.. auto-generated by dev_tools.docs.nxdl from the NXDL source contributed_definitions/NXebeam_column.nxdl.xml -- DO NOT EDIT .. index:: ! NXebeam_column (base class) ! ebeam_column (base class) see: ebeam_column (base class); NXebeam_column .. _NXebeam_column: ============== NXebeam_column ============== .. Contributors List .. |contrib_name| replace:: Rubel|RubelMozumder|https://avatars.githubusercontent.com/u/32923026?v=4|2023-06-14 .. |contrib_name| replace:: Kuehbachm|mkuehbach|https://avatars.githubusercontent.com/u/14091504?v=4|2022-09-13 **Status**: base class, extends :ref:`NXobject` **Description**: Container for components to form a controlled beam in electron microscopy. **Symbols**: No symbol table **Groups cited**: :ref:`NXaperture_em`, :ref:`NXbeam`, :ref:`NXcorrector_cs`, :ref:`NXfabrication`, :ref:`NXlens_em`, :ref:`NXsensor`, :ref:`NXsource`, :ref:`NXstage_lab`, :ref:`NXtransformations` .. index:: NXfabrication (base class); used in base class, NXsource (base class); used in base class, NXtransformations (base class); used in base class, NXaperture_em (base class); used in base class, NXlens_em (base class); used in base class, NXcorrector_cs (base class); used in base class, NXstage_lab (base class); used in base class, NXsensor (base class); used in base class, NXbeam (base class); used in base class **Structure**: .. _/NXebeam_column/FABRICATION-group: **FABRICATION**: (optional) :ref:`NXfabrication` .. _/NXebeam_column/electron_source-group: **electron_source**: (optional) :ref:`NXsource` The source which creates the electron beam. .. _/NXebeam_column/electron_source/name-field: .. index:: name (field) **name**: (optional) :ref:`NX_CHAR ` :ref:`⤆ ` Given name/alias. .. _/NXebeam_column/electron_source/voltage-field: .. index:: voltage (field) **voltage**: (optional) :ref:`NX_FLOAT ` {units=\ :ref:`NX_VOLTAGE `} :ref:`⤆ ` .. collapse:: Voltage relevant to compute the energy of the electrons ... Voltage relevant to compute the energy of the electrons immediately after they left the gun. .. _/NXebeam_column/electron_source/probe-field: .. index:: probe (field) **probe**: (optional) :ref:`NX_CHAR ` :ref:`⤆ ` .. collapse:: Type of radiation. ... Type of radiation. Obligatory value: ``electron`` .. _/NXebeam_column/electron_source/emitter_type-field: .. index:: emitter_type (field) **emitter_type**: (optional) :ref:`NX_CHAR ` .. collapse:: Emitter type used to create the beam. ... Emitter type used to create the beam. If the emitter type is other, give further details in the description field. Any of these values: * ``filament`` * ``schottky`` * ``cold_cathode_field_emitter`` * ``other`` .. _/NXebeam_column/electron_source/emitter_material-field: .. index:: emitter_material (field) **emitter_material**: (optional) :ref:`NX_CHAR ` Material of which the emitter is build, e.g. the filament material. .. _/NXebeam_column/electron_source/description-field: .. index:: description (field) **description**: (optional) :ref:`NX_CHAR ` .. collapse:: Ideally, a (globally) unique persistent identifier, link, ... Ideally, a (globally) unique persistent identifier, link, or text to a resource which gives further details. .. _/NXebeam_column/electron_source/FABRICATION-group: **FABRICATION**: (optional) :ref:`NXfabrication` .. _/NXebeam_column/electron_source/TRANSFORMATIONS-group: **TRANSFORMATIONS**: (optional) :ref:`NXtransformations` :ref:`⤆ ` .. collapse:: Affine transformation which detail the arrangement in the ... Affine transformation which detail the arrangement in the microscope relative to the optical axis and beam path. .. _/NXebeam_column/APERTURE_EM-group: **APERTURE_EM**: (optional) :ref:`NXaperture_em` .. _/NXebeam_column/LENS_EM-group: **LENS_EM**: (optional) :ref:`NXlens_em` .. _/NXebeam_column/CORRECTOR_CS-group: **CORRECTOR_CS**: (optional) :ref:`NXcorrector_cs` .. _/NXebeam_column/STAGE_LAB-group: **STAGE_LAB**: (optional) :ref:`NXstage_lab` .. _/NXebeam_column/SENSOR-group: **SENSOR**: (optional) :ref:`NXsensor` A sensor used to monitor an external or internal condition. .. _/NXebeam_column/BEAM-group: **BEAM**: (optional) :ref:`NXbeam` .. collapse:: Individual ocharacterization results for the position, shape, ... Individual ocharacterization results for the position, shape, and characteristics of the electron beam. NXtransformations should be used to specify the location of the position at which the beam was probed. Hypertext Anchors ----------------- List of hypertext anchors for all groups, fields, attributes, and links defined in this class. * :ref:`/NXebeam_column/APERTURE_EM-group ` * :ref:`/NXebeam_column/BEAM-group ` * :ref:`/NXebeam_column/CORRECTOR_CS-group ` * :ref:`/NXebeam_column/electron_source-group ` * :ref:`/NXebeam_column/electron_source/description-field ` * :ref:`/NXebeam_column/electron_source/emitter_material-field ` * :ref:`/NXebeam_column/electron_source/emitter_type-field ` * :ref:`/NXebeam_column/electron_source/FABRICATION-group ` * :ref:`/NXebeam_column/electron_source/name-field ` * :ref:`/NXebeam_column/electron_source/probe-field ` * :ref:`/NXebeam_column/electron_source/TRANSFORMATIONS-group ` * :ref:`/NXebeam_column/electron_source/voltage-field ` * :ref:`/NXebeam_column/FABRICATION-group ` * :ref:`/NXebeam_column/LENS_EM-group ` * :ref:`/NXebeam_column/SENSOR-group ` * :ref:`/NXebeam_column/STAGE_LAB-group ` **NXDL Source**: https://github.com/nexusformat/definitions/blob/main/contributed_definitions/NXebeam_column.nxdl.xml