base class, extends NXobject
Metadata for laser-, voltage-, or combined pulsing triggering field evaporation.
The symbols used in the schema to specify e.g. dimensions of arrays.
n_ions: Total number of ions collected.
pulse_mode: (optional) NX_CHAR
How is field evaporation physically triggered.
Any of these values:
Frequency with which the high voltage or laser pulser fires.
Fraction of the pulse_voltage that is applied in addition to the standing_voltage at peak voltage of a pulse.
Direct current voltage between the specimen and the (local electrode) in the case of local electrode atom probe (LEAP) instrument.
laser_gun: (optional) NXsource
Atom probe microscopes use controlled laser, voltage, or a combination of pulsing strategies to trigger the excitation and eventual field evaporation/emission of an ion during an atom probe microscopy experiment.
name: (optional) NX_CHAR
Nominal wavelength of the laser radiation.
Average power of the laser source while illuminating the specimen.
Average energy of the laser at peak of each pulse.
MANUFACTURER: (optional) NXmanufacturer
TRANSFORMATIONS: (optional) NXtransformations
Affine transformations which describe the geometry how the laser focusing optics/pinhole-attached coordinate system is defined, how it has to be transformed so that it aligns with the specimen coordinate system. A right-handed Cartesian coordinate system, the so-called laser space, should be assumed, whose positive z-axis points into the direction of the propagating laser beam.
laser_beam: (optional) NXbeam
Details about specific positions along the focused laser beam which illuminates the (atom probe) specimen.
pinhole_position: (optional) NXcollection
Track time-dependent settings over the course of the measurement where the laser beam exits the focusing optics.
spot_position: (optional) NXcollection
Track time-dependent settings over the course of the measurement where the laser hits the specimen.
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