application definition, extends NXxbase
raw data from a single crystal diffractometer, extends NXxbase
This is the application definition for raw data from a single crystal diffractometer measuring in normal beam mode. It extends NXxbase, so the full definition is the content of NXxbase plus the data defined here. All angles are logged in order to support arbitrary scans in reciprocal space.
The symbol(s) listed here will be used below to coordinate datasets with the same shape.
nP: Number of points
entry: (required) NXentry
definition: (required) NX_CHAR
Official NeXus NXDL schema to which this file conforms
instrument: (required) NXinstrument
detector: (required) NXdetector
sample: (required) NXsample
name: (required) NXdata
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.