3.3.2.2. Diffraction & Scattering Techniques

Introduction

Application definitions for different diffraction and (small-angle) scattering techniques

Application Definitions

NXiqproc

Application definition for any \(I(Q)\) data.

NXlauetof

This is the application definition for a TOF laue diffractometer.

NXmonopd

Monochromatic Neutron and X-Ray Powder diffractometer.

NXxbase

This definition covers the common parts of all monochromatic single crystal raw data application definitions.

NXxeuler

Raw data from a four-circle diffractometer with an eulerian cradle, extends NXxbase.

NXxkappa

Raw data from a kappa geometry (CAD4) single crystal diffractometer, extends NXxbase.

NXxlaue

Raw data from a single crystal laue camera, extends NXxrot.

NXxlaueplate

Raw data from a single crystal Laue camera, extends NXxlaue.

NXxnb

Raw data from a single crystal diffractometer, extends NXxbase.

NXxrot

Raw data from a rotation camera, extends NXxbase.

NXcanSAS

Implementation of the canSAS standard to store reduced small-angle scattering data of any dimension.

NXsas

Raw, monochromatic 2-D SAS data with an area detector.

NXsastof

Raw 2-D SAS data with an area detector with a time-of-flight source.