3.3.2.37. NXspm¶
Status:
application definition, extends NXsensor_scan
Description:
Scanning Probe Microscopy (SPM) is a branch of microscopy that utilizes a physic …
Scanning Probe Microscopy (SPM) is a branch of microscopy that utilizes a physical probe to scan the surface of sample and image it at the atomic level.
The application class NXspm is designed as a skeleton and contains common technical concepts for specific SPM sub-techniques such as STM, STS, AFM etc. In addition, it can be utilized to describe the SPM experiments without further specialization for each sub-technique.
Frames of reference
SPM has no beam, so the default NeXus (McStas) coordinate system does not apply. NXspm uses five right-handed Cartesian frames. The scanner frame is the central frame: every other frame is defined relative to it, directly or through one intermediate frame.
Scanner frame (central): origin at the undeflected piezo position (zero offset, zero scan angle, Z piezo at its zero) or at the centre determined by the scanner calibration.
xandyare the lateral drive axes of the scanner;zis normal to the sample plane and points from the sample towards the probe. It describes the relative tip-sample displacement, independent of whether the tip or the sample is moved.Scan frame (one per scan): origin at the centre of the scan area,
xalong the fast scan axis,yalong the slow scan axis. It is placed in the scanner frame by the scan offset and the scan angle.Probe frame (AFM): origin at the clamped end of the cantilever on the chip,
xalong the cantilever long axis from the chip towards the tip,znormal to the cantilever. It is oriented in the scanner frame by the cantilever tilt and its in-plane angle.Stage frame: the sample stage or coarse positioner, including the sample holder. It is placed in the scanner frame by the stage position. If no stage position is recorded, it coincides with the scanner frame.
Sample frame: origin at a fiducial on the sample,
znormal to the sample surface. It is placed in the stage frame by the mounting translation and rotation.The relationships follow the
depends_ondirection of NXtransformations, which points towards the scanner frame:scan frame --[offset, scan angle]---------+ probe frame --[tilt, in-plane angle]-------+--> scanner frame stage frame --[stage position]-------------+ sample frame --[mount translation, rotation]--> stage frameConventions: positive rotations about
zfollow the right-hand rule, i.e. they are counter-clockwise when viewed from the probe side looking down onto the sample surface (from+ztowards-z). The measured data stay on the grid of the scan frame and are not resampled; only the transformations are recorded.
Symbols:
No symbol table
- Groups cited:
NXamplifier, NXcalibration, NXcite, NXcollection, NXcoordinate_system, NXdata, NXentry, NXenvironment, NXfabrication, NXhistory, NXinstrument, NXlockin, NXmanipulator, NXparameters, NXpid_controller, NXprocess, NXrcs, NXsample, NXsensor, NXspm_bias_spectroscopy, NXspm_piezo_sensor, NXspm_positioner, NXspm_scan_control, NXspm_scan_pattern, NXspm_scan_region, NXspm_temperature_sensor, NXtransformations
Structure:
definition: (required) NX_CHAR ⤆
Name of the definition that is used for the application. …
Name of the definition that is used for the application.
Obligatory value:
NXspmexperiment_technique: (required) NX_CHAR
The technique of the experiment like STM, STS, AFM. …
The technique of the experiment like STM, STS, AFM.
Any of these values:
STM|STS|AFMscan_mode: (optional) NX_CHAR
scan_type: (recommended) NX_CHAR
The type of the scan. It mainly describes how scan probe moves in the scan r …
The type of the scan. It mainly describes how scan probe moves in the scan region, e.g. forward, backward, or both (if scan is repeated). Any lab defined scan type
identifier_experiment: (recommended) NX_CHAR ⤆
The identifier for the experiment which should be unique at least in lab.
scanner_frame: (recommended) NXcoordinate_system
The scanner frame, the central frame of reference of SPM (see the frames of …
The scanner frame, the central frame of reference of SPM (see the frames of reference in the description of NXspm).
The scanner frame is fixed by the instrument and its scanner calibration. It changes only on recalibration or when the scanner is exchanged. All lateral and vertical quantities of the piezo scanner (e.g. scan offsets, scan angle, piezo ranges) are expressed in this frame.
Every transformation chain in this entry ends here. As this is the only NXcoordinate_system in the entry, a
depends_onthat is not given refers to this frame.The point from which all scanner-frame positions (scan offsets, scan start …
The point from which all scanner-frame positions (scan offsets, scan start and end, piezo positions) are measured.
Any of these values:
undeflected piezo position: Zero voltage on all scanner piezos: zero scan offset, zero scan angle, and the Z piezo at its zero position. The axes are the nominal drive axes of the scanner.
calibrated piezo position: The centre of the scanner frame as determined by the scanner calibration, which also determines the directions of the axes. It may or may not differ from the undeflected piezo position.Obligatory value:
cartesianx_direction: (recommended) NX_CHAR ⤆
The first lateral drive axis of the scanner.
y_direction: (recommended) NX_CHAR ⤆
The second lateral drive axis of the scanner, such that
x,yand …The second lateral drive axis of the scanner, such that
x,yandzform a right-handed system.z_direction: (required) NX_CHAR ⤆
Normal to the sample plane, pointing from the sample towards the probe. …
Normal to the sample plane, pointing from the sample towards the probe.
Obligatory value:
from sample towards probeObligatory value:
[1, 0, 0]Obligatory value:
[0, 1, 0]Obligatory value:
[0, 0, 1]depends_on: (required) NX_CHAR ⤆
The scanner frame is the root of all transformation chains in SPM and does …
The scanner frame is the root of all transformation chains in SPM and does not depend on another frame.
Obligatory value:
.PROCESS: (optional) NXprocess ⤆
Define data processing (e.g., data analysis, image processing) program and …
Define data processing (e.g., data analysis, image processing) program and associated workflow, software and store results.
INSTRUMENT: (required) NXinstrument ⤆
hardware: (required) NXfabrication ⤆
The hardware description of core instrument setup of experiment. …
The hardware description of core instrument setup of experiment. Usually, the entire instrument is supplied by a single manufacturer. To describe the hardware from any sub-components, use the
hardwaregroup of that sub-component (child group of the NXinstrument group) group.name: (recommended) NX_CHAR
Name of the hardware.
Company name of the manufacturer.
model: (recommended) NX_CHAR ⤆
Version or model of the hardware setup provided by the manufacturer.
software: (required) NXfabrication ⤆
The software description of core instrument setup of experiment. …
The software description of core instrument setup of experiment. Usually, the entire instrument is supplied by a single name/manufacturer/model/etc. To describe the software from any sub-components, use the
softwaregroup of that component.name: (optional) NX_CHAR
Name of the software.
Company name of the manufacturer.
model: (recommended) NX_CHAR ⤆
Version or model of the component named by the manufacturer.
real_time_controller: (recommended) NXrcs
lockin_amplifier: (optional) NXlockin
The lock-in amplifier information.
flip_sign: (optional) NX_NUMBER
The sign (1 or -1) that renders the values of the lock-in current positi …
The sign (1 or -1) that renders the values of the lock-in current positive. The calibration procedure with retracted tip is normally performed to compensate for the signal phase delay in SPM. The procedure yields two possible solutions corresponding to the chosen phase, this number should be equal to 1 or -1 depending on which solution is chosen (this concept mainly used in STS experiments).
active_channel: (recommended) NX_CHAR
The name of the active channel of the lock-in amplifier which is used fo …
The name of the active channel of the lock-in amplifier which is used for the measurement.
stage: (optional) NXmanipulator
The sample stage or coarse positioner (e.g. stick-slip piezo motors, stepp …
The sample stage or coarse positioner (e.g. stick-slip piezo motors, stepper motors), including the sample holder that moves with it. It defines the stage frame: the coarse position of the sample relative to the tip, with axes nominally parallel to the axes of the scanner frame. The stage frame is fixed between coarse moves. A removable sample holder that is taken out and put back between scans is not part of this frame.
The stage positions are given as the transformations of this group. If no stage position is recorded (e.g. Nanonis files), the stage frame coincides with the scanner frame.
depends_on: (required) NX_CHAR ⤆
Places the stage frame in the scanner frame. …
Places the stage frame in the scanner frame.
Obligatory value:
transformations/stage_ztransformations: (required) NXtransformations ⤆
The stage position as a transformation chain that ends in the scanner fr …
The stage position as a transformation chain that ends in the scanner frame:
stage_z -> stage_y -> stage_x -> scanner_frameEach axis may move either the sample or the head (e.g. on a tip-scanning instrument the XY stage may move the sample and the Z motor the head). The
vectorof each axis therefore gives the direction in which the sample moves relative to the tip for a positive value. A misalignment between the stage axes and the scanner axes is assumed to be zero.stage_z: (required) NX_NUMBER {units=NX_LENGTH} ⤆
Stage position along
z.@transformation_type: (required) NX_CHAR ⤆
Obligatory value:
translation@vector: (required) NX_NUMBER ⤆
Unit vector, in the scanner frame, along which a positive value of …
Unit vector, in the scanner frame, along which a positive value of
stage_zmoves the sample relative to the tip. It depends on the instrument, e.g. on whether this axis moves the sample or the head.@depends_on: (required) NX_CHAR ⤆
Obligatory value:
stage_ystage_y: (required) NX_NUMBER {units=NX_LENGTH} ⤆
Stage position along
y.@transformation_type: (required) NX_CHAR ⤆
Obligatory value:
translation@vector: (required) NX_NUMBER ⤆
Unit vector, in the scanner frame, along which a positive value of …
Unit vector, in the scanner frame, along which a positive value of
stage_ymoves the sample relative to the tip. It depends on the instrument, e.g. on whether this axis moves the sample or the head.@depends_on: (required) NX_CHAR ⤆
Obligatory value:
stage_xstage_x: (required) NX_NUMBER {units=NX_LENGTH} ⤆
Stage position along
x.@transformation_type: (required) NX_CHAR ⤆
Obligatory value:
translation@vector: (required) NX_NUMBER ⤆
Unit vector, in the scanner frame, along which a positive value of …
Unit vector, in the scanner frame, along which a positive value of
stage_xmoves the sample relative to the tip. It depends on the instrument, e.g. on whether this axis moves the sample or the head.@depends_on: (required) NX_CHAR ⤆
Path to the scanner_frame …
Path to the scanner_frame group of this entry.
SCAN_ENVIRONMENT: (required) NXenvironment ⤆
Information of the scan environment holding concept for …
Information of the scan environment holding concept for temperature, setpoint (current or height), scan area and scan data.
Note: At least one field from head_temperature, cryo_bottom_temperature and cryo_shield_temperature must be provided.
head_temperature: (recommended) NX_NUMBER {units=NX_TEMPERATURE}
Temperature (stabilized or target value) of STM head. For array data of …
Temperature (stabilized or target value) of STM head. For array data of head_temperature, use head_temperature_sensor group.
identifier_environment: (recommended) NX_CHAR ⤆
Unique identifier for the scan environment defined by the user or lab. W …
Unique identifier for the scan environment defined by the user or lab. When multiple scans are performed in a single environment conditions or settings, the entire scan environment can be differentiated by this identifier. For example, scan on a sample of TiSe2 with layered of evaporated pyrene and annealed at 300K temperature for 5 min process.
cryo_bottom_temperature: (recommended) NX_NUMBER {units=NX_TEMPERATURE}
Temperature (stabilized or targeted single value) of the cold tail of th …
Temperature (stabilized or targeted single value) of the cold tail of the cryostat. For array data of cryo_bottom_temperature, use cryo_bottom_temperature_sensor group.
cryo_shield_temperature: (recommended) NX_NUMBER {units=NX_TEMPERATURE}
Temperature (stabilized or targeted single value) of liquid nitrogen shi …
Temperature (stabilized or targeted single value) of liquid nitrogen shield. For array data of cryo_shield_temperature, use cryo_shield_temperature_sensor group.
current_sensorTAG: (optional) NXsensor ⤆
This should be a link to …
This should be a link to /entry/instrument/current_sensorTAG
voltage_sensorTAG: (optional) NXsensor ⤆
This should be a link to …
This should be a link to /entry/instrument/voltage_sensorTAG
piezo_sensor: (optional) NXspm_piezo_sensor
This should be a link to …
This should be a link to /entry/instrument/piezo_sensor.
XYZpiezo_sensor: (optional) NXspm_piezo_sensor
This should be a link to …
This should be a link to /entry/instrument/XYZpiezo_sensor.
height_piezo_sensor: (optional) NXspm_piezo_sensor
This should be a link to the concept …
This should be a link to the concept entry/instrument/height_piezo_sensor.
SPM_SCAN_CONTROL: (required) NXspm_scan_control
The scan control information like scan region or phase space, type of sc …
The scan control information like scan region or phase space, type of scan (e.g. mesh, spiral, etc.), and scan speed, etc. This group mainly stores the scan settings data. For processed data or final experimental data would go to NXdata group.
scanTAG: (recommended) NX_CHAR
If there are multiple scans performed under the same environment, use …
If there are multiple scans performed under the same environment, use this field to differentiate among them.
scan_region: (required) NXspm_scan_region ⤆
The scan region (phase space or sub-phase space) is the region where t …
The scan region (phase space or sub-phase space) is the region where the scan is performed.
scan_range_x: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The range of the scan in x direction.
scan_range_y: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The range of the scan in y direction.
scan_offset_value_x: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The offset of the scan in x direction.
scan_offset_value_y: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The offset of the scan in y direction.
scan_angle_x: (recommended) NX_NUMBER {units=NX_ANGLE} ⤆
The angle of the fast scan axis from the
xaxis of the scanner f …The angle of the fast scan axis from the
xaxis of the scanner frame (rotation aboutz).scan_angle_y: (optional) NX_NUMBER {units=NX_ANGLE} ⤆
The rotation angle of the scan region seen from the
yaxis. It i …The rotation angle of the scan region seen from the
yaxis. It is supposed to be equal to scan_angle_x; scan_angle_x alone is sufficient.scan_start_x: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The start of the scan in x direction.
scan_start_y: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The start of the scan in y direction.
scan_end_x: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The end of the scan in x direction.
scan_end_y: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The end of the scan in y direction.
depends_on: (recommended) NX_CHAR ⤆
Places the scan frame in the scanner frame. A position
uin the …Places the scan frame in the scanner frame. A position
uin the scan frame maps top = o + R(scan_angle) uin the scanner frame, whereois the scan offset.Obligatory value:
transformations/scan_angletransformations: (recommended) NXtransformations ⤆
The scan offset and the scan angle as a transformation chain that en …
The scan offset and the scan angle as a transformation chain that ends in the scanner frame:
scan_angle -> offset_y -> offset_x -> scanner_frameThe values are the same as scan_angle_x, scan_offset_value_y and scan_offset_value_x of this scan region.
scan_angle: (required) NX_NUMBER {units=NX_ANGLE} ⤆
Rotation of the scan frame about
zthrough the centre of the s …Rotation of the scan frame about
zthrough the centre of the scan region. Same value as scan_angle_x.@transformation_type: (required) NX_CHAR ⤆
Obligatory value:
rotation@vector: (required) NX_NUMBER ⤆
Obligatory value:
[0, 0, 1]@depends_on: (required) NX_CHAR ⤆
Obligatory value:
offset_yoffset_y: (required) NX_NUMBER {units=NX_LENGTH} ⤆
Scan offset along
yof the scanner frame. Same value as …Scan offset along
yof the scanner frame. Same value as scan_offset_value_y.@transformation_type: (required) NX_CHAR ⤆
Obligatory value:
translation@vector: (required) NX_NUMBER ⤆
Obligatory value:
[0, 1, 0]@depends_on: (required) NX_CHAR ⤆
Obligatory value:
offset_xoffset_x: (required) NX_NUMBER {units=NX_LENGTH} ⤆
Scan offset along
xof the scanner frame. Same value as …Scan offset along
xof the scanner frame. Same value as scan_offset_value_x.@transformation_type: (required) NX_CHAR ⤆
Obligatory value:
translation@vector: (required) NX_NUMBER ⤆
Obligatory value:
[1, 0, 0]@depends_on: (required) NX_CHAR ⤆
Path to the …
Path to the scanner_frame group of this entry.
meshSCAN: (required) NXspm_scan_pattern ⤆
The mesh scan is a common technique used in SPM to scan the surface of …
The mesh scan is a common technique used in SPM to scan the surface of the sample in a grid pattern.
scan_points_x: (required) NX_NUMBER ⤆
The number of points scanned in x direction.
scan_points_y: (required) NX_NUMBER ⤆
The number of points scanned in y direction.
step_size_x: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The step size in x direction.
step_size_y: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The step size in y direction.
current_sensorTAG: (optional) NXsensor ⤆
Information for current sensor. Any current sensor such as a current-volta …
Information for current sensor. Any current sensor such as a current-voltage transimpedance amplifier involved in the experiment or in any special measurement or in any specialized experiment component can be registered under this group.
NAMEcurrent: (optional) NX_CHAR
The name of the current sensor used for specific measurement or in component.
current: (required) NX_NUMBER {units=NX_CURRENT}
Name of the current according to the purpose of the measurement. …
Name of the current according to the purpose of the measurement. E.g., the field can be named as tip_current defining the current measured at the tip.
offset_value: (optional) NX_NUMBER {units=NX_CURRENT}
The offset in the tunneling current between tip and sample.
calibration: (optional) NXcalibration
AMPLIFIER: (optional) NXamplifier
An amplifier information that amplifies the input signal.
current_gain: (optional) NX_NUMBER {units=NX_UNITLESS}
The gain of the current sensor.
voltage_sensorTAG: (optional) NXsensor ⤆
The sensor information for the voltage device. Any voltage sensor involved …
The sensor information for the voltage device. Any voltage sensor involved in the experiment or in any special measurement or in any specialized experiment component can be registered under this group.
For this purpose, replace the TAG with the specific name or ID of the voltage sensor.
Do not register this group for sample bias voltage (DC), for that we have sample_bias_voltage group.
NAMEvoltage: (optional) NX_CHAR
The name of the voltage according to the purpose of the measurement. …
The name of the voltage according to the purpose of the measurement. E.g., the field can be named as x_source_drain_bias_voltage defining the applied bias along the x-axis as source-drain channel, while current (tip current) will be measured along the z-axis.
voltage: (optional) NX_NUMBER {units=NX_VOLTAGE}
Voltage measured by sensor.
offset_value: (optional) NX_NUMBER {units=NX_VOLTAGE}
The offset voltage. The real voltage is the sum of the voltage and the o …
The offset voltage. The real voltage is the sum of the voltage and the offset voltage.
calibration: (optional) NXcalibration
AMPLIFIER: (optional) NXamplifier
An amplifier information that amplifies the input signal.
voltage_gain: (optional) NX_NUMBER {units=NX_UNITLESS}
The gain of the voltage sensor.
piezo_sensor: (optional) NXspm_piezo_sensor
This piezo sensor group refers to the XYZ (in all directions) piezo sensor.
depends_on: (optional) NX_CHAR ⤆
Path to the scanner_frame …
Path to the scanner_frame group of this entry, in which
x,yandzare given. If it is not given, the scanner frame applies, as it is the only NXcoordinate_system in the entry.x: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The position of the tip relative to the sample along
xof the scanner frame.y: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The position of the tip relative to the sample along
yof the scanner frame.z: (recommended) NX_NUMBER {units=NX_LENGTH} ⤆
The position of the tip relative to the sample along
zof the scanne …The position of the tip relative to the sample along
zof the scanner frame (positive away from the sample).height_piezo_sensor: (recommended) NXspm_piezo_sensor
The sensor information for the height (Z-axis) piezo device.
XYZpiezo_sensor: (optional) NXspm_piezo_sensor
For separate piezo sensors along X-, Y-, and Z-axis register this group, e …
For separate piezo sensors along X-, Y-, and Z-axis register this group, e.g., x_piezo_sensor or height_piezo_sensor.
head_temperature_sensor: (recommended) NXspm_temperature_sensor
The temperature of the SPM measured near the sample or tip. This group is …
The temperature of the SPM measured near the sample or tip. This group is intended to be used for an array data (e.g., time series).
cryo_bottom_temperature_sensor: (optional) NXspm_temperature_sensor
The temperature of the cold tail of the cryostat. This group is intended t …
The temperature of the cold tail of the cryostat. This group is intended to be used for an array data (e.g., time series).
cryo_shield_temperature_sensor: (optional) NXspm_temperature_sensor
The temperature of the liquid nitrogen shield. This group is intended to b …
The temperature of the liquid nitrogen shield. This group is intended to be used for an array data (e.g., time series).
sample_temperature_sensor: (optional) NXspm_temperature_sensor
The temperature of the sample. This group is intended to be used for …
The temperature of the sample. This group is intended to be used for an array data (e.g., time series).
bias_spectroscopy_environment: (optional) NXenvironment ⤆
To explain bias and current behavior (sweep measurement especially in STS …
To explain bias and current behavior (sweep measurement especially in STS experiment) due to voltage applied to the sample.
In some experiments, e.g., STM, bias spectroscopy could also be part of the measurement setup.
SPM_BIAS_SPECTROSCOPY: (required) NXspm_bias_spectroscopy
Setup and scan data for continuous measurement of bias voltage on the su …
Setup and scan data for continuous measurement of bias voltage on the subject of experiment vs tunneling current from probe.
SPM_POSITIONER: (recommended) NXspm_positioner ⤆
Information about positioner used in STS scan settings, like PID contr …
Information about positioner used in STS scan settings, like PID controller and offset.
Reuse, if needed, this group for positioners for multiple scans at different points on sample.
z_controller: (recommended) NXpid_controller ⤆
BIAS_SWEEP: (required) NXspm_scan_control ⤆
The bias voltage sweep is a common technique used to study properties …
The bias voltage sweep is a common technique used to study properties (in this case current) in the sample or environment due to change in applied bias voltage.
scan_region: (required) NXspm_scan_region ⤆
The scan region (phase space or sub-phase space) is the region where …
The scan region (phase space or sub-phase space) is the region where the scan is performed.
scan_start_bias: (required) NX_NUMBER {units=NX_VOLTAGE} ⤆
scan_end_bias: (required) NX_NUMBER {units=NX_VOLTAGE} ⤆
scan_offset_bias: (required) NX_NUMBER {units=NX_VOLTAGE} ⤆
The offset of the bias scan voltage.
scan_range_bias: (recommended) NX_NUMBER {units=NX_VOLTAGE} ⤆
linear_sweep: (required) NXspm_scan_pattern ⤆
The linear sweep is a common technique used on the substance or samp …
The linear sweep is a common technique used on the substance or sample or environment to study the change in the behavior of the sample or substance or environment due to change in applied bias voltage.
sample_bias_voltage: (optional) NXsensor ⤆
The DC bias voltage that is applied to the sample (for example in constant …
The DC bias voltage that is applied to the sample (for example in constant- current mode in STM).
bias_voltage: (required) NX_NUMBER {units=NX_VOLTAGE}
The bias voltage (DC) applied to the sample.
bias_offset_value: (optional) NX_NUMBER {units=NX_VOLTAGE}
Offset value of the bias voltage.
calibration: (optional) NXcalibration
Calibration of the bias voltage measurement (V/V).
calibration_parameters: (optional) NXparameters ⤆
The sample information.
depends_on: (optional) NX_CHAR ⤆
Places the sample frame (origin at a fiducial on the sample,
xalong a …Places the sample frame (origin at a fiducial on the sample,
xalong a straight reference on the sample such as an edge or a crystal direction,znormal to the sample surface) in the stage frame.Obligatory value:
transformations/mount_rotationtransformations: (optional) NXtransformations ⤆
The mounting of the sample as a transformation chain that ends in the stag …
The mounting of the sample as a transformation chain that ends in the stage frame:
mount_rotation -> mount_translation_x -> mount_translation_y -> mount_translation_z -> stage chain (or scanner_frame)mount_rotation: (required) NX_NUMBER {units=NX_ANGLE} ⤆
mount_translation_x: (required) NX_NUMBER {units=NX_LENGTH} ⤆
mount_translation_y: (required) NX_NUMBER {units=NX_LENGTH} ⤆
mount_translation_z: (required) NX_NUMBER {units=NX_LENGTH} ⤆
Position of the sample origin along
zof the stage frame.@transformation_type: (required) NX_CHAR ⤆
Obligatory value:
translation@vector: (required) NX_NUMBER ⤆
Obligatory value:
[0, 0, 1]@depends_on: (required) NX_CHAR ⤆
Path to …
Path to stage_z of the stage, or to the scanner_frame group if no stage position is given.
history: (recommended) NXhistory ⤆
A set of physical processes that occurred to the sample prior/during experiment.
sample_environment: (optional) NXenvironment ⤆
Information of environment around the sample.
temperature: (recommended) NX_NUMBER {units=NX_TEMPERATURE}
The single-valued temperature of the sample, also referred to as the tip …
The single-valued temperature of the sample, also referred to as the tip temperature (not head temperature), since the tip and sample are in contact or in close proximity. For array like temperature data use sample_temperature_sensor group.
sample_bias_voltage: (optional) NXsensor ⤆
This should be a link to …
This should be a link to
/entry/instrument/sample_bias_voltage sensor under instrument.
sample_temperature_sensor: (optional) NXspm_temperature_sensor
This should be a link to …
This should be a link to
/entry/instrument/sample_temperature_sensor under instrument.
The data group.
DATA: (required) NX_NUMBER {units=NX_ANY} ⤆
The data (e.g. current, voltage, temperature) field that can be plotted ag …
The data (e.g. current, voltage, temperature) field that can be plotted against the axes.
AXISNAME: (required) NX_CHAR_OR_NUMBER {units=NX_ANY} ⤆
The name of the axis that corresponds to the data field.
citeID: (recommended) NXcite
The citation information for the experiment, e.g., author names.
reproducibility_indicators: (optional) NXcollection ⤆
The group of indicators (links to the existing fields in different groups) t …
The group of indicators (links to the existing fields in different groups) that measure the reproducibility of the experiment.
LINK_TO_GROUP: (optional) NXcollection ⤆
A place holder to create link to any group relevant considered as …
A place holder to create link to any group relevant considered as reproducibility indicators (defined by laboratory).
LINK_TO_FIELD: (optional) NX_CHAR
A place holder to create link to any field relevant considered as …
A place holder to create link to any field relevant considered as reproducibility indicators (defined by laboratory).
resolution_indicators: (optional) NXcollection ⤆
The group of indicators (links to the existing fields in different groups) t …
The group of indicators (links to the existing fields in different groups) that are used to measure the resolution of the experiment results.
LINK_TO_GROUP: (optional) NXcollection ⤆
A place holder to create link to any group relevant considered as …
A place holder to create link to any group relevant considered as reproducibility indicators (defined by laboratory).
LINK_TO_FIELD: (optional) NX_CHAR
A place holder to create link to any field relevant considered as …
A place holder to create link to any field relevant considered as reproducibility indicators (defined by laboratory).
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.
/NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/SPM_BIAS_SPECTROSCOPY-group
/NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/SPM_BIAS_SPECTROSCOPY/BIAS_SWEEP-group
/NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/SPM_BIAS_SPECTROSCOPY/SPM_POSITIONER-group
/NXspm/ENTRY/INSTRUMENT/cryo_bottom_temperature_sensor-group
/NXspm/ENTRY/INSTRUMENT/cryo_shield_temperature_sensor-group
/NXspm/ENTRY/INSTRUMENT/current_sensorTAG/AMPLIFIER/current_gain-field
/NXspm/ENTRY/INSTRUMENT/current_sensorTAG/calibration/calibration_parameters-group
/NXspm/ENTRY/INSTRUMENT/current_sensorTAG/calibration/calibration_parameters/coefficient-field
/NXspm/ENTRY/INSTRUMENT/current_sensorTAG/offset_value-field
/NXspm/ENTRY/INSTRUMENT/lockin_amplifier/active_channel-field
/NXspm/ENTRY/INSTRUMENT/sample_bias_voltage/bias_offset_value-field
/NXspm/ENTRY/INSTRUMENT/sample_bias_voltage/bias_voltage-field
/NXspm/ENTRY/INSTRUMENT/sample_bias_voltage/calibration-group
/NXspm/ENTRY/INSTRUMENT/sample_bias_voltage/calibration/calibration_parameters-group
/NXspm/ENTRY/INSTRUMENT/sample_bias_voltage/calibration/calibration_parameters/coefficient-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/cryo_bottom_temperature-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/cryo_shield_temperature-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/current_sensorTAG-group
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/head_temperature-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/height_piezo_sensor-group
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/identifier_environment-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL-group
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/meshSCAN-group
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/meshSCAN/scan_points_x-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/meshSCAN/scan_points_y-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/meshSCAN/step_size_x-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/meshSCAN/step_size_y-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region-group
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/depends_on-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_angle_x-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_angle_y-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_end_x-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_end_y-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_offset_value_x-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_offset_value_y-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_range_x-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_range_y-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_start_x-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/scan_start_y-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/transformations-group
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/transformations/offset_x-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scan_region/transformations/offset_y-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL/scanTAG-field
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/voltage_sensorTAG-group
/NXspm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/XYZpiezo_sensor-group
/NXspm/ENTRY/INSTRUMENT/stage/transformations/stage_x@depends_on-attribute
/NXspm/ENTRY/INSTRUMENT/stage/transformations/stage_x@transformation_type-attribute
/NXspm/ENTRY/INSTRUMENT/stage/transformations/stage_x@vector-attribute
/NXspm/ENTRY/INSTRUMENT/stage/transformations/stage_y@depends_on-attribute
/NXspm/ENTRY/INSTRUMENT/stage/transformations/stage_y@transformation_type-attribute
/NXspm/ENTRY/INSTRUMENT/stage/transformations/stage_y@vector-attribute
/NXspm/ENTRY/INSTRUMENT/stage/transformations/stage_z@depends_on-attribute
/NXspm/ENTRY/INSTRUMENT/stage/transformations/stage_z@transformation_type-attribute
/NXspm/ENTRY/INSTRUMENT/stage/transformations/stage_z@vector-attribute
/NXspm/ENTRY/INSTRUMENT/voltage_sensorTAG/AMPLIFIER/voltage_gain-field
/NXspm/ENTRY/INSTRUMENT/voltage_sensorTAG/calibration/calibration_parameters-group
/NXspm/ENTRY/INSTRUMENT/voltage_sensorTAG/calibration/calibration_parameters/coefficient-field
/NXspm/ENTRY/INSTRUMENT/voltage_sensorTAG/offset_value-field
/NXspm/ENTRY/SAMPLE/sample_environment/sample_bias_voltage-group
/NXspm/ENTRY/SAMPLE/sample_environment/sample_temperature_sensor-group
/NXspm/ENTRY/SAMPLE/transformations/mount_rotation@depends_on-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_rotation@transformation_type-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_rotation@vector-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_x-field
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_x@depends_on-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_x@transformation_type-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_x@vector-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_y-field
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_y@depends_on-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_y@transformation_type-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_y@vector-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_z-field
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_z@depends_on-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_z@transformation_type-attribute
/NXspm/ENTRY/SAMPLE/transformations/mount_translation_z@vector-attribute