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/NXapm_paraprobe_config_distancer/ENTRY/analysis_description-field
/NXapm_paraprobe_config_distancer/ENTRY/analysis_identifier-field
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/NXapm_paraprobe_config_distancer/ENTRY/program-field
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/NXapm_paraprobe_config_distancer/ENTRY@version-attribute
/NXapm_paraprobe_config_intersector/ENTRY-group
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION-group
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/analyze_coprecipitation-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/analyze_intersection-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/analyze_proximity-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set-group
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE-group
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/feature_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/feature_type-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/filename-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/filename@version-attribute
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/groupname_geometry_prefix-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/number_of_feature_types-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/set_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/has_current_to_next_links-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/has_next_to_current_links-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/intersection_detection_method-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set-group
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE-group
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/feature_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/feature_type-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/filename-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/filename@version-attribute
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/groupname_geometry_prefix-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/number_of_feature_types-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/set_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/threshold_proximity-field
/NXapm_paraprobe_config_intersector/ENTRY/analysis_description-field
/NXapm_paraprobe_config_intersector/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/definition-field
/NXapm_paraprobe_config_intersector/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_intersector/ENTRY/performance-group
/NXapm_paraprobe_config_intersector/ENTRY/performance/current_working_directory-field
/NXapm_paraprobe_config_intersector/ENTRY/program-field
/NXapm_paraprobe_config_intersector/ENTRY/program@version-attribute
/NXapm_paraprobe_config_intersector/ENTRY/results_path-field
/NXapm_paraprobe_config_intersector/ENTRY/time_stamp-field
/NXapm_paraprobe_config_intersector/ENTRY@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/direction_model-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/distancing_model-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_facet_indices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_facet_normals-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/filename@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/patch_identifier_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/patch_identifier_filter/match-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/patch_identifier_filter/method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances/dataset_name-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances/filename@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/roi_cylinder_height-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/roi_cylinder_radius-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/filename@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/gridresolutions-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/has_scalar_fields-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/input-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_indices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_normals-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/file_name-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/file_name@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/interface_model-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/edge_handling_method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/edge_threshold-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_auto_proxigram-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_auto_proxigram_edge_contact-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_edge_contact-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_geometry-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_ions-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_obb-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_properties-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_edge_contact-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_geometry-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_ions-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_obb-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_properties-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_triangle_soup-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/phi-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isotope_whitelist-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/kernel_size-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/kernel_variance-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/normalization-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/dataset_name_facet_indices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/dataset_name_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/filename@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/evaporation_id_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/hit_multiplicity_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/control_points-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/decorating_iontypes_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/decorating_iontypes_filter/candidates-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/filename@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/initialization-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/number_of_iterations-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/target_dcom_radius-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/target_edge_length-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/target_smoothing_step-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances/dataset_name-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances/filename@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter/match-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter/method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes/filename@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/radii-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/orientation-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/windowing_method-field
/NXapm_paraprobe_config_nanochem/ENTRY/analysis_description-field
/NXapm_paraprobe_config_nanochem/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_nanochem/ENTRY/definition-field
/NXapm_paraprobe_config_nanochem/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_nanochem/ENTRY/performance-group
/NXapm_paraprobe_config_nanochem/ENTRY/performance/current_working_directory-field
/NXapm_paraprobe_config_nanochem/ENTRY/program-field
/NXapm_paraprobe_config_nanochem/ENTRY/program@version-attribute
/NXapm_paraprobe_config_nanochem/ENTRY/results_path-field
/NXapm_paraprobe_config_nanochem/ENTRY/time_stamp-field
/NXapm_paraprobe_config_nanochem/ENTRY@version-attribute
/NXapm_paraprobe_config_ranger/ENTRY-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset/filename-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset/filename@version-attribute
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/evaporation_id_filter-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/hit_multiplicity_filter-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontype_filter-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes/filename-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes/filename@version-attribute
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/radii-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/orientation-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/windowing_method-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/check_existent_ranging-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/check_existent_ranging/iontypes-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/check_existent_ranging/iontypes/filename-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/check_existent_ranging/iontypes/filename@version-attribute
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/NXdelocalization/weighting_model-field
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/NXdetector/countrate_correction_lookup_table-field
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/NXdetector/efficiency@signal-attribute
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/NXdetector/gas_pressure-field
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/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/description-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/exposure_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/magnification-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/tilt_angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/applied-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/name-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/FABRICATION/model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/emitter_type-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/name-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/voltage-field
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR-group
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/FABRICATION/model-field
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/pixel_time-field
/NXem/ENTRY/em_lab/FABRICATION-group
/NXem/ENTRY/em_lab/FABRICATION/capabilities-field
/NXem/ENTRY/em_lab/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/FABRICATION/model-field
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a-group
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/uncertainty_model-field
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a-group
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/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_z-field
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/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom_occupancy-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom_positions-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/crystallographic_database-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/crystallographic_database_identifier-field
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/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/plane_miller-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/relative_intensity-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/space_group-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/unit_cell_abc-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/unit_cell_alphabetagamma-field
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/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_x-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_y-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/data-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/data@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/title-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model@axes-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model@signal-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map-group
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_x-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_y-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/data-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/data@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/title-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map@axes-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map@signal-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/phase_identifier-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/phase_name-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/projection_direction-field
/NXem_ebsd/ENTRY/experiment/indexing/background_correction-group
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/NXem_ebsd/ENTRY/experiment/indexing/binning-group
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/NXem_ebsd/ENTRY/experiment/indexing/hit_rate-field
/NXem_ebsd/ENTRY/experiment/indexing/method-field
/NXem_ebsd/ENTRY/experiment/indexing/n_phases_per_scan_point-field
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/NXem_ebsd/ENTRY/experiment/indexing/on_the_fly_indexing/origin@version-attribute
/NXem_ebsd/ENTRY/experiment/indexing/on_the_fly_indexing/path-field
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/NXem_ebsd/ENTRY/experiment/indexing/phase_matching-field
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/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/axis_y-field
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/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/data-field
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/data@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/title-field
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/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi@axes-attribute
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/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/data_counts-field
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/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack@AXISNAME_indices-attribute
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/NXem_ebsd/ENTRY/workflow_description-field
/NXem_ebsd/ENTRY/workflow_identifier-field
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/NXem_ebsd_conventions/detector_reference_frame/yaxis_direction-field
/NXem_ebsd_conventions/detector_reference_frame/zaxis_direction-field
/NXem_ebsd_conventions/gnomonic_projection_reference_frame-group
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/NXem_ebsd_conventions/gnomonic_projection_reference_frame/reference_frame_type-field
/NXem_ebsd_conventions/gnomonic_projection_reference_frame/xaxis_direction-field
/NXem_ebsd_conventions/gnomonic_projection_reference_frame/yaxis_direction-field
/NXem_ebsd_conventions/gnomonic_projection_reference_frame/zaxis_direction-field
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/NXem_ebsd_conventions/pattern_centre/xaxis_boundary_convention-field
/NXem_ebsd_conventions/pattern_centre/xaxis_normalization_direction-field
/NXem_ebsd_conventions/pattern_centre/yaxis_boundary_convention-field
/NXem_ebsd_conventions/pattern_centre/yaxis_normalization_direction-field
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/NXem_ebsd_conventions/processing_reference_frame/zaxis_alias-field
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/NXem_ebsd_conventions/rotation_conventions/rotation_convention-field
/NXem_ebsd_conventions/rotation_conventions/three_dimensional_rotation_handedness-field
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/NXem_ebsd_conventions/sample_reference_frame/yaxis_direction-field
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/NXentry/definition@URL-attribute
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/NXentry/definition_local-field
/NXentry/definition_local@URL-attribute
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/NXentry/thumbnail-group
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/NXevent_data/event_time_zero-field
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/NXevent_data/pulse_height-field
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/NXevent_data_em_set/EVENT_DATA_EM-group
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/NXfabrication/identifier-field
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/NXfermi_chopper/absorbing_material-field
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/NXfermi_chopper/distance-field
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/NXfermi_chopper/number-field
/NXfermi_chopper/r_slit-field
/NXfermi_chopper/radius-field
/NXfermi_chopper/rotation_speed-field
/NXfermi_chopper/slit-field
/NXfermi_chopper/transmitting_material-field
/NXfermi_chopper/type-field
/NXfermi_chopper/wavelength-field
/NXfermi_chopper/width-field
/NXfermi_chopper@default-attribute
/NXfiber/acceptance_angle-field
/NXfiber/attenuation-field
/NXfiber/attenuation@units-attribute
/NXfiber/cladding-group
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/NXfiber/cladding/clad_index_of_refraction-field
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/NXfiber/coating-group
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/NXfiber/coating/coating_material-field
/NXfiber/core-group
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/NXfiber/core/core_index_of_refraction-field
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/NXfiber/description-field
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/NXfiber/numerical_aperture-field
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/NXfiber/spectral_range-field
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/NXfiber/type-field
/NXfilter/GEOMETRY-group
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/NXfilter/chemical_formula-field
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/NXfilter/coating_roughness-field
/NXfilter/density-field
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/NXfilter/orientation_matrix-field
/NXfilter/sensor_type-group
/NXfilter/status-field
/NXfilter/substrate_material-field
/NXfilter/substrate_roughness-field
/NXfilter/substrate_thickness-field
/NXfilter/temperature-field
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/NXfilter/thickness-field
/NXfilter/transmission-group
/NXfilter/unit_cell_a-field
/NXfilter/unit_cell_alpha-field
/NXfilter/unit_cell_b-field
/NXfilter/unit_cell_beta-field
/NXfilter/unit_cell_c-field
/NXfilter/unit_cell_gamma-field
/NXfilter/unit_cell_volume-field
/NXfilter@default-attribute
/NXflipper/TRANSFORMATIONS-group
/NXflipper/comp_current-field
/NXflipper/comp_turns-field
/NXflipper/depends_on-field
/NXflipper/flip_current-field
/NXflipper/flip_turns-field
/NXflipper/guide_current-field
/NXflipper/guide_turns-field
/NXflipper/thickness-field
/NXflipper/type-field
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/NXfluo/entry-group
/NXfluo/entry/INSTRUMENT-group
/NXfluo/entry/INSTRUMENT/SOURCE-group
/NXfluo/entry/INSTRUMENT/SOURCE/name-field
/NXfluo/entry/INSTRUMENT/SOURCE/probe-field
/NXfluo/entry/INSTRUMENT/SOURCE/type-field
/NXfluo/entry/INSTRUMENT/fluorescence-group
/NXfluo/entry/INSTRUMENT/fluorescence/data-field
/NXfluo/entry/INSTRUMENT/fluorescence/energy-field
/NXfluo/entry/INSTRUMENT/monochromator-group
/NXfluo/entry/INSTRUMENT/monochromator/wavelength-field
/NXfluo/entry/MONITOR-group
/NXfluo/entry/MONITOR/data-field
/NXfluo/entry/MONITOR/mode-field
/NXfluo/entry/MONITOR/preset-field
/NXfluo/entry/SAMPLE-group
/NXfluo/entry/SAMPLE/name-field
/NXfluo/entry/data-group
/NXfluo/entry/data/data-link
/NXfluo/entry/data/energy-link
/NXfluo/entry/definition-field
/NXfluo/entry/start_time-field
/NXfluo/entry/title-field
/NXfresnel_zone_plate/TRANSFORMATIONS-group
/NXfresnel_zone_plate/central_stop_diameter-field
/NXfresnel_zone_plate/central_stop_material-field
/NXfresnel_zone_plate/central_stop_thickness-field
/NXfresnel_zone_plate/depends_on-field
/NXfresnel_zone_plate/fabrication-field
/NXfresnel_zone_plate/focus_parameters-field
/NXfresnel_zone_plate/mask_material-field
/NXfresnel_zone_plate/mask_thickness-field
/NXfresnel_zone_plate/outer_diameter-field
/NXfresnel_zone_plate/outermost_zone_width-field
/NXfresnel_zone_plate/support_membrane_material-field
/NXfresnel_zone_plate/support_membrane_thickness-field
/NXfresnel_zone_plate/zone_height-field
/NXfresnel_zone_plate/zone_material-field
/NXfresnel_zone_plate/zone_support_material-field
/NXfresnel_zone_plate@default-attribute
/NXgeometry/ORIENTATION-group
/NXgeometry/SHAPE-group
/NXgeometry/TRANSLATION-group
/NXgeometry/component_index-field
/NXgeometry/description-field
/NXgeometry@default-attribute
/NXgraph_edge_set/directionality-field
/NXgraph_edge_set/identifier-field
/NXgraph_edge_set/identifier_offset-field
/NXgraph_edge_set/is_a-field
/NXgraph_edge_set/label-field
/NXgraph_edge_set/node_pair-field
/NXgraph_edge_set/number_of_edges-field
/NXgraph_node_set/cardinality-field
/NXgraph_node_set/dimensionality-field
/NXgraph_node_set/identifier-field
/NXgraph_node_set/identifier_offset-field
/NXgraph_node_set/is_a-field
/NXgraph_node_set/label-field
/NXgraph_root/nodes-group
/NXgraph_root/relation-group
/NXgrating/OFF_GEOMETRY-group
/NXgrating/TRANSFORMATIONS-group
/NXgrating/angles-field
/NXgrating/coating_material-field
/NXgrating/coating_roughness-field
/NXgrating/deflection_angle-field
/NXgrating/depends_on-field
/NXgrating/depth-field
/NXgrating/diffraction_order-field
/NXgrating/duty_cycle-field
/NXgrating/figure_data-group
/NXgrating/interior_atmosphere-field
/NXgrating/layer_thickness-field
/NXgrating/period-field
/NXgrating/shape-group
/NXgrating/substrate_density-field
/NXgrating/substrate_material-field
/NXgrating/substrate_roughness-field
/NXgrating/substrate_thickness-field
/NXgrating@default-attribute
/NXguide/GEOMETRY-group
/NXguide/OFF_GEOMETRY-group
/NXguide/TRANSFORMATIONS-group
/NXguide/bend_angle_x-field
/NXguide/bend_angle_y-field
/NXguide/coating_material-field
/NXguide/coating_roughness-field
/NXguide/depends_on-field
/NXguide/description-field
/NXguide/external_material-field
/NXguide/incident_angle-field
/NXguide/interior_atmosphere-field
/NXguide/m_value-field
/NXguide/number_sections-field
/NXguide/reflectivity-group
/NXguide/reflectivity/data-field
/NXguide/reflectivity/surface-field
/NXguide/reflectivity/wavelength-field
/NXguide/reflectivity@axes-attribute
/NXguide/reflectivity@signal-attribute
/NXguide/reflectivity@surface_indices-attribute
/NXguide/reflectivity@wavelength_indices-attribute
/NXguide/substrate_material-field
/NXguide/substrate_roughness-field
/NXguide/substrate_thickness-field
/NXguide@default-attribute
/NXibeam_column/APERTURE_EM-group
/NXibeam_column/BEAM-group
/NXibeam_column/FABRICATION-group
/NXibeam_column/LENS_EM-group
/NXibeam_column/SENSOR-group
/NXibeam_column/ion_source-group
/NXibeam_column/ion_source/TRANSFORMATIONS-group
/NXibeam_column/ion_source/brightness-field
/NXibeam_column/ion_source/current-field
/NXibeam_column/ion_source/description-field
/NXibeam_column/ion_source/emitter_type-field
/NXibeam_column/ion_source/ion_energy_profile-field
/NXibeam_column/ion_source/name-field
/NXibeam_column/ion_source/probe-group
/NXibeam_column/ion_source/voltage-field
/NXimage_set/PROCESS-group
/NXimage_set/PROCESS/PROGRAM-group
/NXimage_set/PROCESS/detector_identifier-field
/NXimage_set/PROCESS/mode-field
/NXimage_set/PROCESS/source-field
/NXimage_set/PROCESS/source@version-attribute
/NXimage_set/stack-group
/NXimage_set/stack/axis_image_identifier-field
/NXimage_set/stack/axis_image_identifier@long_name-attribute
/NXimage_set/stack/axis_x-field
/NXimage_set/stack/axis_x@long_name-attribute
/NXimage_set/stack/axis_y-field
/NXimage_set/stack/axis_y@long_name-attribute
/NXimage_set/stack/data_counts-field
/NXimage_set_em_adf/PROCESS-group
/NXimage_set_em_adf/PROCESS/adf_inner_half_angle-field
/NXimage_set_em_adf/PROCESS/adf_outer_half_angle-field
/NXimage_set_em_adf/PROCESS/program-field
/NXimage_set_em_adf/PROCESS/program@version-attribute
/NXimage_set_em_adf/PROCESS/source-field
/NXimage_set_em_adf/PROCESS/source@version-attribute
/NXimage_set_em_adf/stack-group
/NXimage_set_em_adf/stack/axis_image_identifier-field
/NXimage_set_em_adf/stack/axis_image_identifier@long_name-attribute
/NXimage_set_em_adf/stack/axis_x-field
/NXimage_set_em_adf/stack/axis_x@long_name-attribute
/NXimage_set_em_adf/stack/axis_y-field
/NXimage_set_em_adf/stack/axis_y@long_name-attribute
/NXimage_set_em_adf/stack/data_counts-field
/NXimage_set_em_kikuchi/PROCESS-group
/NXimage_set_em_kikuchi/stack-group
/NXimage_set_em_kikuchi/stack/axis_x-field
/NXimage_set_em_kikuchi/stack/axis_x@long_name-attribute
/NXimage_set_em_kikuchi/stack/axis_y-field
/NXimage_set_em_kikuchi/stack/axis_y@long_name-attribute
/NXimage_set_em_kikuchi/stack/data_counts-field
/NXimage_set_em_kikuchi/stack/data_counts@long_name-attribute
/NXimage_set_em_kikuchi/stack/pattern_identifier-field
/NXimage_set_em_kikuchi/stack/pattern_identifier@long_name-attribute
/NXimage_set_em_kikuchi/stack/scan_point_identifier-field
/NXindirecttof/entry-group
/NXindirecttof/entry/INSTRUMENT-group
/NXindirecttof/entry/INSTRUMENT/analyser-group
/NXindirecttof/entry/INSTRUMENT/analyser/distance-field
/NXindirecttof/entry/INSTRUMENT/analyser/energy-field
/NXindirecttof/entry/INSTRUMENT/analyser/polar_angle-field
/NXindirecttof/entry/definition-field
/NXindirecttof/entry/start_time-field
/NXindirecttof/entry/title-field
/NXinsertion_device/GEOMETRY-group
/NXinsertion_device/OFF_GEOMETRY-group
/NXinsertion_device/TRANSFORMATIONS-group
/NXinsertion_device/bandwidth-field
/NXinsertion_device/depends_on-field
/NXinsertion_device/energy-field
/NXinsertion_device/gap-field
/NXinsertion_device/harmonic-field
/NXinsertion_device/k-field
/NXinsertion_device/length-field
/NXinsertion_device/magnetic_wavelength-field
/NXinsertion_device/phase-field
/NXinsertion_device/poles-field
/NXinsertion_device/power-field
/NXinsertion_device/spectrum-group
/NXinsertion_device/taper-field
/NXinsertion_device/type-field
/NXinsertion_device@default-attribute
/NXinstrument/APERTURE-group
/NXinstrument/ATTENUATOR-group
/NXinstrument/BEAM-group
/NXinstrument/BEAM_STOP-group
/NXinstrument/BENDING_MAGNET-group
/NXinstrument/CAPILLARY-group
/NXinstrument/COLLECTION-group
/NXinstrument/COLLIMATOR-group
/NXinstrument/CRYSTAL-group
/NXinstrument/DETECTOR-group
/NXinstrument/DETECTOR_GROUP-group
/NXinstrument/DIFFRACTOMETER-group
/NXinstrument/DISK_CHOPPER-group
/NXinstrument/EVENT_DATA-group
/NXinstrument/FERMI_CHOPPER-group
/NXinstrument/FILTER-group
/NXinstrument/FLIPPER-group
/NXinstrument/GUIDE-group
/NXinstrument/INSERTION_DEVICE-group
/NXinstrument/MIRROR-group
/NXinstrument/MODERATOR-group
/NXinstrument/MONOCHROMATOR-group
/NXinstrument/POLARIZER-group
/NXinstrument/POSITIONER-group
/NXinstrument/SOURCE-group
/NXinstrument/VELOCITY_SELECTOR-group
/NXinstrument/XRAYLENS-group
/NXinstrument/name-field
/NXinstrument/name@short_name-attribute
/NXinstrument@default-attribute
/NXinteraction_vol_em/DATA-group
/NXinteraction_vol_em/PROCESS-group
/NXion/charge-field
/NXion/charge_state-field
/NXion/color-field
/NXion/identifier-field
/NXion/identifier_type-field
/NXion/ion_type-field
/NXion/isotope_vector-field
/NXion/mass_to_charge_range-field
/NXion/name-field
/NXion/nuclid_list-field
/NXion/volume-field
/NXiqproc/ENTRY-group
/NXiqproc/ENTRY/DATA-group
/NXiqproc/ENTRY/DATA/data-field
/NXiqproc/ENTRY/DATA/qx-field
/NXiqproc/ENTRY/DATA/qy-field
/NXiqproc/ENTRY/DATA/variable-field
/NXiqproc/ENTRY/DATA/variable@varied_variable-attribute
/NXiqproc/ENTRY/SAMPLE-group
/NXiqproc/ENTRY/SAMPLE/name-field
/NXiqproc/ENTRY/definition-field
/NXiqproc/ENTRY/instrument-group
/NXiqproc/ENTRY/instrument/SOURCE-group
/NXiqproc/ENTRY/instrument/SOURCE/name-field
/NXiqproc/ENTRY/instrument/SOURCE/probe-field
/NXiqproc/ENTRY/instrument/SOURCE/type-field
/NXiqproc/ENTRY/instrument/name-field
/NXiqproc/ENTRY/reduction-group
/NXiqproc/ENTRY/reduction/input-group
/NXiqproc/ENTRY/reduction/input/filenames-field
/NXiqproc/ENTRY/reduction/output-group
/NXiqproc/ENTRY/reduction/program-field
/NXiqproc/ENTRY/reduction/version-field
/NXiqproc/ENTRY/title-field
/NXiqproc/ENTRY@entry-attribute
/NXisocontour/dimensionality-field
/NXisocontour/grid-group
/NXisocontour/isovalue-field
/NXiv_temp/ENTRY-group
/NXiv_temp/ENTRY/DATA-group
/NXiv_temp/ENTRY/DATA/current-field
/NXiv_temp/ENTRY/DATA/temperature-field
/NXiv_temp/ENTRY/DATA/voltage-field
/NXiv_temp/ENTRY/INSTRUMENT-group
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT-group
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor-group
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/temperature_controller-group
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/voltage_controller-group
/NXiv_temp/ENTRY/definition-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP/sequence_index-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium_carrier-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/end_time-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force_control-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/lubricant-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/removal-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation_control-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/sequence_index-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/start_time-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/thickness_reduction-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time_control-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/SAMPLE-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/USER-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/definition-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/identifier-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/model-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/vendor-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_description-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_identifier-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY@version-attribute
/NXlab_sample_mounting/ENTRY-group
/NXlab_sample_mounting/ENTRY/SAMPLE-group
/NXlab_sample_mounting/ENTRY/USER-group
/NXlab_sample_mounting/ENTRY/definition-field
/NXlab_sample_mounting/ENTRY/electrical_conductivity-field
/NXlab_sample_mounting/ENTRY/embedding_medium-field
/NXlab_sample_mounting/ENTRY/end_time-field
/NXlab_sample_mounting/ENTRY/mounting_machine-group
/NXlab_sample_mounting/ENTRY/mounting_machine/identifier-field
/NXlab_sample_mounting/ENTRY/mounting_machine/model-field
/NXlab_sample_mounting/ENTRY/mounting_machine/vendor-field
/NXlab_sample_mounting/ENTRY/mounting_method-field
/NXlab_sample_mounting/ENTRY/start_time-field
/NXlab_sample_mounting/ENTRY@version-attribute
/NXlauetof/entry-group
/NXlauetof/entry/control-group
/NXlauetof/entry/control/data-field
/NXlauetof/entry/control/mode-field
/NXlauetof/entry/control/preset-field
/NXlauetof/entry/control/time_of_flight-field
/NXlauetof/entry/definition-field
/NXlauetof/entry/instrument-group
/NXlauetof/entry/instrument/detector-group
/NXlauetof/entry/instrument/detector/azimuthal_angle-field
/NXlauetof/entry/instrument/detector/data-field
/NXlauetof/entry/instrument/detector/data@signal-attribute
/NXlauetof/entry/instrument/detector/distance-field
/NXlauetof/entry/instrument/detector/polar_angle-field
/NXlauetof/entry/instrument/detector/time_of_flight-field
/NXlauetof/entry/instrument/detector/x_pixel_size-field
/NXlauetof/entry/instrument/detector/y_pixel_size-field
/NXlauetof/entry/name-group
/NXlauetof/entry/name/data-link
/NXlauetof/entry/name/time_of_flight-link
/NXlauetof/entry/sample-group
/NXlauetof/entry/sample/name-field
/NXlauetof/entry/sample/orientation_matrix-field
/NXlauetof/entry/sample/unit_cell-field
/NXlens_em/FABRICATION-group
/NXlens_em/TRANSFORMATIONS-group
/NXlens_em/current-field
/NXlens_em/depends_on-field
/NXlens_em/description-field
/NXlens_em/manufacturer_name-field
/NXlens_em/model-field
/NXlens_em/name-field
/NXlens_em/type-field
/NXlens_em/value-field
/NXlens_em/voltage-field
/NXlens_opt/Abbe_number-field
/NXlens_opt/COATING-group
/NXlens_opt/COATING/coating_material-field
/NXlens_opt/COATING/coating_thickness-field
/NXlens_opt/COATING/coating_type-field
/NXlens_opt/COATING/index_of_refraction_coating-field
/NXlens_opt/chromatic-field
/NXlens_opt/curvature_radius_FACE-field
/NXlens_opt/focal_length-field
/NXlens_opt/lens_diameter-field
/NXlens_opt/other_type-field
/NXlens_opt/reflectance-field
/NXlens_opt/substrate-group
/NXlens_opt/substrate/index_of_refraction-field
/NXlens_opt/substrate/substrate_material-field
/NXlens_opt/substrate/substrate_thickness-field
/NXlens_opt/transmission-field
/NXlens_opt/type-field
/NXlog/average_value-field
/NXlog/average_value_error-field
/NXlog/average_value_errors-field
/NXlog/cue_index-field
/NXlog/cue_timestamp_zero-field
/NXlog/cue_timestamp_zero@scaling_factor-attribute
/NXlog/cue_timestamp_zero@start-attribute
/NXlog/description-field
/NXlog/duration-field
/NXlog/maximum_value-field
/NXlog/minimum_value-field
/NXlog/raw_value-field
/NXlog/time-field
/NXlog/time@scaling_factor-attribute
/NXlog/time@start-attribute
/NXlog/value-field
/NXlog@default-attribute
/NXmagnetic_kicker/beamline_distance-field
/NXmagnetic_kicker/description-field
/NXmagnetic_kicker/read_current-group
/NXmagnetic_kicker/read_current/value-field
/NXmagnetic_kicker/read_voltage-group
/NXmagnetic_kicker/read_voltage/value-field
/NXmagnetic_kicker/set_current-field
/NXmagnetic_kicker/set_voltage-field
/NXmagnetic_kicker/timing-field
/NXmagnetic_kicker/timing@description-attribute
/NXmanipulator/POSITIONER-group
/NXmanipulator/TRANSFORMATIONS-group
/NXmanipulator/cryocoolant-field
/NXmanipulator/cryostat_temperature-field
/NXmanipulator/depends_on-field
/NXmanipulator/description-field
/NXmanipulator/drain_current-field
/NXmanipulator/heater_power-field
/NXmanipulator/name-field
/NXmanipulator/sample_bias-field
/NXmanipulator/sample_temperature-field
/NXmanipulator/type-field
/NXmatch_filter/match-field
/NXmatch_filter/method-field
/NXmirror/GEOMETRY-group
/NXmirror/OFF_GEOMETRY-group
/NXmirror/TRANSFORMATIONS-group
/NXmirror/bend_angle_x-field
/NXmirror/bend_angle_y-field
/NXmirror/coating_material-field
/NXmirror/coating_roughness-field
/NXmirror/depends_on-field
/NXmirror/description-field
/NXmirror/even_layer_density-field
/NXmirror/even_layer_material-field
/NXmirror/external_material-field
/NXmirror/figure_data-group
/NXmirror/incident_angle-field
/NXmirror/interior_atmosphere-field
/NXmirror/layer_thickness-field
/NXmirror/m_value-field
/NXmirror/odd_layer_density-field
/NXmirror/odd_layer_material-field
/NXmirror/reflectivity-group
/NXmirror/shape-group
/NXmirror/substrate_density-field
/NXmirror/substrate_material-field
/NXmirror/substrate_roughness-field
/NXmirror/substrate_thickness-field
/NXmirror/type-field
/NXmirror@default-attribute
/NXmoderator/GEOMETRY-group
/NXmoderator/OFF_GEOMETRY-group
/NXmoderator/TRANSFORMATIONS-group
/NXmoderator/coupled-field
/NXmoderator/coupling_material-field
/NXmoderator/depends_on-field
/NXmoderator/distance-field
/NXmoderator/poison_depth-field
/NXmoderator/poison_material-field
/NXmoderator/pulse_shape-group
/NXmoderator/temperature-field
/NXmoderator/temperature_log-group
/NXmoderator/type-field
/NXmoderator@default-attribute
/NXmonitor/GEOMETRY-group
/NXmonitor/OFF_GEOMETRY-group
/NXmonitor/TRANSFORMATIONS-group
/NXmonitor/count_time-field
/NXmonitor/data-field
/NXmonitor/depends_on-field
/NXmonitor/distance-field
/NXmonitor/efficiency-field
/NXmonitor/end_time-field
/NXmonitor/integral-field
/NXmonitor/integral_log-group
/NXmonitor/mode-field
/NXmonitor/nominal-field
/NXmonitor/preset-field
/NXmonitor/range-field
/NXmonitor/sampled_fraction-field
/NXmonitor/start_time-field
/NXmonitor/time_of_flight-field
/NXmonitor/type-field
/NXmonitor@default-attribute
/NXmonochromator/CRYSTAL-group
/NXmonochromator/GRATING-group
/NXmonochromator/OFF_GEOMETRY-group
/NXmonochromator/TRANSFORMATIONS-group
/NXmonochromator/VELOCITY_SELECTOR-group
/NXmonochromator/depends_on-field
/NXmonochromator/distribution-group
/NXmonochromator/energy-field
/NXmonochromator/energy_error-field
/NXmonochromator/energy_errors-field
/NXmonochromator/geometry-group
/NXmonochromator/wavelength-field
/NXmonochromator/wavelength_error-field
/NXmonochromator/wavelength_errors-field
/NXmonochromator@default-attribute
/NXmonopd/entry-group
/NXmonopd/entry/DATA-group
/NXmonopd/entry/DATA/data-link
/NXmonopd/entry/DATA/polar_angle-link
/NXmonopd/entry/INSTRUMENT-group
/NXmonopd/entry/INSTRUMENT/CRYSTAL-group
/NXmonopd/entry/INSTRUMENT/CRYSTAL/wavelength-field
/NXmonopd/entry/INSTRUMENT/DETECTOR-group
/NXmonopd/entry/INSTRUMENT/DETECTOR/data-field
/NXmonopd/entry/INSTRUMENT/DETECTOR/polar_angle-field
/NXmonopd/entry/INSTRUMENT/SOURCE-group
/NXmonopd/entry/INSTRUMENT/SOURCE/name-field
/NXmonopd/entry/INSTRUMENT/SOURCE/probe-field
/NXmonopd/entry/INSTRUMENT/SOURCE/type-field
/NXmonopd/entry/MONITOR-group
/NXmonopd/entry/MONITOR/integral-field
/NXmonopd/entry/MONITOR/mode-field
/NXmonopd/entry/MONITOR/preset-field
/NXmonopd/entry/SAMPLE-group
/NXmonopd/entry/SAMPLE/name-field
/NXmonopd/entry/SAMPLE/rotation_angle-field
/NXmonopd/entry/definition-field
/NXmonopd/entry/start_time-field
/NXmonopd/entry/title-field
/NXmpes/ENTRY-group
/NXmpes/ENTRY/DATA-group
/NXmpes/ENTRY/DATA/data-field
/NXmpes/ENTRY/DATA@signal-attribute
/NXmpes/ENTRY/INSTRUMENT-group
/NXmpes/ENTRY/INSTRUMENT/BEAM-group
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/NXopt/ENTRY/USER/affiliation-field
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/NXopt/ENTRY/USER/orcid-field
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/NXopt/ENTRY/data_collection/NAME_spectrum-field
/NXopt/ENTRY/data_collection/NAME_spectrum@units-attribute
/NXopt/ENTRY/data_collection/data_identifier-field
/NXopt/ENTRY/data_collection/data_software-group
/NXopt/ENTRY/data_collection/data_software/program-field
/NXopt/ENTRY/data_collection/data_software/version-field
/NXopt/ENTRY/data_collection/data_software@url-attribute
/NXopt/ENTRY/data_collection/data_type-field
/NXopt/ENTRY/data_collection/measured_data-field
/NXopt/ENTRY/data_collection/measured_data@units-attribute
/NXopt/ENTRY/data_collection/measured_data_errors-field
/NXopt/ENTRY/data_collection/measured_data_errors@units-attribute
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/NXopt/ENTRY/data_collection/varied_parameter_link-field
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/NXopt/ENTRY/derived_parameters/depolarization-field
/NXopt/ENTRY/derived_parameters/reflectivity-field
/NXopt/ENTRY/derived_parameters/transmittance-field
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/NXopt/ENTRY/experiment_type-field
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/NXoptical_system_em/defocus-field
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/NXpid/setpoint-field
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/NXpulser_apm/SOURCE/BEAM/incidence_vector-group
/NXpulser_apm/SOURCE/BEAM/pinhole_position-group
/NXpulser_apm/SOURCE/BEAM/spot_position-group
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/NXpulser_apm/SOURCE/name-field
/NXpulser_apm/SOURCE/power-field
/NXpulser_apm/SOURCE/pulse_energy-field
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/NXpulser_apm/pulse_fraction-field
/NXpulser_apm/pulse_frequency-field
/NXpulser_apm/pulse_mode-field
/NXpulser_apm/pulse_number-field
/NXpulser_apm/pulsed_voltage-field
/NXpulser_apm/standing_voltage-field
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/NXpump/design-field
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/NXquadric/surface_type-field
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/NXquadrupole_magnet/read_current-group
/NXquadrupole_magnet/read_current/value-field
/NXquadrupole_magnet/read_voltage-group
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/NXreflections/int_sum_errors@description-attribute
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/NXreflections/int_sum_var@description-attribute
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/NXreflections/observed_frame_var@description-attribute
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/NXreflections/observed_phi@description-attribute
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/NXreflections/observed_phi_errors@description-attribute
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/NXreflections/observed_phi_var@description-attribute
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/NXreflections/observed_px_x@description-attribute
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/NXreflections/observed_px_x_var@description-attribute
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/NXreflections/observed_px_y_errors@description-attribute
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/NXreflections/observed_px_y_var@description-attribute
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/NXreflections/observed_x_errors@description-attribute
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/NXreflections/observed_x_var@description-attribute
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/NXreflections/observed_y_var@description-attribute
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/NXreflections/overlaps@description-attribute
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/NXreflections/partiality@description-attribute
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/NXreflections/predicted_frame@description-attribute
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/NXreflections/predicted_phi@description-attribute
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/NXreflections/predicted_px_x@description-attribute
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/NXreflections/predicted_px_y@description-attribute
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/NXreflections/predicted_y@description-attribute
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/NXreflections/prf_cc@description-attribute
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/NXreflections@description-attribute
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/NXrefscan/entry/title-field
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/NXreftof/entry/control-group
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/NXreftof/entry/control/integral-field
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/NXreftof/entry/instrument/detector/y_pixel_size-field
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/NXreftof/entry/title-field
/NXregion/block-field
/NXregion/count-field
/NXregion/downsampled-group
/NXregion/parent-field
/NXregion/parent_mask-field
/NXregion/scale-field
/NXregion/start-field
/NXregion/statistics-group
/NXregion/stride-field
/NXregion@region_type-attribute
/NXregistration/TRANSFORMATIONS-group
/NXregistration/applied-field
/NXregistration/depends_on-field
/NXregistration/description-field
/NXregistration/last_process-field
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/NXroot@HDF_version-attribute
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/NXroot@NeXus_version-attribute
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/NXroot@creator-attribute
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/NXroot@file_name-attribute
/NXroot@file_time-attribute
/NXroot@file_update_time-attribute
/NXroot@h5py_version-attribute
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/NXsample/POSITIONER-group
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/NXsample/changer_position-field
/NXsample/chemical_formula-field
/NXsample/component-field
/NXsample/concentration-field
/NXsample/density-field
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/NXsample/distance-field
/NXsample/electric_field-field
/NXsample/electric_field@direction-attribute
/NXsample/external_ADC-group
/NXsample/external_DAC-field
/NXsample/geometry-group
/NXsample/magnetic_field-field
/NXsample/magnetic_field-group
/NXsample/magnetic_field@direction-attribute
/NXsample/magnetic_field_env-group
/NXsample/magnetic_field_log-group
/NXsample/mass-field
/NXsample/name-field
/NXsample/orientation_matrix-field
/NXsample/path_length-field
/NXsample/path_length_window-field
/NXsample/point_group-field
/NXsample/preparation_date-field
/NXsample/pressure-field
/NXsample/relative_molecular_mass-field
/NXsample/rotation_angle-field
/NXsample/sample_component-field
/NXsample/sample_orientation-field
/NXsample/scattering_length_density-field
/NXsample/short_title-field
/NXsample/situation-field
/NXsample/space_group-field
/NXsample/stress_field-field
/NXsample/stress_field@direction-attribute
/NXsample/temperature-field
/NXsample/temperature_env-group
/NXsample/temperature_log-group
/NXsample/thickness-field
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/NXsample/ub_matrix-field
/NXsample/unit_cell-field
/NXsample/unit_cell_abc-field
/NXsample/unit_cell_alphabetagamma-field
/NXsample/unit_cell_class-field
/NXsample/unit_cell_volume-field
/NXsample/volume_fraction-field
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/NXsample_component/mass-field
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/NXsample_component/point_group-field
/NXsample_component/relative_molecular_mass-field
/NXsample_component/sample_orientation-field
/NXsample_component/scattering_length_density-field
/NXsample_component/space_group-field
/NXsample_component/transmission-group
/NXsample_component/unit_cell_abc-field
/NXsample_component/unit_cell_alphabetagamma-field
/NXsample_component/unit_cell_class-field
/NXsample_component/unit_cell_volume-field
/NXsample_component/volume_fraction-field
/NXsample_component@default-attribute
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/NXsas/ENTRY/DATA@signal-attribute
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/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE-group
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/NXsastof/ENTRY/instrument/collimator-group
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/NXsastof/ENTRY/instrument/collimator/geometry/shape-group
/NXsastof/ENTRY/instrument/collimator/geometry/shape/shape-field
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/NXsastof/ENTRY/instrument/detector-group
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/NXsastof/ENTRY/instrument/detector/y_pixel_size-field
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/NXsastof/ENTRY/start_time-field
/NXsastof/ENTRY/title-field
/NXsastof/ENTRY@entry-attribute
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/NXscan/ENTRY/DATA-group
/NXscan/ENTRY/DATA/data-link
/NXscan/ENTRY/DATA/rotation_angle-link
/NXscan/ENTRY/INSTRUMENT-group
/NXscan/ENTRY/INSTRUMENT/DETECTOR-group
/NXscan/ENTRY/INSTRUMENT/DETECTOR/data-field
/NXscan/ENTRY/MONITOR-group
/NXscan/ENTRY/MONITOR/data-field
/NXscan/ENTRY/SAMPLE-group
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/NXscan/ENTRY/definition-field
/NXscan/ENTRY/end_time-field
/NXscan/ENTRY/start_time-field
/NXscan/ENTRY/title-field
/NXscanbox_em/FABRICATION-group
/NXscanbox_em/ac_line_sync-field
/NXscanbox_em/calibration_style-field
/NXscanbox_em/center-field
/NXscanbox_em/flyback_time-field
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/NXscanbox_em/pixel_time-field
/NXscanbox_em/requested_pixel_time-field
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/NXsensor/OFF_GEOMETRY-group
/NXsensor/TRANSFORMATIONS-group
/NXsensor/attached_to-field
/NXsensor/depends_on-field
/NXsensor/external_field_brief-field
/NXsensor/external_field_full-group
/NXsensor/geometry-group
/NXsensor/high_trip_value-field
/NXsensor/low_trip_value-field
/NXsensor/measurement-field
/NXsensor/model-field
/NXsensor/name-field
/NXsensor/run_control-field
/NXsensor/short_name-field
/NXsensor/type-field
/NXsensor/value-field
/NXsensor/value_deriv1-field
/NXsensor/value_deriv1_log-group
/NXsensor/value_deriv2-field
/NXsensor/value_deriv2_log-group
/NXsensor/value_log-group
/NXsensor@default-attribute
/NXsensor_scan/ENTRY-group
/NXsensor_scan/ENTRY/DATA-group
/NXsensor_scan/ENTRY/INSTRUMENT-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/PID-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/DATA-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/calibration_time-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control@description-attribute
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value_timestamp-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/independent_controllers-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/measurement_sensors-field
/NXsensor_scan/ENTRY/PROCESS-group
/NXsensor_scan/ENTRY/PROCESS/program-field
/NXsensor_scan/ENTRY/PROCESS/program@program_url-attribute
/NXsensor_scan/ENTRY/PROCESS/program@version-attribute
/NXsensor_scan/ENTRY/SAMPLE-group
/NXsensor_scan/ENTRY/SAMPLE/name-field
/NXsensor_scan/ENTRY/USER-group
/NXsensor_scan/ENTRY/USER/address-field
/NXsensor_scan/ENTRY/USER/affiliation-field
/NXsensor_scan/ENTRY/USER/email-field
/NXsensor_scan/ENTRY/USER/name-field
/NXsensor_scan/ENTRY/USER/orcid-field
/NXsensor_scan/ENTRY/USER/telephone_number-field
/NXsensor_scan/ENTRY/definition-field
/NXsensor_scan/ENTRY/definition@version-attribute
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/NXsensor_scan/ENTRY/experiment_description-field
/NXsensor_scan/ENTRY/experiment_identifier-field
/NXsensor_scan/ENTRY/start_time-field
/NXseparator/beamline_distance-field
/NXseparator/description-field
/NXseparator/read_Bfield_current-group
/NXseparator/read_Bfield_current/value-field
/NXseparator/read_Bfield_voltage-group
/NXseparator/read_Bfield_voltage/value-field
/NXseparator/read_Efield_current-group
/NXseparator/read_Efield_current/value-field
/NXseparator/read_Efield_voltage-group
/NXseparator/read_Efield_voltage/value-field
/NXseparator/set_Bfield_current-field
/NXseparator/set_Efield_voltage-field
/NXshape/direction-field
/NXshape/shape-field
/NXshape/size-field
/NXshape@default-attribute
/NXsimilarity_grouping/cardinality-field
/NXsimilarity_grouping/categorical_label-field
/NXsimilarity_grouping/identifier_offset-field
/NXsimilarity_grouping/number_of_categorical_labels-field
/NXsimilarity_grouping/number_of_numeric_labels-field
/NXsimilarity_grouping/numerical_label-field
/NXsimilarity_grouping/statistics-group
/NXsimilarity_grouping/statistics/feature_identifier-field
/NXsimilarity_grouping/statistics/feature_member_count-field
/NXsimilarity_grouping/statistics/noise-field
/NXsimilarity_grouping/statistics/number_of_features-field
/NXsimilarity_grouping/statistics/number_of_unassigned_members-field
/NXslip_system_set/is_specific-field
/NXslip_system_set/lattice_type-field
/NXslip_system_set/miller_direction-field
/NXslip_system_set/miller_plane-field
/NXslit/TRANSFORMATIONS-group
/NXslit/depends_on-field
/NXslit/x_gap-field
/NXslit/y_gap-field
/NXslit@default-attribute
/NXsnsevent/ENTRY-group
/NXsnsevent/ENTRY/DASlogs-group
/NXsnsevent/ENTRY/DASlogs/LOG-group
/NXsnsevent/ENTRY/DASlogs/LOG/average_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value_error-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/LOG/description-field
/NXsnsevent/ENTRY/DASlogs/LOG/duration-field
/NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/minimum_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/time-field
/NXsnsevent/ENTRY/DASlogs/LOG/value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER-group
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/duration-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/minimum_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/time-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/value-field
/NXsnsevent/ENTRY/DATA-group
/NXsnsevent/ENTRY/DATA/data_x_y-link
/NXsnsevent/ENTRY/DATA/x_pixel_offset-link
/NXsnsevent/ENTRY/DATA/y_pixel_offset-link
/NXsnsevent/ENTRY/EVENT_DATA-group
/NXsnsevent/ENTRY/EVENT_DATA/event_index-link
/NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link
/NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link
/NXsnsevent/ENTRY/EVENT_DATA/pulse_time-link
/NXsnsevent/ENTRY/MONITOR-group
/NXsnsevent/ENTRY/MONITOR/data-field
/NXsnsevent/ENTRY/MONITOR/distance-field
/NXsnsevent/ENTRY/MONITOR/mode-field
/NXsnsevent/ENTRY/MONITOR/time_of_flight-field
/NXsnsevent/ENTRY/SNSHistoTool-group
/NXsnsevent/ENTRY/SNSHistoTool/SNSbanking_file_name-field
/NXsnsevent/ENTRY/SNSHistoTool/SNSmapping_file_name-field
/NXsnsevent/ENTRY/SNSHistoTool/author-field
/NXsnsevent/ENTRY/SNSHistoTool/command1-field
/NXsnsevent/ENTRY/SNSHistoTool/date-field
/NXsnsevent/ENTRY/SNSHistoTool/description-field
/NXsnsevent/ENTRY/SNSHistoTool/version-field
/NXsnsevent/ENTRY/USER-group
/NXsnsevent/ENTRY/USER/facility_user_id-field
/NXsnsevent/ENTRY/USER/name-field
/NXsnsevent/ENTRY/USER/role-field
/NXsnsevent/ENTRY/collection_identifier-field
/NXsnsevent/ENTRY/collection_title-field
/NXsnsevent/ENTRY/definition-field
/NXsnsevent/ENTRY/duration-field
/NXsnsevent/ENTRY/end_time-field
/NXsnsevent/ENTRY/entry_identifier-field
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/NXxeuler/entry/sample/chi-field
/NXxeuler/entry/sample/phi-field
/NXxeuler/entry/sample/rotation_angle-field
/NXxkappa/entry-group
/NXxkappa/entry/definition-field
/NXxkappa/entry/instrument-group
/NXxkappa/entry/instrument/detector-group
/NXxkappa/entry/instrument/detector/polar_angle-field
/NXxkappa/entry/name-group
/NXxkappa/entry/name/kappa-link
/NXxkappa/entry/name/phi-link
/NXxkappa/entry/name/polar_angle-link
/NXxkappa/entry/name/rotation_angle-link
/NXxkappa/entry/sample-group
/NXxkappa/entry/sample/alpha-field
/NXxkappa/entry/sample/kappa-field
/NXxkappa/entry/sample/phi-field
/NXxkappa/entry/sample/rotation_angle-field
/NXxlaue/entry-group
/NXxlaue/entry/definition-field
/NXxlaue/entry/instrument-group
/NXxlaue/entry/instrument/source-group
/NXxlaue/entry/instrument/source/distribution-group
/NXxlaue/entry/instrument/source/distribution/data-field
/NXxlaue/entry/instrument/source/distribution/wavelength-field
/NXxlaueplate/entry-group
/NXxlaueplate/entry/definition-field
/NXxlaueplate/entry/instrument-group
/NXxlaueplate/entry/instrument/detector-group
/NXxlaueplate/entry/instrument/detector/diameter-field
/NXxnb/entry-group
/NXxnb/entry/definition-field
/NXxnb/entry/instrument-group
/NXxnb/entry/instrument/detector-group
/NXxnb/entry/instrument/detector/polar_angle-field
/NXxnb/entry/instrument/detector/tilt_angle-field
/NXxnb/entry/name-group
/NXxnb/entry/name/polar_angle-link
/NXxnb/entry/name/rotation_angle-link
/NXxnb/entry/name/tilt-link
/NXxnb/entry/sample-group
/NXxnb/entry/sample/rotation_angle-field
/NXxpcs/PROCESS-group
/NXxpcs/entry-group
/NXxpcs/entry/NOTE-group
/NXxpcs/entry/data-group
/NXxpcs/entry/data/G2_unnormalized-field
/NXxpcs/entry/data/G2_unnormalized@storage_mode-attribute
/NXxpcs/entry/data/delay_difference-field
/NXxpcs/entry/data/delay_difference@storage_mode-attribute
/NXxpcs/entry/data/frame_average-field
/NXxpcs/entry/data/frame_sum-field
/NXxpcs/entry/data/g2-field
/NXxpcs/entry/data/g2@storage_mode-attribute
/NXxpcs/entry/data/g2_derr-field
/NXxpcs/entry/data/g2_derr@storage_mode-attribute
/NXxpcs/entry/definition-field
/NXxpcs/entry/end_time-field
/NXxpcs/entry/entry_identifier-field
/NXxpcs/entry/entry_identifier_uuid-field
/NXxpcs/entry/instrument-group
/NXxpcs/entry/instrument/DETECTOR-group
/NXxpcs/entry/instrument/DETECTOR/beam_center_x-field
/NXxpcs/entry/instrument/DETECTOR/beam_center_y-field
/NXxpcs/entry/instrument/DETECTOR/count_time-field
/NXxpcs/entry/instrument/DETECTOR/description-field
/NXxpcs/entry/instrument/DETECTOR/distance-field
/NXxpcs/entry/instrument/DETECTOR/frame_time-field
/NXxpcs/entry/instrument/DETECTOR/x_pixel_size-field
/NXxpcs/entry/instrument/DETECTOR/y_pixel_size-field
/NXxpcs/entry/instrument/incident_beam-group
/NXxpcs/entry/instrument/incident_beam/extent-field
/NXxpcs/entry/instrument/incident_beam/incident_energy-field
/NXxpcs/entry/instrument/incident_beam/incident_energy_spread-field
/NXxpcs/entry/instrument/incident_beam/incident_polarization_type-field
/NXxpcs/entry/instrument/masks-group
/NXxpcs/entry/instrument/masks/dynamic_phi_list-field
/NXxpcs/entry/instrument/masks/dynamic_q_list-field
/NXxpcs/entry/instrument/masks/dynamic_roi_map-field
/NXxpcs/entry/instrument/masks/static_q_list-field
/NXxpcs/entry/instrument/masks/static_roi_map-field
/NXxpcs/entry/sample-group
/NXxpcs/entry/sample/position_x-group
/NXxpcs/entry/sample/position_y-group
/NXxpcs/entry/sample/position_z-group
/NXxpcs/entry/sample/temperature-field
/NXxpcs/entry/sample/temperature_set-field
/NXxpcs/entry/scan_number-field
/NXxpcs/entry/start_time-field
/NXxpcs/entry/twotime-group
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func-field
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func@storage_mode-attribute
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func_partials-field
/NXxpcs/entry/twotime/g2_from_two_time_corr_func-field
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@baseline_reference-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@storage_mode-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials-field
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@storage_mode-attribute
/NXxpcs/entry/twotime/two_time_corr_func-field
/NXxpcs/entry/twotime/two_time_corr_func@baseline_reference-attribute
/NXxpcs/entry/twotime/two_time_corr_func@populated_elements-attribute
/NXxpcs/entry/twotime/two_time_corr_func@storage_mode-attribute
/NXxpcs/entry/twotime/two_time_corr_func@time_origin_location-attribute
/NXxraylens/OFF_GEOMETRY-group
/NXxraylens/TRANSFORMATIONS-group
/NXxraylens/aperture-field
/NXxraylens/curvature-field
/NXxraylens/cylinder_orientation-group
/NXxraylens/cylindrical-field
/NXxraylens/depends_on-field
/NXxraylens/focus_type-field
/NXxraylens/gas-field
/NXxraylens/gas_pressure-field
/NXxraylens/lens_geometry-field
/NXxraylens/lens_length-field
/NXxraylens/lens_material-field
/NXxraylens/lens_thickness-field
/NXxraylens/number_of_lenses-field
/NXxraylens/symmetric-field
/NXxraylens@default-attribute
/NXxrot/entry-group
/NXxrot/entry/definition-field
/NXxrot/entry/instrument-group
/NXxrot/entry/instrument/attenuator-group
/NXxrot/entry/instrument/attenuator/attenuator_transmission-field
/NXxrot/entry/instrument/detector-group
/NXxrot/entry/instrument/detector/beam_center_x-field
/NXxrot/entry/instrument/detector/beam_center_y-field
/NXxrot/entry/instrument/detector/polar_angle-field
/NXxrot/entry/name-group
/NXxrot/entry/name/rotation_angle-link
/NXxrot/entry/sample-group
/NXxrot/entry/sample/rotation_angle-field
/NXxrot/entry/sample/rotation_angle_step-field