofsingle/entry/SAMPLE-group
/NXtomo/entry/sample-group
/NXtomophase/entry/instrument/sample-group
/NXtomophase/entry/sample-group
/NXtomoproc/entry/SAMPLE-group
/NXxas/ENTRY/SAMPLE-group
/NXxasproc/ENTRY/SAMPLE-group
/NXxbase/entry/sample-group
/NXxeuler/entry/sample-group
/NXxkappa/entry/sample-group
/NXxnb/entry/sample-group
/NXxpcs/entry/sample-group
/NXxrot/entry/sample-group
sample_1
/NXcxi_ptycho/sample_1-group
sample_bias
/NXmanipulator/sample_bias-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/MANIPULATOR/sample_bias-field
sample_component
/NXsample/SAMPLE_COMPONENT-group
/NXsample/sample_component-field
sample_history
/NXapm/ENTRY/specimen/sample_history-field
/NXellipsometry/ENTRY/SAMPLE/sample_history-field
/NXem/ENTRY/SAMPLE/sample_history-field
/NXmpes/ENTRY/SAMPLE/sample_history-group
sample_id
/NXarchive/entry/sample/sample_id-field
sample_name
/NXellipsometry/ENTRY/SAMPLE/sample_name-field
sample_orientation
/NXsample/sample_orientation-field
/NXsample_component/sample_orientation-field
sample_temperature
/NXmanipulator/sample_temperature-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/MANIPULATOR/sample_temperature-field
sample_x
/NXstxm/ENTRY/DATA/sample_x-field
/NXstxm/ENTRY/INSTRUMENT/sample_x-group
sample_y
/NXstxm/ENTRY/DATA/sample_y-field
/NXstxm/ENTRY/INSTRUMENT/sample_y-group
sample_z
/NXstxm/ENTRY/INSTRUMENT/sample_z-group
sampled_fraction
/NXmonitor/sampled_fraction-field
saturation_value
/NXdetector/saturation_value-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/saturation_value-field
scale
/NXregion/scale-field
scaling
/NXcalibration/scaling-field
scaling_factor
/NXdata/scaling_factor-field
scan_number
/NXxpcs/entry/scan_number-field
scan_rotation
/NXimage_set_em_se/scan_rotation-group
scattering_angle
/NXspindispersion/scattering_angle-field
scattering_cross_section
/NXattenuator/scattering_cross_section-field
scattering_energy
/NXspindispersion/scattering_energy-field
scattering_length_density
/NXsample/scattering_length_density-field
/NXsample_component/scattering_length_density-field
scattering_vector
/NXcrystal/scattering_vector-field
scheme
/NXcollectioncolumn/scheme-field
/NXenergydispersion/scheme-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field
sdd
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/SDD-field
seblock
/NXspe/ENTRY/SAMPLE/seblock-field
segment_columns
/NXcrystal/segment_columns-field
segment_gap
/NXcrystal/segment_gap-field
segment_height
/NXcrystal/segment_height-field
segment_rows
/NXcrystal/segment_rows-field
segment_thickness
/NXcrystal/segment_thickness-field
segment_width
/NXcrystal/segment_width-field
semi_convergence_angle
/NXoptical_system_em/semi_convergence_angle-field
sensor
/NXebeam_column/SENSOR-group
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/SENSOR-group
/NXenvironment/SENSOR-group
/NXibeam_column/SENSOR-group
sensor_material
/NXdetector/sensor_material-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_material-field
sensor_size
/NXarpes/ENTRY/INSTRUMENT/analyser/sensor_size-field
sensor_thickness
/NXdetector/sensor_thickness-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_thickness-field
sensor_type
/NXfilter/sensor_type-group
sequence_index
/NXnote/sequence_index-field
/NXprocess/sequence_index-field
sequence_number
/NXdetector/sequence_number-field
/NXtomophase/entry/instrument/bright_field/sequence_number-field
/NXtomophase/entry/instrument/dark_field/sequence_number-field
/NXtomophase/entry/instrument/sample/sequence_number-field
serial_number
/NXapm/ENTRY/atom_probe/ion_detector/serial_number-field
/NXdetector/serial_number-field
set_bfield_current
/NXseparator/set_Bfield_current-field
/NXspin_rotator/set_Bfield_current-field
set_current
/NXelectrostatic_kicker/set_current-field
/NXmagnetic_kicker/set_current-field
/NXquadrupole_magnet/set_current-field
/NXsolenoid_magnet/set_current-field
set_efield_voltage
/NXseparator/set_Efield_voltage-field
/NXspin_rotator/set_Efield_voltage-field
set_voltage
/NXelectrostatic_kicker/set_voltage-field
/NXmagnetic_kicker/set_voltage-field
sgl
/NXtas/entry/SAMPLE/sgl-field
sgu
/NXtas/entry/SAMPLE/sgu-field
shadowfactor
/NXcanSAS/ENTRY/DATA/ShadowFactor-field
shank_angle
/NXapm/ENTRY/atom_probe/specimen_monitoring/shank_angle-field
shape
/NXattenuator/shape-group
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE/shape-field
/NXcontainer/shape-group
/NXcrystal/shape-group
/NXgeometry/SHAPE-group
/NXgrating/shape-group
/NXmirror/shape-group
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE-group
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/shape-field
/NXsastof/ENTRY/instrument/collimator/geometry/shape-group
/NXsastof/ENTRY/instrument/collimator/geometry/shape/shape-field
/NXshape/shape-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape-group
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/shape-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/shape-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/shape-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/shape-field
shermann_function
/NXspindispersion/shermann_function-field
short_name
/NXenvironment/short_name-field
/NXsensor/short_name-field
short_title
/NXapm/ENTRY/specimen/short_title-field
/NXem/ENTRY/SAMPLE/short_title-field
/NXsample/short_title-field
sigma_x
/NXsource/sigma_x-field
sigma_y
/NXsource/sigma_y-field
signal_amplitude
/NXapm/ENTRY/atom_probe/ion_detector/signal_amplitude-field
situation
/NXarchive/entry/sample/situation-field
/NXmpes/ENTRY/SAMPLE/situation-field
/NXsample/situation-field
size
/NXbeam_stop/size-field
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/size-field
/NXsastof/ENTRY/instrument/collimator/geometry/shape/size-field
/NXshape/size-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/size-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/size-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/size-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/size-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/size-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/size-field
slit
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer/SLIT-group
/NXfermi_chopper/slit-field
slit_angle
/NXdisk_chopper/slit_angle-field
slit_edges
/NXdisk_chopper/slit_edges-field
slit_height
/NXdisk_chopper/slit_height-field
slit_length
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/slit_length-field
slits
/NXdisk_chopper/slits-field
slot
/NXdetector/slot-field
slow_axes
/NXelectronanalyser/slow_axes-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/slow_axes-field
slow_pixel_direction
/NXdetector_module/slow_pixel_direction-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction-field
sns
/NXsnsevent/ENTRY/instrument/SNS-group
/NXsnshisto/ENTRY/instrument/SNS-group
snsbanking_file_name
/NXsnsevent/ENTRY/SNSHistoTool/SNSbanking_file_name-field
/NXsnshisto/ENTRY/SNSHistoTool/SNSbanking_file_name-field
snsdetector_calibration_id
/NXsnsevent/ENTRY/instrument/SNSdetector_calibration_id-field
/NXsnshisto/ENTRY/instrument/SNSdetector_calibration_id-field
snsgeometry_file_name
/NXsnsevent/ENTRY/instrument/SNSgeometry_file_name-field
/NXsnshisto/ENTRY/instrument/SNSgeometry_file_name-field
snshistotool
/NXsnsevent/ENTRY/SNSHistoTool-group
/NXsnshisto/ENTRY/SNSHistoTool-group
snsmapping_file_name
/NXsnsevent/ENTRY/SNSHistoTool/SNSmapping_file_name-field
/NXsnshisto/ENTRY/SNSHistoTool/SNSmapping_file_name-field
snstranslation_service
/NXsnsevent/ENTRY/instrument/SNStranslation_service-field
/NXsnshisto/ENTRY/instrument/SNStranslation_service-field
social_media_name
/NXapm/ENTRY/operator/social_media_name-field
/NXem/ENTRY/operator/social_media_name-field
social_media_platform
/NXapm/ENTRY/operator/social_media_platform-field
/NXem/ENTRY/operator/social_media_platform-field
soft_limit_max
/NXpositioner/soft_limit_max-field
soft_limit_min
/NXpositioner/soft_limit_min-field
solid_angle
/NXdetector/solid_angle-field
soller_angle
/NXcollimator/soller_angle-field
source
/NXarchive/entry/instrument/SOURCE-group
/NXarpes/ENTRY/INSTRUMENT/SOURCE-group
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE-group
/NXfluo/entry/INSTRUMENT/SOURCE-group
/NXinstrument/SOURCE-group
/NXiqproc/ENTRY/instrument/SOURCE-group
/NXmonopd/entry/INSTRUMENT/SOURCE-group
/NXmpes/ENTRY/INSTRUMENT/SOURCE-group
/NXmx/ENTRY/SOURCE-group
/NXrefscan/entry/instrument/SOURCE-group
/NXsas/ENTRY/INSTRUMENT/SOURCE-group
/NXsastof/ENTRY/instrument/source-group
/NXsqom/ENTRY/instrument/SOURCE-group
/NXstxm/ENTRY/INSTRUMENT/SOURCE-group
/NXtas/entry/INSTRUMENT/SOURCE-group
/NXtomo/entry/instrument/SOURCE-group
/NXtomophase/entry/instrument/SOURCE-group
/NXtomoproc/entry/INSTRUMENT/SOURCE-group
/NXxas/ENTRY/INSTRUMENT/SOURCE-group
/NXxbase/entry/instrument/source-group
/NXxlaue/entry/instrument/source-group
source_1
/NXcxi_ptycho/entry_1/instrument_1/source_1-group
source_distance_x
/NXbending_magnet/source_distance_x-field
source_distance_y
/NXbending_magnet/source_distance_y-field
space_group
/NXcrystal/space_group-field
/NXimage_set_em_kikuchi/oim/indexing/reflector/space_group-field
/NXsample/space_group-field
/NXsample_component/space_group-field
spatial_calibration
/NXmpes/ENTRY/PROCESS/spatial_calibration-group
spatial_resolution
/NXelectronanalyser/spatial_resolution-field
specimen
/NXapm/ENTRY/specimen-group
specimen_monitoring
/NXapm/ENTRY/atom_probe/specimen_monitoring-group
spectral_resolution
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer/spectral_resolution-field
spectrometer
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer-group
spectrum
/NXbending_magnet/spectrum-group
/NXinsertion_device/spectrum-group
spectrum_set_em_auger
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_AUGER-group
/NXevent_data_em/SPECTRUM_SET_EM_AUGER-group
spectrum_set_em_cathodolum
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_CATHODOLUM-group
/NXevent_data_em/SPECTRUM_SET_EM_CATHODOLUM-group
spectrum_set_em_eels
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_EELS-group
/NXevent_data_em/SPECTRUM_SET_EM_EELS-group
spectrum_set_em_xray
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_XRAY-group
/NXevent_data_em/SPECTRUM_SET_EM_XRAY-group
spindispersion
/NXelectronanalyser/SPINDISPERSION-group
spot_position
/NXpulser_apm/laser_beam/spot_position-group
spwidth
/NXvelocity_selector/spwidth-field
stage
/NXellipsometry/ENTRY/INSTRUMENT/stage-group
stage_lab
/NXapm/ENTRY/atom_probe/STAGE_LAB-group
/NXebeam_column/STAGE_LAB-group
stage_type
/NXellipsometry/ENTRY/INSTRUMENT/stage/stage_type-field
standing_voltage
/NXpulser_apm/standing_voltage-field
start
/NXregion/start-field
start_time
/NXapm/ENTRY/start_time-field
/NXarchive/entry/start_time-field
/NXarpes/ENTRY/start_time-field
/NXcxi_ptycho/entry_1/start_time-field
/NXdetector/start_time-field
/NXdirecttof/entry/start_time-field
/NXellipsometry/ENTRY/start_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/start_time-field
/NXem/ENTRY/start_time-field
/NXentry/start_time-field
/NXevent_data_em/start_time-field
/NXfluo/entry/start_time-field
/NXindirecttof/entry/start_time-field
/NXmonitor/start_time-field
/NXmonopd/entry/start_time-field
/NXmpes/ENTRY/start_time-field
/NXmx/ENTRY/start_time-field
/NXrefscan/entry/start_time-field
/NXreftof/entry/start_time-field
/NXsas/ENTRY/start_time-field
/NXsastof/ENTRY/start_time-field
/NXscan/ENTRY/start_time-field
/NXsnsevent/ENTRY/start_time-field
/NXsnshisto/ENTRY/start_time-field
/NXstxm/ENTRY/start_time-field
/NXsubentry/start_time-field
/NXtas/entry/start_time-field
/NXtofnpd/entry/start_time-field
/NXtofraw/entry/start_time-field
/NXtofsingle/entry/start_time-field
/NXtomo/entry/start_time-field
/NXtomophase/entry/start_time-field
/NXxas/ENTRY/start_time-field
/NXxbase/entry/start_time-field
/NXxpcs/entry/start_time-field
static_q_list
/NXxpcs/entry/instrument/masks/static_q_list-field
static_roi_map
/NXxpcs/entry/instrument/masks/static_roi_map-field
statistics
/NXregion/statistics-group
status
/NXattenuator/status-field
/NXbeam_stop/status-field
/NXfilter/status-field
/NXimage_set_em_kikuchi/oim/indexing/status-field
step_size
/NXimage_set_em_kikuchi/step_size-field
stop_time
/NXdetector/stop_time-field
stress_field
/NXarchive/entry/sample/stress_field-field
/NXsample/stress_field-field
stride
/NXregion/stride-field
stxm_scan_type
/NXstxm/ENTRY/DATA/stxm_scan_type-field
subentry
/NXentry/SUBENTRY-group
substrate_density
/NXgrating/substrate_density-field
/NXmirror/substrate_density-field
substrate_material
/NXfilter/substrate_material-field
/NXgrating/substrate_material-field
/NXguide/substrate_material-field
/NXmirror/substrate_material-field
substrate_roughness
/NXfilter/substrate_roughness-field
/NXgrating/substrate_roughness-field
/NXguide/substrate_roughness-field
/NXmirror/substrate_roughness-field
substrate_thickness
/NXfilter/substrate_thickness-field
/NXgrating/substrate_thickness-field
/NXguide/substrate_thickness-field
/NXmirror/substrate_thickness-field
support_membrane_material
/NXfresnel_zone_plate/support_membrane_material-field
support_membrane_thickness
/NXfresnel_zone_plate/support_membrane_thickness-field
surface
/NXguide/reflectivity/surface-field
surface_type
/NXquadric/surface_type-field
symmetric
/NXxraylens/symmetric-field
symmetry
/NXdistortion/symmetry-field
t
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T-field
table
/NXvelocity_selector/table-field
taper
/NXinsertion_device/taper-field
target
/NXspindispersion/target-field
target_material
/NXsource/target_material-field
target_preparation
/NXspindispersion/target_preparation-field
target_preparation_date
/NXspindispersion/target_preparation_date-field
target_value
/NXpositioner/target_value-field
tdev
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/Tdev-field
telephone_number
/NXapm/ENTRY/operator/telephone_number-field
/NXellipsometry/ENTRY/operator/telephone_number-field
/NXem/ENTRY/operator/telephone_number-field
/NXuser/telephone_number-field
temperature
/NXarchive/entry/sample/temperature-field
/NXarpes/ENTRY/SAMPLE/temperature-field
/NXcanSAS/ENTRY/SAMPLE/temperature-field
/NXcrystal/temperature-field
/NXfilter/temperature-field
/NXmoderator/temperature-field
/NXmpes/ENTRY/SAMPLE/temperature-field
/NXmx/ENTRY/SAMPLE/temperature-field
/NXsample/temperature-field
/NXsnsevent/ENTRY/instrument/moderator/temperature-field
/NXsnshisto/ENTRY/instrument/moderator/temperature-field
/NXspe/ENTRY/SAMPLE/temperature-field
/NXxbase/entry/sample/temperature-field
/NXxpcs/entry/sample/temperature-field
temperature_coefficient
/NXcrystal/temperature_coefficient-field
temperature_env
/NXsample/temperature_env-group
temperature_log
/NXcrystal/temperature_log-group
/NXfilter/temperature_log-group
/NXmoderator/temperature_log-group
/NXsample/temperature_log-group
temperature_set
/NXxpcs/entry/sample/temperature_set-field
term
/NXcanSAS/ENTRY/PROCESS/term-field
/NXparameters/term-field
thickness
/NXattenuator/thickness-field
/NXcanSAS/ENTRY/SAMPLE/thickness-field
/NXcrystal/thickness-field
/NXellipsometry/ENTRY/INSTRUMENT/window/thickness-field
/NXem/ENTRY/SAMPLE/thickness-field
/NXfilter/thickness-field
/NXflipper/thickness-field
/NXsample/thickness-field
threshold_energy
/NXdetector/threshold_energy-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/threshold_energy-field
thumbnail
/NXapm/ENTRY/thumbnail-group
/NXem/ENTRY/thumbnail-group
/NXentry/thumbnail-group
/NXsubentry/thumbnail-group
tilt
/NXxnb/entry/name/tilt-link
tilt_1
/NXstage_lab/tilt_1-field
tilt_2
/NXstage_lab/tilt_2-field
tilt_angle
/NXxnb/entry/instrument/detector/tilt_angle-field
tilt_correction
/NXimage_set_em_se/tilt_correction-group
time
/NXlog/time-field
/NXsnsevent/ENTRY/DASlogs/LOG/time-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/time-field
/NXsnshisto/ENTRY/DASlogs/LOG/time-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/time-field
time_of_flight
/NXdetector/time_of_flight-field
/NXlauetof/entry/control/time_of_flight-field
/NXlauetof/entry/instrument/detector/time_of_flight-field
/NXlauetof/entry/name/time_of_flight-link
/NXmonitor/time_of_flight-field
/NXreftof/entry/control/time_of_flight-field
/NXreftof/entry/data/time_of_flight-link
/NXreftof/entry/instrument/detector/time_of_flight-field
/NXsastof/ENTRY/control/time_of_flight-field
/NXsastof/ENTRY/data/time_of_flight-link
/NXsastof/ENTRY/instrument/detector/time_of_flight-field
/NXsnsevent/ENTRY/MONITOR/time_of_flight-field
/NXsnshisto/ENTRY/DATA/time_of_flight-link
/NXsnshisto/ENTRY/MONITOR/time_of_flight-field
/NXsnshisto/ENTRY/instrument/DETECTOR/time_of_flight-field
/NXtofnpd/entry/INSTRUMENT/detector/time_of_flight-field
/NXtofnpd/entry/MONITOR/time_of_flight-field
/NXtofnpd/entry/data/time_of_flight-link
/NXtofraw/entry/MONITOR/time_of_flight-field
/NXtofraw/entry/data/time_of_flight-link
/NXtofraw/entry/instrument/detector/time_of_flight-field
/NXtofsingle/entry/INSTRUMENT/detector/time_of_flight-field
/NXtofsingle/entry/MONITOR/time_of_flight-field
/NXtofsingle/entry/data/time_of_flight-link
time_per_channel
/NXarpes/ENTRY/INSTRUMENT/analyser/time_per_channel-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/time_per_channel-field
time_points
/NXellipsometry/ENTRY/SAMPLE/time_points-field
time_zone
/NXmx/ENTRY/INSTRUMENT/time_zone-field
timing
/NXelectrostatic_kicker/timing-field
/NXmagnetic_kicker/timing-field
title
/NXarchive/entry/title-field
/NXarpes/ENTRY/title-field
/NXcanSAS/ENTRY/title-field
/NXcxi_ptycho/entry_1/title-field
/NXdata/title-field
/NXdirecttof/entry/title-field
/NXentry/title-field
/NXfluo/entry/title-field
/NXindirecttof/entry/title-field
/NXiqproc/ENTRY/title-field
/NXmonopd/entry/title-field
/NXmpes/ENTRY/title-field
/NXmx/ENTRY/title-field
/NXrefscan/entry/title-field
/NXreftof/entry/title-field
/NXsas/ENTRY/title-field
/NXsastof/ENTRY/title-field
/NXscan/ENTRY/title-field
/NXsnsevent/ENTRY/title-field
/NXsnshisto/ENTRY/title-field
/NXsource/bunch_pattern/title-field
/NXsqom/ENTRY/title-field
/NXstxm/ENTRY/title-field
/NXsubentry/title-field
/NXtas/entry/title-field
/NXtofnpd/entry/title-field
/NXtofraw/entry/title-field
/NXtofsingle/entry/title-field
/NXtomo/entry/title-field
/NXtomophase/entry/title-field
/NXtomoproc/entry/title-field
/NXxas/ENTRY/title-field
/NXxasproc/ENTRY/title-field
/NXxbase/entry/title-field
tof_calibration
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/tof_calibration-group
tof_distance
/NXenergydispersion/tof_distance-field
tolerance
/NXpositioner/tolerance-field
top_dead_center
/NXdisk_chopper/top_dead_center-field
top_up
/NXsource/top_up-field
total_counts
/NXsnsevent/ENTRY/instrument/DETECTOR/total_counts-field
/NXsnsevent/ENTRY/total_counts-field
/NXsnshisto/ENTRY/DATA/total_counts-link
/NXsnshisto/ENTRY/instrument/DETECTOR/total_counts-field
/NXsnshisto/ENTRY/total_counts-field
total_flux
/NXmx/ENTRY/INSTRUMENT/BEAM/total_flux-field
total_flux_integrated
/NXmx/ENTRY/INSTRUMENT/BEAM/total_flux_integrated-field
total_uncounted_counts
/NXsnsevent/ENTRY/total_uncounted_counts-field
/NXsnshisto/ENTRY/total_uncounted_counts-field
transformations
/NXaperture/TRANSFORMATIONS-group
/NXaperture_em/TRANSFORMATIONS-group
/NXattenuator/TRANSFORMATIONS-group
/NXbeam/TRANSFORMATIONS-group
/NXbeam_stop/TRANSFORMATIONS-group
/NXbending_magnet/TRANSFORMATIONS-group
/NXcapillary/TRANSFORMATIONS-group
/NXcollectioncolumn/TRANSFORMATIONS-group
/NXcollimator/TRANSFORMATIONS-group
/NXcoordinate_system_set/TRANSFORMATIONS-group
/NXcorrector_cs/TRANSFORMATIONS-group
/NXcrystal/TRANSFORMATIONS-group
/NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations-group
/NXcxi_ptycho/sample_1/transformations-group
/NXdeflector/TRANSFORMATIONS-group
/NXdetector/TRANSFORMATIONS-group
/NXdisk_chopper/TRANSFORMATIONS-group
/NXebeam_column/electron_gun/TRANSFORMATIONS-group
/NXelectronanalyser/TRANSFORMATIONS-group
/NXellipsometry/ENTRY/INSTRUMENT/stage/TRANSFORMATIONS-group
/NXenvironment/TRANSFORMATIONS-group
/NXfermi_chopper/TRANSFORMATIONS-group
/NXfilter/TRANSFORMATIONS-group
/NXflipper/TRANSFORMATIONS-group
/NXfresnel_zone_plate/TRANSFORMATIONS-group
/NXgrating/TRANSFORMATIONS-group
/NXguide/TRANSFORMATIONS-group
/NXibeam_column/ion_gun/TRANSFORMATIONS-group
/NXinsertion_device/TRANSFORMATIONS-group
/NXlens_em/TRANSFORMATIONS-group
/NXmanipulator/TRANSFORMATIONS-group
/NXmirror/TRANSFORMATIONS-group
/NXmoderator/TRANSFORMATIONS-group
/NXmonitor/TRANSFORMATIONS-group
/NXmonochromator/TRANSFORMATIONS-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/TRANSFORMATIONS-group
/NXmx/ENTRY/SAMPLE/TRANSFORMATIONS-group
/NXpinhole/TRANSFORMATIONS-group
/NXpolarizer/TRANSFORMATIONS-group
/NXpositioner/TRANSFORMATIONS-group
/NXpulser_apm/laser_gun/TRANSFORMATIONS-group
/NXreflectron/TRANSFORMATIONS-group
/NXregistration/TRANSFORMATIONS-group
/NXsample/TRANSFORMATIONS-group
/NXsensor/TRANSFORMATIONS-group
/NXslit/TRANSFORMATIONS-group
/NXsource/TRANSFORMATIONS-group
/NXspindispersion/TRANSFORMATIONS-group
/NXstage_lab/TRANSFORMATIONS-group
/NXvelocity_selector/TRANSFORMATIONS-group
/NXxraylens/TRANSFORMATIONS-group
translation
/NXcxi_ptycho/data_1/translation-link
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation-field
/NXcxi_ptycho/sample_1/geometry_1/translation-link
/NXgeometry/TRANSLATION-group
/NXsnsevent/ENTRY/instrument/APERTURE/origin/translation-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin/translation-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation-group
transmission
/NXcanSAS/ENTRY/SAMPLE/transmission-field
/NXcapillary/transmission-group
/NXcrystal/transmission-group
/NXfilter/transmission-group
/NXsample/transmission-group
/NXsample_component/transmission-group
transmission_spectrum
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM-group
transmitting_material
/NXcollimator/transmitting_material-field
/NXfermi_chopper/transmitting_material-field
trigger_dead_time
/NXdetector/trigger_dead_time-field
trigger_delay_time
/NXdetector/trigger_delay_time-field
trigger_delay_time_set
/NXdetector/trigger_delay_time_set-field
trigger_internal_delay_time
/NXdetector/trigger_internal_delay_time-field
turbomolecular_pump
/NXapm/ENTRY/atom_probe/turbomolecular_pump-group
twist
/NXvelocity_selector/twist-field
two_time_corr_func
/NXxpcs/entry/twotime/two_time_corr_func-field
twotime
/NXxpcs/entry/twotime-group
type
/NXapm/ENTRY/atom_probe/ion_detector/type-field
/NXarchive/entry/instrument/SOURCE/type-field
/NXarchive/entry/sample/type-field
/NXarpes/ENTRY/INSTRUMENT/SOURCE/type-field
/NXattenuator/type-field
/NXcapillary/type-field
/NXcollimator/type-field
/NXcrystal/type-field
/NXcxi_ptycho/entry_1/instrument_1/source_1/type-field
/NXdeflector/type-field
/NXdetector/type-field
/NXdisk_chopper/type-field
/NXenvironment/type-field
/NXfermi_chopper/type-field
/NXflipper/type-field
/NXfluo/entry/INSTRUMENT/SOURCE/type-field
/NXinsertion_device/type-field
/NXiqproc/ENTRY/instrument/SOURCE/type-field
/NXlens_em/type-field
/NXmanipulator/type-field
/NXmirror/type-field
/NXmoderator/type-field
/NXmonitor/type-field
/NXmonopd/entry/INSTRUMENT/SOURCE/type-field
/NXmpes/ENTRY/INSTRUMENT/SOURCE/type-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/type-field
/NXnote/type-field
/NXpolarizer/type-field
/NXrefscan/entry/instrument/SOURCE/type-field
/NXsample/type-field
/NXsas/ENTRY/INSTRUMENT/SOURCE/type-field
/NXsastof/ENTRY/instrument/source/type-field
/NXsensor/type-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/type-field
/NXsnsevent/ENTRY/instrument/SNS/type-field
/NXsnsevent/ENTRY/instrument/moderator/type-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/type-field
/NXsnshisto/ENTRY/instrument/SNS/type-field
/NXsnshisto/ENTRY/instrument/moderator/type-field
/NXsource/type-field
/NXspindispersion/type-field
/NXsqom/ENTRY/instrument/SOURCE/type-field
/NXstxm/ENTRY/INSTRUMENT/SOURCE/type-field
/NXtomo/entry/instrument/SOURCE/type-field
/NXtomophase/entry/instrument/SOURCE/type-field
/NXtomoproc/entry/INSTRUMENT/SOURCE/type-field
/NXvelocity_selector/type-field
/NXxas/ENTRY/INSTRUMENT/SOURCE/type-field
/NXxbase/entry/instrument/source/type-field
ub_matrix
/NXsample/ub_matrix-field
underload_value
/NXdetector/underload_value-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/underload_value-field
unit_cell
/NXcrystal/unit_cell-field
/NXlauetof/entry/sample/unit_cell-field
/NXsample/unit_cell-field
/NXtas/entry/SAMPLE/unit_cell-field
/NXxbase/entry/sample/unit_cell-field
unit_cell_a
/NXcrystal/unit_cell_a-field
/NXfilter/unit_cell_a-field
unit_cell_abc
/NXimage_set_em_kikuchi/oim/indexing/reflector/unit_cell_abc-field
/NXsample/unit_cell_abc-field
/NXsample_component/unit_cell_abc-field
unit_cell_alpha
/NXcrystal/unit_cell_alpha-field
/NXfilter/unit_cell_alpha-field
unit_cell_alphabetagamma
/NXimage_set_em_kikuchi/oim/indexing/reflector/unit_cell_alphabetagamma-field
/NXsample/unit_cell_alphabetagamma-field
/NXsample_component/unit_cell_alphabetagamma-field
unit_cell_b
/NXcrystal/unit_cell_b-field
/NXfilter/unit_cell_b-field
unit_cell_beta
/NXcrystal/unit_cell_beta-field
/NXfilter/unit_cell_beta-field
unit_cell_c
/NXcrystal/unit_cell_c-field
/NXfilter/unit_cell_c-field
unit_cell_class
/NXimage_set_em_kikuchi/oim/indexing/reflector/unit_cell_class-field
/NXsample/unit_cell_class-field
/NXsample_component/unit_cell_class-field
unit_cell_gamma
/NXcrystal/unit_cell_gamma-field
/NXfilter/unit_cell_gamma-field
unit_cell_volume
/NXcrystal/unit_cell_volume-field
/NXfilter/unit_cell_volume-field
/NXsample/unit_cell_volume-field
/NXsample_component/unit_cell_volume-field
url
/NXcite/url-field
usage
/NXcrystal/usage-field
user
/NXarchive/entry/user-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/USER-group
/NXentry/USER-group
/NXevent_data_em/USER-group
/NXsnsevent/ENTRY/USER-group
/NXsnshisto/ENTRY/USER-group
/NXsubentry/USER-group
/NXtofnpd/entry/user-group
/NXtofraw/entry/user-group
/NXtofsingle/entry/user-group
value
/NXaperture_em/value-field
/NXelectrostatic_kicker/read_current/value-field
/NXelectrostatic_kicker/read_voltage/value-field
/NXlog/value-field
/NXmagnetic_kicker/read_current/value-field
/NXmagnetic_kicker/read_voltage/value-field
/NXorientation/value-field
/NXpositioner/value-field
/NXquadrupole_magnet/read_current/value-field
/NXquadrupole_magnet/read_voltage/value-field
/NXsensor/value-field
/NXseparator/read_Bfield_current/value-field
/NXseparator/read_Bfield_voltage/value-field
/NXseparator/read_Efield_current/value-field
/NXseparator/read_Efield_voltage/value-field
/NXsnsevent/ENTRY/DASlogs/LOG/value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/value-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation/value-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation/value-field
/NXsnshisto/ENTRY/DASlogs/LOG/value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/value-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation/value-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation/value-field
/NXsolenoid_magnet/read_current/value-field
/NXsolenoid_magnet/read_voltage/value-field
/NXspin_rotator/read_Bfield_current/value-field
/NXspin_rotator/read_Bfield_voltage/value-field
/NXspin_rotator/read_Efield_current/value-field
/NXspin_rotator/read_Efield_voltage/value-field
value_deriv1
/NXsensor/value_deriv1-field
value_deriv1_log
/NXsensor/value_deriv1_log-group
value_deriv2
/NXsensor/value_deriv2-field
value_deriv2_log
/NXsensor/value_deriv2_log-group
value_log
/NXsensor/value_log-group
variable
/NXiqproc/ENTRY/DATA/variable-field
variable_revolution
/NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/variable_revolution-field
varied_parameters
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/varied_parameters-field
vector
/NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations/vector-field
velocity
/NXpositioner/velocity-field
velocity_selector
/NXinstrument/VELOCITY_SELECTOR-group
/NXmonochromator/VELOCITY_SELECTOR-group
version
/NXellipsometry/ENTRY/acquisition_program/version-field
/NXiqproc/ENTRY/reduction/version-field
/NXprocess/version-field
/NXsnsevent/ENTRY/SNSHistoTool/version-field
/NXsnshisto/ENTRY/SNSHistoTool/version-field
/NXsqom/ENTRY/reduction/version-field
/NXtomoproc/entry/reconstruction/version-field
/NXxasproc/ENTRY/XAS_data_reduction/version-field
vertices
/NXcylindrical_geometry/vertices-field
/NXoff_geometry/vertices-field
virtual_pixel_interpolation_applied
/NXdetector/virtual_pixel_interpolation_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/virtual_pixel_interpolation_applied-field
voltage
/NXdeflector/voltage-field
/NXebeam_column/electron_gun/voltage-field
/NXibeam_column/ion_gun/voltage-field
/NXlens_em/voltage-field
/NXsource/voltage-field
voltage_and_bowl_correction
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction-group
volume_fraction
/NXsample/volume_fraction-field
/NXsample_component/volume_fraction-field
wavelength
/NXcrystal/wavelength-field
/NXdetector/efficiency/wavelength-field
/NXellipsometry/ENTRY/INSTRUMENT/spectrometer/wavelength-field
/NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/wavelength-field
/NXfermi_chopper/wavelength-field
/NXfluo/entry/INSTRUMENT/monochromator/wavelength-field
/NXguide/reflectivity/wavelength-field
/NXmonochromator/wavelength-field
/NXmonopd/entry/INSTRUMENT/CRYSTAL/wavelength-field
/NXpulser_apm/laser_gun/wavelength-field
/NXrefscan/entry/instrument/monochromator/wavelength-field
/NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/wavelength-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/wavelength-field
/NXvelocity_selector/wavelength-field
/NXxbase/entry/instrument/monochromator/wavelength-field
/NXxlaue/entry/instrument/source/distribution/wavelength-field
wavelength_error
/NXmonochromator/wavelength_error-field
wavelength_errors
/NXmonochromator/wavelength_errors-field
wavelength_max
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_max-field
wavelength_min
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_min-field
wavelength_range
/NXdisk_chopper/wavelength_range-field
wavelength_spread
/NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength_spread-field
/NXvelocity_selector/wavelength_spread-field
width
/NXfermi_chopper/width-field
/NXvelocity_selector/width-field
winding_order
/NXoff_geometry/winding_order-field
window
/NXellipsometry/ENTRY/INSTRUMENT/window-group
working_distance
/NXcapillary/working_distance-field
/NXcollectioncolumn/working_distance-field
/NXoptical_system_em/working_distance-field
x
/NXbeam_stop/x-field
/NXcxi_ptycho/DATA/x-link
/NXdata/x-field
/NXtomoproc/entry/data/x-field
x_gap
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE/x_gap-field
/NXslit/x_gap-field
x_indices
/NXcxi_ptycho/DATA/x_indices-field
x_pixel_offset
/NXdetector/x_pixel_offset-field
/NXsnsevent/ENTRY/DATA/x_pixel_offset-link
/NXsnsevent/ENTRY/instrument/APERTURE/x_pixel_offset-field
/NXsnsevent/ENTRY/instrument/DETECTOR/x_pixel_offset-field
/NXsnshisto/ENTRY/DATA/x_pixel_offset-link
/NXsnshisto/ENTRY/instrument/APERTURE/x_pixel_offset-field
/NXsnshisto/ENTRY/instrument/DETECTOR/x_pixel_offset-field
x_pixel_size
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size-field
/NXdetector/x_pixel_size-field
/NXlauetof/entry/instrument/detector/x_pixel_size-field
/NXreftof/entry/instrument/detector/x_pixel_size-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field
/NXsastof/ENTRY/instrument/detector/x_pixel_size-field
/NXtomo/entry/instrument/detector/x_pixel_size-field
/NXtomophase/entry/instrument/sample/x_pixel_size-field
/NXxbase/entry/instrument/detector/x_pixel_size-field
/NXxpcs/entry/instrument/DETECTOR/x_pixel_size-field
x_position
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_position-field
/NXcanSAS/ENTRY/SAMPLE/x_position-field
x_rotation_axis_pixel_position
/NXtomo/entry/instrument/detector/x_rotation_axis_pixel_position-field
x_translation
/NXsample/x_translation-field
/NXtomo/entry/sample/x_translation-field
/NXtomophase/entry/sample/x_translation-field
/NXxbase/entry/sample/x_translation-field
xas_data_reduction
/NXxasproc/ENTRY/XAS_data_reduction-group
xpos
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/xpos-field
/NXimage_set_em_adf/DATA/xpos-field
/NXimage_set_em_kikuchi/DATA/xpos-field
/NXimage_set_em_se/DATA/xpos-field
/NXspectrum_set_em_xray/DATA/xpos-field
/NXspectrum_set_em_xray/indexing/composition_map/DATA/xpos-field
xraylens
/NXinstrument/XRAYLENS-group
y
/NXbeam_stop/y-field
/NXcxi_ptycho/DATA/y-link
/NXdata/y-field
/NXtomoproc/entry/data/y-field
y_gap
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE/y_gap-field
/NXslit/y_gap-field
y_indices
/NXcxi_ptycho/DATA/y_indices-field
y_pixel_offset
/NXdetector/y_pixel_offset-field
/NXsnsevent/ENTRY/DATA/y_pixel_offset-link
/NXsnsevent/ENTRY/instrument/DETECTOR/y_pixel_offset-field
/NXsnshisto/ENTRY/DATA/y_pixel_offset-link
/NXsnshisto/ENTRY/instrument/DETECTOR/y_pixel_offset-field
y_pixel_size
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size-field
/NXdetector/y_pixel_size-field
/NXlauetof/entry/instrument/detector/y_pixel_size-field
/NXreftof/entry/instrument/detector/y_pixel_size-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field
/NXsastof/ENTRY/instrument/detector/y_pixel_size-field
/NXtomo/entry/instrument/detector/y_pixel_size-field
/NXtomophase/entry/instrument/sample/y_pixel_size-field
/NXxbase/entry/instrument/detector/y_pixel_size-field
/NXxpcs/entry/instrument/DETECTOR/y_pixel_size-field
y_position
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_position-field
/NXcanSAS/ENTRY/SAMPLE/y_position-field
y_rotation_axis_pixel_position
/NXtomo/entry/instrument/detector/y_rotation_axis_pixel_position-field
y_translation
/NXtomo/entry/sample/y_translation-field
/NXtomophase/entry/sample/y_translation-field
/NXxbase/entry/sample/y_translation-field
yaw
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/yaw-field
/NXcanSAS/ENTRY/SAMPLE/yaw-field
ypos
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/ypos-field
/NXimage_set_em_adf/DATA/ypos-field
/NXimage_set_em_kikuchi/DATA/ypos-field
/NXimage_set_em_se/DATA/ypos-field
/NXspectrum_set_em_xray/DATA/ypos-field
/NXspectrum_set_em_xray/indexing/composition_map/DATA/ypos-field
z
/NXdata/z-field
/NXtomoproc/entry/data/z-field
z_pixel_offset
/NXdetector/z_pixel_offset-field
z_translation
/NXtomo/entry/sample/z_translation-field
/NXtomophase/entry/sample/z_translation-field
zone_height
/NXfresnel_zone_plate/zone_height-field
zone_material
/NXfresnel_zone_plate/zone_material-field
zone_support_material
/NXfresnel_zone_plate/zone_support_material-field
zpos
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/zpos-field

written: 2022-09-21T14:58:26.691987