3.3.1.155. NXspm_cantilever¶
Status:
base class, extends NXcomponent
Description:
A base class to describe the cantilever used in Atomic Force Microscopy (AFM). …
A base class to describe the cantilever used in Atomic Force Microscopy (AFM).
The cantilever defines the probe frame, following the usual convention of cantilever beam mechanics: origin at the clamped end of the cantilever on the chip,
xalong the cantilever long axis from the chip towards the tip (the tip is atx= cantilever length),znormal to the cantilever and pointing away from the tip side, andy=z×x. Its orientation is given bydepends_onandtransformations.
Symbols:
No symbol table
Structure:
cantilever_oscillator: (optional) NXspm_cantilever_oscillator
The oscillator of the cantilever.
cantilever_config: (optional) NXspm_cantilever_config
The configuration parameters of the cantilever used in scanning probe …
The configuration parameters of the cantilever used in scanning probe microscopy.
phase_positioner: (optional) NXpositioner
The phase positioner of the cantilever.
amplitude_positioner: (optional) NXpositioner
The amplitude positioner of the cantilever.
depends_on: (optional) NX_CHAR ⤆
Orientation of the probe frame in its parent frame. Points to the transformati …
Orientation of the probe frame in its parent frame. Points to the transformation in transformations that is applied first to a direction in the probe frame.
transformations: (optional) NXtransformations ⤆
Rotations that orient the probe frame, typically the cantilever tilt about the …
Rotations that orient the probe frame, typically the cantilever tilt about the
yaxis followed by the in-plane angle aboutz. The position of the tip during the scan is given in the scanner frame (e.g. by the piezo sensor) and is not part of this chain.
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.