3.3.1.11. Scanning Probe Microscopy

Introduction

These are the base classes to describe components of a scanning probe microscope (SPM) and its associated experimental configurations. These base classes are used within the SPM-related application definitions, specifically in NXspm, NXstm, NXsts, and NXafm.

Base Classes

NXamplifier:

A base class to describe an amplifier instrument.

NXlockin:

A base class to describe a lock-in amplifier instrument.

NXphase_lock_loop:

A base class to describe a phase lock loop in AFM experiments.

NXrcs:

A base class to describe a remote control system.

NXspm_bias_spectroscopy:

A base class to describe bias spectroscopy measurement to measure I/V curves in STS experiments.

NXspm_cantilever:

A base class to characterize the cantilever used in AFM experiments.

NXspm_cantilever_config:

A base class to describe cantilever configuration in AFM experiments.

NXspm_cantilever_oscillator:

A base class to describe the cantilever oscillator in AFM experiments.

NXspm_piezo_config:

A base class to describe piezo configuration in SPM experiments.

NXspm_piezo_sensor:

A base class to describe a piezo sensor in SPM experiments.

NXspm_piezoelectric_material:

A base class to describe piezoelectric material properties used in a cantilever tip.

NXspm_positioner:

A base class to describe a PID positioner in SPM experiments.

NXspm_scan_control:

A base class to characterize the movement of a scan probe in a multi-dimensional phase space.

NXspm_scan_pattern:

A base class to define the pattern of a scan in a given scan region.

NXspm_scan_region:

A base class to define the phase space or sub-phase space for a scan in SPM experiments.

NXspm_temperature_sensor:

A base class to describe a temperature sensor in SPM experiments.