base class, extends NXobject
Subclass of NXelectronanalyser to describe the energy dispersion section of a photoelectron analyser.
No symbol table
scheme: (optional) NX_CHAR
Energy dispersion scheme employed, for example: tof, hemispherical, cylindrical, mirror, retarding grid, etc.
Energy of the electrons on the mean path of the analyser. Pass energy for hemispherics, drift energy for tofs.
Center of the energy window
The interval of transmitted energies. It can be two different things depending on whether the scan is fixed or swept. With a fixed scan it is a 2 vector containing the extrema of the transmitted energy window (smaller number first). With a swept scan of m steps it is a 2xm array of windows one for each measurement point.
Diameter of the dispersive orbit
energy_scan_mode: (optional) NX_CHAR
Way of scanning the energy axis (fixed or sweep).
Any of these values:
Length of the tof drift electrode
APERTURE: (optional) NXaperture
Size, position and shape of a slit in dispersive analyzer, e.g. entrance and exit slits.
DEFLECTOR: (optional) NXdeflector
Deflectors in the energy dispersive section
LENS_EM: (optional) NXlens_em
Individual lenses in the energy dispersive section
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